Abstract

In a previous paper we described an accurate method for tracking a Gaussian beam incident on a particular diffraction grating. In this paper we use the same method to track a fundamental Gaussian beam at microwave frequency incident upon rectangular and sinusoidal gratings for more general information about the interaction during the process. We extensively study how different parameters of the incident beam such as waist radius, beam frequency, incident angle, polarization direction, and grating depth affect the spatial modifications differently. This study is of great use for designing a millimeter-wave electromagnetic system for example measurements of components for a gyrotron.

© 2020 Optical Society of America

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