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Evaluation of Repeatability for the Measurement of DC Conductivity of HVDC XLPE Model Cables

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Abstract

Cross-linking polyethylene (XLPE) power cables are widely used as an excellent insulation material for high-voltage direct current (HVDC) transmission. For the design and operation of HVDC-based power cables, the conduction properties of XLPE insulation must be obtained. This study aimed to establish a highly reliable conductivity-measurement system that can diagnose the XLPE insulation of cables before and after aging by evaluating the repeatability of their conductivity. In this study, a conductivity-measurement circuit was constructed using the polarization-and-depolarization-current technique. Conductivity was measured according to the conductor temperature by using an applied electric field, and then the repeatability of the measured conductivity was evaluated using a statistical method. The experimental results show that the minimum repeatability was 6%, thereby demonstrating the establishment of a reliable conductivity-measurement system.

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Acknowledgements

This work was supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry and Energy (MOTIE) of the Republic of Korea (No. 20171210201080)

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Authors and Affiliations

  1. Superconductivity Research Center, Korea Electrotechnology Research Institute, 12, Bulmosan-ro 10beon-gil, Seongsa-gu, Changwon-si, Gyeongsangnam-do, 51543, Korea

    Seung-Won Lee, Hae-Jong Kim, Byung-Bae Park, Hee-Suk Ryoo, Jeon-Wook Cho & Sang-Soo Oh

  2. LS Cable & System Ltd, 27 Gongdan-ro 140beon-gil, Gunpo-si, Gyeonggi-do, 15845, Korea

    Jin-Ho Nam

  3. Department of Electrical Engineering, Mokpo National Maritime University, 91, Haeyangdaehak-ro, Mokpo-si, Jeollanam-do, Korea

    Jang-Seob Lim

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  1. Seung-Won Lee
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  2. Hae-Jong Kim
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  7. Jin-Ho Nam
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Correspondence to Jang-Seob Lim.

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Lee, SW., Kim, HJ., Park, BB. et al. Evaluation of Repeatability for the Measurement of DC Conductivity of HVDC XLPE Model Cables. J. Electr. Eng. Technol. 15, 2217–2225 (2020). https://doi.org/10.1007/s42835-020-00490-x

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  • DOI: https://doi.org/10.1007/s42835-020-00490-x

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