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In Situ Substrate Curvature Measurement of BaTiO3 Films Deposited by Aerosol Deposition

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Abstract

Residual stress plays an important role in the properties and performance of coatings, such as coating–substrate adhesion. With in situ residual stress measurements, further insight into the coating formation process can also be obtained. Substrate curvature deflection measurements during the aerosol deposition of BaTiO3 were employed to calculate the coating’s residual stress via the Stoney formula and compared to x-ray diffraction measurements. Analysis of the substrate deflection behavior during coating application is discussed and compared to related spray processes.

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Acknowledgments

Heat treatment and XRD measurements and analysis were performed by James Griego and Mark Rodriguez. FIB cross sections and TEM were performed by Paul Kotula. Feedstock material was supplied by Harlan Brown-Shaklee. Metallographic sample preparation was performed by Christina Profazi, and SEM analysis and thickness measurements were performed by Sara Dickens. Special thanks to Tom Holmes, Andrew Miller, and Jesse Adamczyk for their assistance with AD film preparation and Pylin Sarabol for arranging FIB/TEM and XRD measurements. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the US Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the US Department of Energy or the US Government.

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  1. Sandia National Labs, Albuquerque, USA

    Andrew Vackel

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  1. Andrew Vackel
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Correspondence to Andrew Vackel.

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This article is part of a special topical focus in the Journal of Thermal Spray Technology on Aerosol Deposition and Kinetic Spray Processes. This issue was organized by Dr. Kentaro Shinoda, National Institute of Advanced Industrial Science and Technology (AIST); Dr. Frank Gaertner, Helmut-Schmidt University; Prof. Changhee Lee, Hanyang University; Prof. Ali Dolatabadi, Concordia University; and Dr. Scooter Johnson, Naval Research Laboratory.

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Vackel, A. In Situ Substrate Curvature Measurement of BaTiO3 Films Deposited by Aerosol Deposition. J Therm Spray Tech 30, 584–590 (2021). https://doi.org/10.1007/s11666-020-01075-w

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  • DOI: https://doi.org/10.1007/s11666-020-01075-w

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