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Experimental Investigation of Millisecond-Pulse Laser Heating of Biased Si Avalanche Photodiodes in an External Circuit

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Journal of Russian Laser Research Aims and scope

Abstract

We investigate increase in the surface temperature of biased Si avalanche photodiodes (APDs) fabricated in an external capacitor circuit irradiated by a millisecond-pulse laser. The results obtained show that different external capacitance parameters have different effects on the temperature rise, the smaller the capacitance of external capacitor, the lower surface temperature increase in the APD. The reason for this phenomenon is that the external capacitor charging decreases the circuit current, which hinders the generation of Joule heat in the APD. Therefore, the laser damage resistance of Si APDs can be improved by optimizing the capacitance parameters of the external circuit.

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References

  1. M. S. Ferraro, W. R. Clark, W. S. Rabinovich, et al., Appl. Opt., 54, 182 (2015).

    Article  Google Scholar 

  2. Y. Mu and M. Niedre, Biomed. Opt. Express, 6, 3596 (2015).

    Article  Google Scholar 

  3. M. Nada, S. Kanazawa, H. Yamazaki, et al., “High-linearity avalanche photodiode for 40 km transmission with 28 Gbaud PAM4,” in: 2015 Optical Fiber Communication Conference and Exhibition, IEEE (2015), p. 1.

  4. M. Nada, H. Yokoyama, Y. Muramoto, et al., Opt. Express, 22, 14681 (2014).

    Article  ADS  Google Scholar 

  5. R. Enne, B. Steindl, and H. Zimmermann, Opt. Lett., 40, 4400 (2015).

    Article  ADS  Google Scholar 

  6. W. Gaberl, B. Steindl, K. Schneider-Hornstein, et al., Opt. Lett., 39, 586 (2014).

    Article  ADS  Google Scholar 

  7. S. E. Watlins, C. Z. Zhan, and R. M. Walser, Appl. Opt., 29, 827 (1990).

    Article  ADS  Google Scholar 

  8. W.-Y. Ho, C. C. Ma, R. W. Bene, et al., “Characterization of fractal Brownian process in laser damaged photodiodes,” in: Chaos/Nonlinear Dynamics: Methods and Commercialization, Proc. SPIE, 2037 (1994).

  9. V. K. Arora and A. L. Dawar, Appl. Opt., 35, 7061 (1996).

    Article  ADS  Google Scholar 

  10. A. A. Koronnov, G. M. Zverev, M. M. Zemlyanov, et al., Prikl. Fiz., 4, 54 (2015) [in Russin].

    Google Scholar 

  11. D. Wang, Z. Wei, G.-Y. Jin, et al., Int. J. Heat Mass Transfer, 122, 391 (2018).

    Article  Google Scholar 

  12. K. F. Brennan, The Physics of Semiconductors, Cambridge University Press (1999).

  13. S. Selberherr, Analysis and Simulation of Semiconductor Devices, Springer-Verlag (1984).

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Authors and Affiliations

  1. The Key Laboratory of Jilin Province Solid-State Laser Technology and Application, Chang Chun University of Science and Technology, Changchun, 130022, China

    Liang Chen, Hong-Xu Liu & Guang-Yong Jin

  2. School of Faculty Science, Changchun University of Science and Technology, Changchun, 130022, China

    Di Wang & Zhi Wei

Authors
  1. Liang Chen
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  2. Hong-Xu Liu
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  3. Guang-Yong Jin
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  4. Di Wang
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  5. Zhi Wei
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Correspondence to Guang-Yong Jin.

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Chen, L., Liu, HX., Jin, GY. et al. Experimental Investigation of Millisecond-Pulse Laser Heating of Biased Si Avalanche Photodiodes in an External Circuit. J Russ Laser Res 41, 384–389 (2020). https://doi.org/10.1007/s10946-020-09890-w

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  • DOI: https://doi.org/10.1007/s10946-020-09890-w

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