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Evaluation of Software Packages for On-Line X-Ray Fluorescence Analysis of Materials on a Conveyor

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Journal of Applied Spectroscopy Aims and scope

The use of X-ray fluorescence analysis using the fundamental parameters (FP) method without the need for calibration samples is extremely desirable for some applications. The accuracy of element concentration calculations performed using the FP method with the XRS-FP software package is analyzed. The possibility of performing X-ray fluorescence analysis without the need for reference samples renders this software package indispensable for the analysis of unknown samples.

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Correspondence to E. V. Letko.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 87, No. 3, pp. 469–472, May–June, 2020.

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Letko, E.V., Landman, K.S. & Sokolov, A.D. Evaluation of Software Packages for On-Line X-Ray Fluorescence Analysis of Materials on a Conveyor. J Appl Spectrosc 87, 495–498 (2020). https://doi.org/10.1007/s10812-020-01029-8

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  • DOI: https://doi.org/10.1007/s10812-020-01029-8

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