Abstract
The development of effective anti-reflective coatings of electromagnetic radiation is a necessary basis to solve a wide range of fundamental and applied problems. We studied the conditions for the preparation of lanthanum hexaboride (LaB6) films by electron beam deposition on Al2O3, AlN, ZrO2, Si, and W substrates, and CeB6 and W coatings. The phase and elemental composition, the microstructure and optical characteristics of samples obtained under various deposition conditions were studied. The relationship between the reflection spectra and the surface roughness of the samples was investigated. The region of the electromagnetic spectrum in which the obtained films can be used as anti-reflection coatings is determined.
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REFERENCES
Besse, J.-C., Gasparinetti, S., Collodo, M.C., Walter, T., Kurpiers, P., Pechal, M., Eichler, C., and Wallraff, A., Phys. Rev. X, 2018, vol. 8, p. 021003.
Bouwmeester, D., Nature, 2004, vol. 429, p. 139.
Gisin, N., Ribordy, G.G., Titel, W., and Zbinden, H., Rev. Mod. Phys., 2002, vol. 74, p. 145.
Hiskett, P.A., Rosenberg, D., Peterson, C.G., Hughes, R.J., Nam, S., Lita, A.E., Miller, A.J., and Nordholt, J.E., New J. Phys., 2006, vol. 8, p. 193.
Knill, E., Laflamme, R., and Milburn, G.J., Nature, 2001, vol. 409, p. 46.
Zhang, H., Xiao, L., Luo, B., Guo, J., Zhang, L., and Xie, J., J. Phys. D: Appl. Phys., 2020, vol. 53, p. 013001.
Hadfield, R.H., Nature Photonics, 2009, vol. 3, p. 696.
Yamashita, T., Miki, S., and Terai, H., IEICE Trans. on Electronics, 2017, vol. E100-C, p. 274.
Rosenberg, D., Lita, A.E., Miller, A.J., Nam, S., and Schwall, R.E., IEEE Trans. Appl. Supercond., 2005, vol. 15, p. 575.
Correa, R.E., Dauler, E.A., Nair, G., Pan, S.H., Rosenberg, D., Kerman, A.J., Molnar, R.J., Hu, X., Marsili, F., Anant, V., Berggren, K.K., and Bawendi, M.G., Nano Lett., 2012, vol. 12, p. 2953.
Zhang, W.J., You, L.X., Li, H., Huang, J., Lv, C.L., Zhang, L., Liu, X.Y., Wu, J.J., Wang, Z., and Xie, X.M., Sci. China-Phys. Mech. Astron., 2017, vol. 60, p. 120 314.
Zadeh, I.E., Los, J.W.N., Gourgues, R.B.M., Bulgarini, G., Dobrovolskiy, S.M., Zwiller, V., and Dorenbosz, S.N., ArXiv:1801.06574v1, 2018.
Caloz, M., Perrenoud, M., Autebert, C., Korzh, B., Weiss, M., Schönenberger, C., Warburton, R.J., Zbinden, H., and Bussières, F., Appl. Phys. Lett., 2018, vol. 112, p. 061103.
Slichter, D.H., Verma, V.B., Leibfried, D., Mirin, R.P., Nam, S.W., and Wineland, D.J., Opt. Express, 2017, vol. 25, p. 8705.
Wollman, E.E., Verma, V.B., Beyer, A.D., Briggs, R.M., Korzh, B., Allmaras, J.P., Marsili, F., Lita, A.E., Mirin, R.P., Nam, S.W., and Shaw, M.D., Opt. Express, 2017, vol. 25(22), p. 26792.
Fritz, G.G., Wood, K.S., Van Vechten, D., Gyulamiryan, A.L., Kuzanyan, A.S., Giordano, N.J., Jacobs, T.M., Wu, H.-D., Horwits, J.S., and Gulian, A.M., Proc. SPIE, San Diego, CA, 2000, vol. 4140, p. 459.
Van Vechten, D., Wood, K., Fritz, G., Horwitz, J., Gyulamiryan, A., Kuzanyan, A., Vartanyan, V., and Gulian, A., Nucl. Instrum. Meth. Phys. Res. A, 2000, vol. 444, p. 42.
Wood, K., Van Vechten, D., Fritz, G., Wu, H.-D., Bounak, S., Bussman, K., Winzer, K., Kunii, S., Gurin, V., Mitterer, C., Carlsson, M., Golf, F., Kuzanyan, A., Badalyantz, G., Harutyunyan, S., Petrosyan, S., Vardanyan, V., Paronyan, T., Nikoghosyan, V., and Gulian, A., Nucl. Instrum. Meth. Phys. Res. A, 2004, vol. 520, p. 56.
Petrosyan, V.A., J. Contemp. Phys. (Armenian Ac. Sci.), 2011, vol. 46, p. 125.
Kuzanyan, A.A., Kuzanyan, A.S., and Nikoghosyan, V.R., J. Contemp. Phys. (Armenian Ac. Sci.), 2018, vol. 53, p. 242.
Kuzanyan, A.S., Kuzanyan, A.A., and Nikoghosyan, V.R., J. Contemp. Phys. (Armenian Ac. Sci.), 2018, vol. 53, p. 338.
Kuzanyan, A.A., Kuzanyan, A.S., and Nikoghosyan, V.R., J. Contemp. Phys. (Armenian Ac. Sci.), 2019, vol. 54, p. 175.
Kowalczewski, P., Liscidini, M., and Andreani, L., Opt. Lett., 2012, vol. 37, p. 4868.
Hung, Y., Hsu, S., Wang, Y., Chang, C., Chen, L., Su, L., and Huang, J., Nanotechnology, 2011, vol. 22, p. 485202.
Burresi, M., Pratesi, F., Riboli, F., and Wiersma, D.S., Adv. Opt. Mat., 2015, vol. 3, p. 722.
Kats, M., Blanchard, R., Genevet, P., and Capasso, F., Nature Materials, 2013, vol. 12, p. 20.
Huang, H-L., Xia, H., Guo, Z-B., Xie, D., and Li, H-J., Chin. Phys. Lett., 2017, vol. 34, p. 117801.
Landy, N., Sajuyigbe, S., Mock, J., Smith, D., and Padilla, W., Phys. Rev. Lett., 2008, vol. 100, p. 207402.
Popov, E., Maystre, D., and McPhedran, R.C., Opt. Express, 2008, vol. 16, p. 609.
Yang, Z.-P., Ci, L., Bur, J., Lin, S., and Ajayan, P., Nano Lett., 2008, vol. 8, p. 446.
Liu, C., Zhang, D., Liu, Y., Wu, D., Chen, L., Ma, R., Yu, Z., Yu, L., and Ye, H., Nanoscale Res. Lett., 2017, vol. 12, p. 601.
Mattox, T.M. and Urban, J.J., Materials, 2018, vol. 11, p. 2473.
Petrosyan, S.I., Kuzanyan, A.A., Badalyan, G.R., and Kuzanyan, A.S., J. Contemp. Phys. (Armenian Ac. Sci.), 2018, vol. 53, p. 157.
Kuzanyan, A.S., Harutyunyan, S.R., Vardanyan, V.O., Badalyan, G.R., Petrpsyan, V.A., Kuzanyan, V.S., Petrosyan, S.I., Karapetyan, V.E., Wood, K.S., Wu, H.-D., Gulian, A.M., J Solid State Chem., 2006, vol. 179, p. 2862.
Late, D.J., More, M.A., Misra, P., Singh, B.N., Kukreja, L.M., and Joag, D.S., Ultramicroscopy, 2007, vol. 107, p. 825.
Gurin, V.N., Korsukova, M.M., Karin, M.G., Sidorin, K.K., Smirnov, I.A., and Shelykh, A.I., Sov. Phys. Solid State, 1980, vol. 22(3), p. 418.
Adachi, K. and Miratsu, M., J. Mater. Res., 2010, vol. 25(3), p. 510.
Takeda, H., Kuno, H., and Adachi, K., J. Am. Ceram. Soc., 2008, vol. 91, p. 2897.
ACKNOWLEDGMENTS
The authors are grateful to A.M. Gulian for his interest in the work and useful discussions.
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The study was carried out with the financial support of the State Science Committee of the Ministry of Education and Science of the Republic of Armenia within the framework of the Scientific Project No. 18T-2F134.
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Kuzanyan, A.A., Kuzanyan, A.S., Petrosyan, S.I. et al. Electron Beam Deposition of Lanthanum Hexaboride Films for Usage as Anti-Reflective Coating. J. Contemp. Phys. 55, 164–170 (2020). https://doi.org/10.3103/S1068337220020073
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DOI: https://doi.org/10.3103/S1068337220020073