Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-25T01:16:09.372Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of deconvolutional treatment to powder diffraction data collected with a Bragg-Brentano diffractometer with a contaminated Cu target and a Ni filter

Published online by Cambridge University Press:  15 July 2020

Takashi Ida Open the ORCID record for Takashi Ida [Opens in a new window]
Takashi Ida*
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu507-0071, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: ida.takashi@nitech.ac.jp
Get access Rights & Permissions [Opens in a new window]

Abstract

A deconvolutional method for preprocessing powder diffraction data has been improved. The cumulants of instrumental aberration functions of Bragg-Brentano (Parrish) diffractometer calculated up to the fourth order are presented. The treatments of axial-divergence aberration and the effective spectroscopic profile of the source X-ray have been simplified from those used in previous methods. The current method has been applied to powder diffraction data collected with a Cu-target X-ray tube, used over 20 years, and a Ni-foil Kβ filter.

Keywords

Ni filterBragg-Brentano geometrydeconvolutionconvolution
Type
Technical Article
Information
Powder Diffraction , Volume 35 , Issue 3 , September 2020 , pp. 166 - 177
Check for updates
Copyright
Copyright © 2020 International Centre for Diffraction Data

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Caglioti, G., Paoletti, A., and Ricci, F. P. (1958). “Choice of collimators for a crystal spectrometer for neutron diffraction,” Nucl. Instrum. 3, 223–228.CrossRefGoogle Scholar
Cheary, R. W. and Coelho, A. A. (1998). “Axial divergence in a conventional X-ray powder diffractometer I. Theoretical foundations,” J. Appl. Crystallogr. 31, 851–861.CrossRefGoogle Scholar
Cromer, D. T. (1983). “Calculation of anomalous scattering factors at arbitrary wavelength,” J. Appl. Crystallogr. 16, 437.CrossRefGoogle Scholar
Cromer, D. T. and Liberman, D. A. (1981). “Anomalous dispersion calculations near to and on the long-wavelength side of an absorption edge,” Acta Crystallogr., A: Found. Crystallogr. 37, 267–268.CrossRefGoogle Scholar
Deutsch, M., Förster, E., Hölzer, G., Härtwig, J., Hämäläinen, K., Kao, C.-C., Huotari, S., and Diamant, R. (2004). “X-ray spectrometry of copper: new results on an old subject,” J. Res. Natl. Inst. Stand. Technol. 109, 75–98.CrossRefGoogle Scholar
Ida, T. (1998). “Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry,” Rev. Sci. Instrum. 69, 2268–2272.CrossRefGoogle Scholar
Ida, T. and Kimura, K. (1999). “Flat-specimen effect as a convolution in powder diffractometry with Bragg-Brentano geometry,” J. Appl. Crystallogr. 32, 634–640.CrossRefGoogle Scholar
Ida, T. and Toraya, H. (2002). “Deconvolution of the instrumental functions in powder X-ray diffractometry,” J. Appl. Crystallogr. 35, 58–68.CrossRefGoogle Scholar
Ida, T., Shimazaki, S., Hibino, H., and Toraya, H. (2003). “Diffraction peak profiles from spherical crystallites with lognormal size distribution,” J. Appl. Crystallogr. 36, 1107–1115.CrossRefGoogle Scholar
Ida, T., Ono, S., Hattan, D., Yoshida, T., Takatsu, Y., and Nomura, K. (2018a). “Deconvolution-convolution treatment on powder diffraction data collected with Cu Kα X-ray and Ni Kβ filter,” Powder Diffr. 33, 80–87.CrossRefGoogle Scholar
Ida, T., Ono, S., Hattan, D., Yoshida, T., Takatsu, Y., and Nomura, K. (2018b). “Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method,” Powder Diffr. 33, 108–114.CrossRefGoogle Scholar
Ida, T., Ono, S., Hattan, D., Yoshida, T., Takatsu, Y., and Nomura, K. (2018c). “Improvement of deconvolution-convolution treatment of axial-divergence aberration in Bragg-Brantano geometry,” Powder Diffr. 33, 121–133.CrossRefGoogle Scholar
Jones, F. W. (1938). “The measurement of particle size by the X-ray method,” Proc. Roy. Soc. A 166, 16–43.Google Scholar
Langford, J. I., Louër, D., and Scardi, P. (2000). “Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting,” J. Appl. Crystallogr. 33, 964–974.CrossRefGoogle Scholar
Paterson, M. S. (1952). “X-ray diffraction by face-centered cubic crystals with deformation faults,” J. Appl. Phys. 23, 805–811.CrossRefGoogle Scholar
Popa, N. C. and Balzar, D. (2002). “An analytical approximation for a size-broadened profile given by the lognormal and gamma distributions,” J. Appl. Crystallogr. 35, 338–346.CrossRefGoogle Scholar
Rachinger, W. A. (1948). “A correction for the α 1 and α2 doublet in the measurement of width of X-ray diffraction lines,” J. Sci. Instrum. 25, 254–255.CrossRefGoogle Scholar
Stokes, A. R. (1948). “A numerical Fourier-analysis method for the correction of width and shapes of lines on X-ray powder photographs,” Proc. Phys. Soc. Londn. 61, 382–391.CrossRefGoogle Scholar
Trincavelli, J., Castellano, G., and Riveros, J. A. (1998). “Model for the bremsstrahlung spectrum in EPMA. Application to standardless quantification,” X-Ray Spectrom. 27, 81–86.3.0.CO;2-R>CrossRefGoogle Scholar