Skip to main content
SpringerLink
Log in

Multifractal Surface Characteristics of Thin, Gas-Sensitive, Copper-Containing Polyacrylonitrile Films

  • Published:
Surface Engineering and Applied Electrochemistry Aims and scope Submit manuscript

Abstract

Using the atomic force microscopy method, the surface of thin, copper-containing polyacrylonitrile (PAN) films is studied. The distribution function over the height of the surface profile is analyzed by the method of multifractal detrended fluctuation analysis (MFDFA). The fractal dimension, correlation dimension, scaling exponent, and Hurst exponent (H) are used as parameters in this analysis. The results of studying the surface of thin, copper-containing PAN films by the MFDFA method confirm the assumption about the multifractal nature of the surface. Technological parameters in the production of films determine the frequency of occurrence of structures with different fractal dimensions on the film surfaces, which is reflected in the Hurst exponent. A bend is present in the multifractal spectrum in those cases when the films show gas sensitivity with a coefficient of S = 0.35 or higher.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.

Similar content being viewed by others

REFERENCES

  1. Asatkar, A.K., Bedi, A., and Zade, S.S., Isr. J. Chem., 2013, vol. 53, pp. 1–30. https://doi.org/10.1002/ijch.201400023

    Article  Google Scholar 

  2. Nataraj, S.K., Yang, K.S., and Aminabhavi, T.M., Prog. Polym. Sci., 2012, vol. 37, pp. 487–513. https://doi.org/10.1016/j.progpolymsci.2011.07.001

    Article  Google Scholar 

  3. Mursalov, S.M., Bodyagin, N.V., and Vikhrov, S.P., Pis’ma Zh. Tekh. Fiz., 2000, vol. 26, no. 15, pp. 53–57.

    Google Scholar 

  4. Bodyagin, N.V. and Vikhrov, S.P., Pis’ma Zh. Tekh. Fiz., 1997, vol. 23, no. 19, pp. 77–80.

    Google Scholar 

  5. Bodyagin, N.V. and Vikhrov, S.P., Tech. Phys. Lett., 1997, vol. 23, no. 10, pp. 769–770.

    Article  Google Scholar 

  6. Vikhrov, S.P., Avacheva, T.G., Bodyagin, N.V., Grishankina, N.V., et al., Semiconductors, 2012, vol. 46, no. 4, pp. 415–421. https://doi.org/10.1134/S1063782612040240

    Article  Google Scholar 

  7. Zorick, T., and Mandelkern, M.A., PloS One, 2013, vol. 8, no. 7, pp. 1–7. https://doi.org/10.1371/journal.pone.0068360

    Article  Google Scholar 

  8. Ihlen, E.A.F., Front. Physiol., 2012, vol. 3, pp. 1–18. https://doi.org/10.3389/fphys.2012.00141

    Article  Google Scholar 

  9. Biswas, A., Zeleke, T.B., and Si, B.C., Nonlin. Proc. Geophys., 2012, vol. 19, pp. 227–238. https://doi.org/10.5194/npg-19-227-2012

    Article  Google Scholar 

  10. Semenistaya, T.V., Springer Proc. Phys., 2016, vol. 175, pp. 61–77. https://doi.org/10.1007/978-3-319-26324-3_5

    Article  Google Scholar 

  11. Semenistaya, T.V., Mater. Phys. Mech., 2018, vol. 37, pp. 109–117. https://doi.org/10.18720/MPM.3722018_1

    Article  Google Scholar 

  12. Makeeva, N.A., Pin, Lu, Ivanets, V.A., Semenistaya, T.V., et al., Izv. Yuzhn. Fed. Univ.,Tekh. Nauki, 2011, vol. 117, no. 4, pp. 149–156.

    Google Scholar 

  13. Bashan, A., Bartsch, R., Kantelhardt, J.W., and Havlin, S., Phys. A (Amsterdam, Neth.), 2008, vol. 387, no. 21, pp. 5080–5090. https://doi.org/10.1016/j.physa.2008.04.023

  14. Kantelhardt, J.W., Koscielny-Bunde, E., Rego, H.H.A., Havlin, S., et al., Phys. A (Amsterdam, Neth.), 2001, vol. 295, pp. 441–454. https://doi.org/10.1016/S0378-4371(01)00144-3

    Google Scholar 

  15. Oswiecimka, P., Kwapin, J., and Drozdz, S., Phys. Rev. E: Stat., Nonlinear, Soft Matter Phys., 2006, vol. 74, pp. 161–203. https://doi.org/10.1103/PhysRevE.74.016103

    Article  Google Scholar 

  16. Pavlov, A.N. and Anishchenko, V.S., Izv. Saratov. Univ.,Ser. Fiz., 2007, vol. 7, no. 1, pp. 3–25. https://doi.org/10.3367/UFNr.0177.200708d.0859

    Article  Google Scholar 

  17. Korolev, A.N., Semenistaya, T.V., Al’-Khadrami, I.S., Loginova, T.P., et al., Perspekt. Mater., 2010, vol. 5, pp. 52–56.

    Google Scholar 

  18. Petrov, V., Plugotarenko, N., and Semenistaya, T., ChaoticModel. Simul., 2013, vol. 4, pp. 609–614.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Southern Federal University, Institute of Nanotechnologies, Electronics, and Equipment Engineering, 347922, Taganrog, Rostov oblast, Russia

    T. V. Semenistaya & N. K. Plugotarenko

Authors
  1. T. V. Semenistaya
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. N. K. Plugotarenko
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to T. V. Semenistaya.

Ethics declarations

The authors declare to have no conflict of interest.

Additional information

Translated by O. Kadkin

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Semenistaya, T.V., Plugotarenko, N.K. Multifractal Surface Characteristics of Thin, Gas-Sensitive, Copper-Containing Polyacrylonitrile Films. Surf. Engin. Appl.Electrochem. 56, 311–318 (2020). https://doi.org/10.3103/S1068375520030151

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.3103/S1068375520030151

Keywords:

Search

Navigation