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Impact of substrate on tip-enhanced Raman spectroscopy: A comparison between field-distribution simulations and graphene measurements

Hudson Miranda, Cassiano Rabelo, Luiz Gustavo Cançado, Thiago L. Vasconcelos, Bruno S. Oliveira, Florian Schulz, Holger Lange, Stephanie Reich, Patryk Kusch, and Ado Jorio
Phys. Rev. Research 2, 023408 – Published 29 June 2020

Abstract

Tip-enhanced Raman spectroscopy (TERS) has reached nanometer spatial resolution for measurements performed at ambient conditions and subnanometer resolution at ultrahigh vacuum. Super-resolution (beyond the tip apex diameter) TERS has been obtained mostly in the gap mode configuration, where a conductive substrate localizes the electric fields. Here we present experimental and theoretical TERS to explore the field distribution responsible for spectral enhancement. We use gold tips of 40±10nm apex diameter to measure TERS on graphene, a spatially delocalized two-dimensional sample, sitting on different substrates: (i) glass, (ii) a thin layer of gold and (iii) a surface covered with 12nm diameter gold spheres, for which 6nm resolution is achieved at ambient conditions. The super-resolution is due to the field configuration resulting from the coupled tip-sample-substrate system, exhibiting a nontrivial spatial surface distribution. The field distribution and the symmetry selection rules are different for nongap versus gap mode configurations. This influences the overall enhancement which depends on the Raman mode symmetry and substrate structure.

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  • Received 17 January 2020
  • Revised 23 May 2020
  • Accepted 9 June 2020

DOI:https://doi.org/10.1103/PhysRevResearch.2.023408

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & OpticalParticles & Fields

Authors & Affiliations

Hudson Miranda1, Cassiano Rabelo1, Luiz Gustavo Cançado2, Thiago L. Vasconcelos3, Bruno S. Oliveira3, Florian Schulz4, Holger Lange4,5, Stephanie Reich6, Patryk Kusch6, and Ado Jorio1,2

  • 1Graduate Program in Electrical Engineering - UFMG - CEP: 31270-901, Belo Horizonte, MG, Brazil
  • 2Departamento de Física - UFMG - CEP: 31270-901, Belo Horizonte, MG, Brazil
  • 3Divisão de Metrologia de Materiais - Inmetro - CEP: 25250-020, Duque de Caxias, RJ, Brazil
  • 4Institute for Physical Chemistry, University of Hamburg, Martin-Luther-King Platz 6, 20146 Hamburg, Germany
  • 5The Hamburg Centre for Ultrafast Imaging, 22761 Hamburg, Germany
  • 6Department of Physics, Freie Universität Berlin, Arnimallee 14, D-14195 Berlin, Germany

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Issue

Vol. 2, Iss. 2 — June - August 2020

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