A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 44–49, February, 2020.
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Belichenko, V.P., Zapasnoy, A.S., Miron’chev, A.S. et al. Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding. Russ Phys J 63, 231–237 (2020). https://doi.org/10.1007/s11182-020-02025-3
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DOI: https://doi.org/10.1007/s11182-020-02025-3