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Effect of the Mismatch of Layer Thicknesses on the Focusing of X Rays by Multilayer Laue Lens

  • Optics and Laser Physics
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Abstract

A numerical simulation has been performed to study the effect of the mismatch of layer thicknesses of multilayer Laue lenses (MLLs) on X-ray focusing. The spatial distributions of X-ray intensities in the bulk of a lens have been calculated with different gradients of the variation of the period of a MLL. It has been shown that the focal length, as well as the focal spot size, decreases with an increase in the mismatch of layer thicknesses of the MLL. The calculated focal spot size are significantly different from the values reported in other works. A physical nature of the focusing by the MLL has been revealed. It is determined by the Bragg diffraction and is not related to the configuration of the Fresnel zone plate.

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Authors and Affiliations

  1. Institute of Physics and Mathematics, Komi Research Center, Ural Branch, Russian Academy of Sciences, Syktyvkar, 167982, Russia

    V. I. Punegov

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  1. V. I. Punegov
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Correspondence to V. I. Punegov.

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Russian Text © The Author(s), 2020, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2020, Vol. 111, No. 7, pp. 448–454.

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Punegov, V.I. Effect of the Mismatch of Layer Thicknesses on the Focusing of X Rays by Multilayer Laue Lens. Jetp Lett. 111, 376–382 (2020). https://doi.org/10.1134/S0021364020070085

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  • DOI: https://doi.org/10.1134/S0021364020070085

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