Abstract
Until now, various acceptance reliability sampling plans have been developed based on different life tests. In most of the reliability sampling plans, the decision procedures are based on the lifetimes of the items observed on tests, or the number of failures observed during a pre-specified testing time. However, frequently, the items are subject to degradation phenomena and, in these cases, the observed degradation level of the item can be used as a decision statistic. In this paper, assuming the gamma degradation process, we develop a variables acceptance sampling plan based on the information on the degradation process of the items. It is shown that the developed sampling plan improves the reliability performance of the items conditional on the acceptance in the test and that the lifetimes of items after the reliability sampling test are stochastically larger than those before the test. A study comparing the proposed degradation-based sampling plan with the conventional sampling plan which is based on a life test is also performed.
Similar content being viewed by others
References
Aslam M, Jun CH (2009) A group acceptance sampling plan for truncated life test having Weibull distribution. J Appl Stat 36:1021–1027
Aslam M, Kundu D, Ahmad M (2010) Time truncated acceptance sampling plans for generalized exponential distribution. J Appl Stat 37:555–566
Balakrishnan N, Leiva V, Lopez J (2007) Acceptance sampling plans from truncated life tests based on the generalized Birnbaum–Saunders distribution. Communications in Statistics—Simulation and Computation 36:643–656
Blugren W, Hewette J (1973) Double sampling test for hypotheses about the mean of an exponential distribution. Technometrics 22:421–426
Cha JH (2015) Variables acceptance reliability sampling plan for repairable items. Statistics 49:1141–1156
Cha JH (2016) Analysis of reliability characteristics in the acceptance sampling tests. J Appl Stat 43:1874–1891
Çinlar E (1980) On a generalization of gamma process. J Appl Probab 17:467–480
Edgeman RL, Salzberg PM (1991) A sequential sampling plan for the inverse gaussian mean. Stat Pap 32:45–53
Epstein B, Sobel M (1953) Life testing. J Am Stat Assoc 48:485–502
Epstein B (1954) Truncated life tests in exponential case. Ann Math Stat 25:555–564
Epstein B, Sobel M (1955) Sequential life test in the exponential case. Ann Math Stat 26:82–93
Fairbanks K (1988) A two-stage life test for the exponential parameter. Technometrics 30:175–180
Fertig KW, Mann NR (1980) Life test sampling plans for two-parameter Weibull population. Technometrics 22:165–177
Finkelstein M (2008) Failure rate modeling for reliability and risk. Springer, London
Kim M, Yum BJ (2011) Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring. Stat Pap 52:327–342
Lee H, Cha JH (2017) Reliability sampling plan for repairable items following general failure process and its statistical analysis. Statistics 50:1159–1178
Montgomery DC (2012) Introduction to statistical quality control, 7th edn. Wiley, Hoboken
Pan Z, Balakrishnan N (2011) Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes. Reliab Eng Sys Saf 96:949–957
Pérez-González CJ, Fernández AJ (2009) Accuracy of approximate progressively censored reliability sampling plans for exponential models. Stat Pap 50:161–170
Schneider H (1989) Failure-censored variables sampling plans for lognormal and Weibull distributions. Technometrics 31:199–206
Seidel W (1990) On the performance of a sampling scheme in statistical quality control using incomplete prior information. Stat Pap 31:119–130
Shaked M, Shanthikumar JG (2007) Stochastic orders. Springer, New York
Sohn SY, Jang JS (2001) Acceptance sampling based on reliability degradation data. Relia Eng Syst Saf 73:67–72
Stephens KS (2001) The handbook of applied acceptance acceptance sampling: plans, procedures and principles. ASQ Quality Press, Milwaukee
Tsai CC, Tseng ST, Balakrishnan N (2012) Optimal design for degradation tests based on gamma processes with random effects. IEEE Trans Reliab 61:604–613
Tsai CC, Lin CT, Balakrishnan N (2015) Optimal design for accelerated-stress acceptance test based on Wiener process. IEEE Trans Reliab 64:603–612
Tsai TR, Wu SJ (2006) Acceptance sampling based on truncated life tests for generalized Rayleigh distribution. J Appl Stat 33:595–600
Tseng ST, Balakrishnan N, Tsai CC (2009) Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Trans Reliab 58:611–618
van Noortwijk JM (2009) A survey of the application of gamma processes in maintenance. Reliab Eng Syst Saf 94:2–21
Wu Y, Xie L, Wu N, Li J (2011) Time-dependent reliability model of components with strength degradation based-on gamma process. In: Proceedings of 9th International Conference on Reliability, Maintainability and Safety (ICRMS), pp. 363–368
Xu W, Wang W (2012) An adaptive gamma process based model for residual useful life prediction. In: Proceedings of IEEE Conference on Prognostics and System Health Management (PHM), pp. 1–4
Yang G (2009) Reliability demonstration through degradation bogey testing. IEEE Trans Reliab 58:604–610
Acknowledgements
The authors sincerely thank the referees for helpful comments and valuable advices, which have improved the presentation of this paper. The work of the first author was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (Grant Number: 2019R1A6A1A11051177). The work of the second author has been supported by the Spanish government research projects MTM2015-63978 (MINECO-FEDER) and PGC2018-094964-B-100 (MINECO-FEDER).
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Cha, J.H., Badía, F.G. Variables acceptance reliability sampling plan based on degradation test. Stat Papers 62, 2227–2245 (2021). https://doi.org/10.1007/s00362-020-01185-1
Received:
Revised:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00362-020-01185-1