Abstract
An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference.
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REFERENCES
G. E. Remnev, I. F. Isakov, M. S. Opekunov, V. M. Matvienko, V. A. Ryzhkov, V. K. Struts, I. I. Grushin, A. N. Zakoutayev, A. V. Potyomkin, V. A. Tarbokov, A. N. Pushkaryov, V. L. Kutuzov, and M. Yu. Ovsyannikov, Surf. Coat. Technol. 114, 206 (1999).
N. N. Aruev, M. A. Kozlovskii, M. F. Kudoyarov, M. Ya. Patrova, P. A. Romanov, R. V. Tyukal’tsev, I. L. Fedichkin, and S. V. Filippov, Tech. Phys. Lett. 45, 827 (2019).
O. A. Novodvorskii, V. A. Mikhalevskii, D. S. Gusev, A. A. Lotin, L. S. Parshina, O. D. Khramova, and E. A. Cherebylo, Tech. Phys. Lett. 44, 271 (2018).
J. Zhang, C. Tan, W. Wang, Y. Wang, and T. Ma, J. Korean Phys. Soc. 42, 885 (2003).
Funding
This work was supported by the Russian Science Foundation, project no. 17-19-01442.
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Translated by N. Petrov
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Ryzhkov, V.A., Nechaev, B.A. & Padalko, V.N. Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams. Tech. Phys. Lett. 46, 354–356 (2020). https://doi.org/10.1134/S1063785020040136
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DOI: https://doi.org/10.1134/S1063785020040136