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Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide

  • ELECTRODYNAMICS AND WAVE PROPAGATION
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Abstract—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented.

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Funding

The study was supported by Southern Federal University.

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Authors and Affiliations

  1. Southern Federal University, 344090, Rostov-on-Don, Russia

    A. V. Donchenko, G. F. Zargano, V. V. Zemlyakov & A. B. Kleschenkov

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  1. A. V. Donchenko
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  2. G. F. Zargano
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  3. V. V. Zemlyakov
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  4. A. B. Kleschenkov
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Correspondence to A. V. Donchenko.

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Donchenko, A.V., Zargano, G.F., Zemlyakov, V.V. et al. Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide. J. Commun. Technol. Electron. 65, 465–471 (2020). https://doi.org/10.1134/S1064226920050022

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  • DOI: https://doi.org/10.1134/S1064226920050022

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