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Calculating Parameters of Pinhole in Collimation System of Albedo Computed Tomography of Steel Products

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Abstract

We examine specific features of the collimation system of a tomograph for testing steel products based on Compton backscattering. The device is described and the parameters of the primary pinhole collimator of the collimation system are calculated. The device allows reliable scanning of a steel test object by simply displacing the pinhole perpendicular to the X-ray axis from the tube anode within 50 mm with a focal length of 163 mm.

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REFERENCES

  1. Berecz, T., Jenei, P., Csóré, A., Lábár, J., Gubicza, J., and Szabó, P.J., Determination of dislocation density by electron backscatter diffraction and X-ray line profile analysis in ferrous lath martensite, Mater. Charact., 2016, vol. 113, pp. 117–124.

    Article  CAS  Google Scholar 

  2. Kolkoori, S., Wrobel, N., Zscherpel, U., and Ewert, U., A new X-ray backscatter imaging technique for nondestructive testing of aerospace materials, NDT&E Int., 2015, vol. 70, pp. 41–52.

    Article  Google Scholar 

  3. Margret, M., Subramanian, V., Baskaran, R., and Venkatraman, B., Detection of scales and its thickness determination in industrial pipes using Compton backscattering system, Rev. Sci. Instrum., 2018, vol. 89, no. 11, p. 113117.

    Article  CAS  Google Scholar 

  4. O’Flynn, D., Crews, C., Fox, N., Allen, B.P., Sammons, M., and Speller, R.D., X-ray backscatter sensing of defects in carbon fibre composite materials, in Adv. Photon Counting Techniques XI, Int. Soc. Opt. Photonics, 2017, vol. 10212, p. 102120R.

    Google Scholar 

  5. Margret, M., Menaka, M., Venkatraman, B., and Chandrasekaran, S., Compton back scatter imaging for mild steel rebar detection and depth characterization embedded in concrete, Nucl. Instrum. Methods Phys. Res.,Sect. B, 2015, vol. 343, pp. 77–82.

    CAS  Google Scholar 

  6. Margret, M., Menaka, M., Subramanian, V., Baskaran, R., and Venkatraman, B., Non-destructive inspection of hidden corrosion through Compton backscattering technique, Radiat. Phys. Chem., 2018, vol. 152, pp. 158–164.

    Article  CAS  Google Scholar 

  7. Shinji Nomura, Kazunori Tejima, and Ikuo Wakamoto, JP Patent no. 2001208705A. Scattered x-ray type defect detector and x-ray detector, August 3, 2001.

  8. Kapranov, B.I. and Mudrov, M.A., Contribution of Compton scattering in problems associated with measuring the surface density of radiation protection coatings, J. Phys. Conf. Ser.,IOP Publ., 2016, vol. 671, no. 1, p. 012038.

    Google Scholar 

  9. Kapranov, B.I., Vavilova, G.V., Volchkova, A.V., and Kuznetsova, I.S., Mathematical modeling of tomographic scanning of cylindrically shaped test objects, IOP Conf. Ser.: Mater. Sci. Eng., IOP Publ., 2018, vol. 363, no. 1, p. 012015.

  10. Kapranov, B.I., Korotkova, I.A., Chakhlov, V.L., Filinov, V.N., and Maklashevskii, V.Ya., Analysis of scanning systems in Compton tomography: possible applications, Izv. Tomsk Politekh. Univ., 2003, vol. 306, no. 1., pp. 122–127.

    Google Scholar 

  11. Balamesh, A., Salloum, M., and Abdul-Majid, S., Feasibility of a new moving collimator for industrial backscatter imaging, Res. Nondestr. Eval., 2018, vol. 29, no. 3, pp. 143–155.

    Article  Google Scholar 

  12. Cui, S., Nimmagadda, J.K., and Baciak, J.E., Backscatter radiography as a non-destructive examination tool for concrete structures, in 2017 IEEE Nucl. Sci. Symp. Med. Imaging Conf. (NSS/MIC), IEEE, 2017, pp. 1–6.

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Correspondence to E. E. Zhuravskii, B. I. Kapranov, D. S. Belkin, S. V. Chakhlov or A. M. Shtein.

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Translated by V. Potapchouck

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Zhuravskii, E.E., Kapranov, B.I., Belkin, D.S. et al. Calculating Parameters of Pinhole in Collimation System of Albedo Computed Tomography of Steel Products. Russ J Nondestruct Test 56, 171–178 (2020). https://doi.org/10.1134/S1061830920020102

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  • DOI: https://doi.org/10.1134/S1061830920020102

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