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New Ultra-Fast Sub-Terahertz Linear Scanner for Postal Security Screening

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Abstract

To meet increasingly demanding technological needs in modern security and industrial applications involving rapid close-range screening, we have developed a 100-GHz linear scanner. Having incorporated a novel approach in terahertz sensing and an advanced IMPATT-diode signal generating technique, the proposed system offers an efficient non-destructive testing (NDT) solution that is absolutely safe, fast, highly portable, and cost-effective. The test results demonstrate outstanding capability of the scanner to provide continuous, high-throughput security screening of mail. The system can perform real-time imaging with effective resolution approaching 5 mm at conveyor speeds of up to 15 m/s.

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Acknowledgments

The authors would like to recognize Dr. Oleg Khrichenko, a technical writing specialist at TeraSense Group Inc., for his substantial contribution to drafting, language editing, and proofreading of the manuscript.

Funding

The work was supported by the Russian Science Foundation Grant No. 19-72-30003.

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Authors and Affiliations

  1. Institute of Solid State Physics, RAS, Chernogolovka, 142432, Russia

    A. V. Shchepetilnikov, P. A. Gusikhin, V. M. Muravev, G. E. Tsydynzhapov, Yu. A. Nefyodov & A. A. Dremin

  2. TeraSense Group, Inc., San Jose, CA, 95110, USA

    I. V. Kukushkin

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  1. A. V. Shchepetilnikov
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Shchepetilnikov, A.V., Gusikhin, P.A., Muravev, V.M. et al. New Ultra-Fast Sub-Terahertz Linear Scanner for Postal Security Screening. J Infrared Milli Terahz Waves 41, 655–664 (2020). https://doi.org/10.1007/s10762-020-00692-4

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