Skip to main content
SpringerLink
Log in

Atomic Force Microscopy Determination of the Direction of Dislocation Lines in Single Crystals of Bismuth and Its Alloys

  • REAL STRUCTURE OF CRYSTALS
  • Published:
Crystallography Reports Aims and scope Submit manuscript

Abstract

A technique for determining the directions of dislocation lines using an atomic force microscope after selective etching of a single crystal is discussed. The technique has been tested on bismuth-type single crystals.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.

Similar content being viewed by others

REFERENCES

  1. S. Amelinckx, The Direct Observation of Dislocations (Academic, New York, 1964).

    MATH  Google Scholar 

  2. V. M. Kosevich, Kristallografiya 5 (5), 749 (1960).

    Google Scholar 

  3. D. V. Lutskii and G. N. Kozhemyakin, Izv. Vyssh. Uchebn. Zaved., Mater. Elektron. Tekh., No. 2, 68 (2008).

  4. L. E. Kar’kina, M. V. Ponomarev, O. V. Antonova, et al., Fiz. Met. Metalloved., No. 11, 173 (1991).

  5. L. N. Danil’chuk, A. O. Okunev, K. G. Ivanov, et al., Zavod. Lab., Diagn. Mater. 74 (3), 25 (2008).

    Google Scholar 

  6. D. A. Zolotov, A. V. Buzmakov, D. A. Elfimov, et al., Crystallogr. Rep. 62 (1), 20 (2017).

    Article  ADS  Google Scholar 

  7. K. S. Kravchuk, M. V. Mezhennyi, and T. G. Yugova, Crystallogr. Rep. 57 (2), 277 (2012).

    Article  ADS  Google Scholar 

  8. K. G. Ivanov, A. S. Krylov, and I. K. Kalugina, Prib. Tekh. Eksp., No. 2, 225 (1975).

  9. O. I. Markov and Yu. V. Khripunov, Prib. Sist.: Upr., Kontrol, Diagn., No. 8, 56 (2011).

  10. O. I. Markov and Yu. V. Khripunov, RF Patent No. 2645041.MPK H02L 21/66 (applied for April 12, 2016; published February 15, 2018), Byull. Izobret., 2018, no. 5.

  11. V. I. Chernobai, G. A. Ivanov, G. B. Bagduev, et al., Semimetals and Semiconductors (Izd-vo LGPI im. A.I. Gertsena, Leningrad, 1975) [in Russian], p. 37.

Download references

Author information

Authors and Affiliations

  1. Orel State University, 302026, Orel, Russia

    O. I. Markov & Yu. V. Khripunov

Authors
  1. O. I. Markov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yu. V. Khripunov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding authors

Correspondence to O. I. Markov or Yu. V. Khripunov.

Additional information

Translated by E. Bondareva

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Markov, O.I., Khripunov, Y.V. Atomic Force Microscopy Determination of the Direction of Dislocation Lines in Single Crystals of Bismuth and Its Alloys. Crystallogr. Rep. 65, 211–214 (2020). https://doi.org/10.1134/S1063774520020157

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063774520020157

Search

Navigation