Abstract
To increase the measurement precision of electron diffraction patterns, a deep upgrade of EMR-102 diffractometer is performed, its operation parameters are studied, and a single-electron detection system with high temporal resolution (up to 60 MHz) and high spatial resolution (several tens of thousands of pixels per 1 Å–1) is elaborated. A special software is developed to control the experiment (in particular, using deflection coils and applying synchronous detection of temporal and spatial parameters of each event of electron detector response) and process experimental data. The upgraded diffractometer was used in a series of precise electron diffraction studies, where the accuracy in measuring relative intensities and spatial (angular) resolution were much better than in similar experiments described in the literature.
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REFERENCES
B. Vainstein, Structural Analysis by Electron Diffraction (Pergamon, Oxford, 1964).
B. K. Vainshtein, B. Zvyagin, and A. S. Avilov, Electron Diffraction Techniques, Vol. 1 (Oxford Univ. Press, Oxford, 1992), p. 216.
A. S. Avilov, A. K. Kuligin, U. Pietch, et al., J. Appl. Crystallogr. 32, 1033 (1999).
V. G. Tsirelson, A. S. Avilov, G. G. Lepeshov, et al., J. Phys. Chem. B 105, 5068 (2001).
A. Avilov, G. Lepeshov, U. Pietsch, et al., J. Phys. Chem. Solids 62, 2135 (2001).
A. S. Avilov, Z. Kristallogr. 218, 247 (2003).
J. C. H. Spence and J. M. Zuo, Electron Microdiffraction (Plenum, New York, 1992).
A. S. Avilov, Kristallografiya 21 (6), 1117 (1976).
A. S. Avilov, Kristallografiya 24 (1), 178 (1979).
A. P. Zhukhlistov, A. S. Avilov, D. Ferraris, et al., Crystallogr. Rep. 42 (5), 774 (1997).
A. P. Zhukhlistov and B. B. Zvyagin, Crystallogr. Rep. 43 (6), 950 (1998).
A. P. Zhukhlistov, Crystallogr. Rep. 46 (5), 730 (2001).
A. P. Zhukhlistov, Crystallogr. Rep. 50 (6), 902 (2005).
A. P. Zhukhlistov, Crystallogr. Rep. 53 (1), 76 (2008).
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V. V. Novikova, A. K. Kulygin, G. G. Lepeshov, et al., Crystallogr. Rep. 63 (6), 883 (2018).
O. I. Vasin, A. K. Kulygin, V. V. Novikova, et al., Crystallogr. Rep. 64 (5), 743 (2019).
P. Coppens, Row. T. N. Guru, P. Leung, et al., Acta Crystallogr. A 35, 63 (1979).
R. F. W. Bader, Atoms in Molecules: A Quantum Theory (Oxford Univ. Press, Oxford, 1990).
S. S. Olevskii, M. S. Sergeev, A. L. Tolstikhina, et al., Dokl. Akad. Nauk SSSR, 275 (6), 1415 (1984).
Ditabis Application Notes (www.ditabis.de).
A. Avilov, K. Kuligin, S. Nicolopoulos, et al., Ultramicroscopy 107, 431 (2007).
ACKNOWLEDGMENTS
We are grateful to V.V. Novikova and A.L. Tolstikhina for supplying polycrystalline BaF2 samples and amorphous WO3 samples for test measurements.
Funding
This study was supported by the Ministry of Science and Higher Education of the Russian Federation within the State assignment for the Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences.
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Translated by Yu. Sin’kov
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Kulygin, A.K., Kulygin, K.V. & Avilov, A.S. New Approaches to Precise Measurements of Electron Diffraction Patterns. Crystallogr. Rep. 65, 324–332 (2020). https://doi.org/10.1134/S1063774520020145
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DOI: https://doi.org/10.1134/S1063774520020145