A BIMOS-based 2T1C analogue spiking neuron circuit integrated in 28 nm FD-SOI technology for neuromorphic application

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Abstract

Neuromorphic computing is an emerging field of investigation for new algorithm solutions and daily life applications. We propose a novel approach to achieve an operator which uses a parasitic bipolar metal oxide semiconductor filed effect transistor combined with a capacitor and a n-type metal oxide semiconductor filed effect transistor. The resulting BIMOS-based leaky-integrate-and-fire spiking neuron circuit is integrated on thin silicon film in 28 nm high-k/metal-gate advanced complementary metal oxide semiconductor technology. The proof of concept is brought by 3-dimensional technology computer-aided design numerical simulations, and then validated by electrical characterization of the two-transistors-one-capacitor demonstrator. The underlying physical phenomena involved in the spiking mechanism are identified, explained and modelled. Low power consumption is obtained. In addition, the spiking neuron device benefits from intrinsic electro-static discharge robustness.

Introduction

Since the Moore’s law is close to its end [1], microelectronic industry is looking for new paradigm to pursue technological improvements that have shaped our information society. Beside quantum computing, neuromorphic engineering is one of the most promising tracks. Mimicking biological nervous systems at the integrated circuit level, very large scale integrated neural processors [2] are much more energetically efficient to perform neuromorphic computing than standard architecture based on Von Neuman finite state machine [3]. In such systems, a huge number of neurons has to be integrated and interconnected on a silicon die in order to build the artificial neural network (ANN). The neuron circuit design is one of the fundamental building blocks of the system. Its area and energy consumption are of primary concern. Even though formal neurons can be used for perceptron architecture [4], [5], [6], the spiking neuron (SN), which allow time-encoding, are preferentially used in state-of-the-art developments. Several types of SN circuit design have been already proposed in the literature [7], [8], [9], [10], [11], [12], [13], [14].

Fig. 1a shows one of the state-of-the-art SN design [12] that uses very few components (6 transistors and 2 capacitors). Typically, the synaptic current ISYN charges Cm whose drop voltage is sensed by the MP1/MN1 inverter. When it switches, Cm is alternately charged even more and discharged by MPNa and MNK to shape a voltage spike across it. The charge/discharge alternation is allowed by the MP2/MN2 inverter delay. The capacitor CK provides a refractory period. To reach the reported 4 fJ/spike consumption, the Cm and VDD supply are reduced to 4 fF and 200 mV respectively, leading to a 100 mV spike swing. This very high energy efficiency is at the cost of variability increase due to the deep subthreshold operation of the transistors under a 200 mV supply voltage. Typical VMEM and ISYN chronograms of a class 1 excitable SN [15] are also presented on Fig. 1b. This type of neuron provides tonic spikes at a frequency proportional to the excitation current.

One of the main parameters to be taken into consideration is the time-encoding speed directly related to the time-constant of the SN design. It is governed by the circuit resistances, capacitances and current drives. These values directly impact both energy and area consumption. In real-time real-life signal processing, the human range time constant (ms range) is relevant. It minimizes the energy consumption through the average spiking frequency lowering. However, the area consumption is maximized because higher capacitance values have to be integrated. Conversely, in a batch data processing context, decreasing the time constant is relevant to accelerate the computing. It reduces the area penalty at the expense of the energy consumption. A trade-off has to be found, depending on the target application.

This paper presents deeply the two-transistors-one-capacitor (2T1C) SN circuit introduced for the first time in [16] and based on the use of fully depleted silicon on insulator (FD-SOI) parasitic bipolar metal oxide semiconductor filed effect transistor (BIMOS). The proposed BIMOS-based (BB) leaky-integrate-and-fire (LIF) SN circuit allows area and energy consumption reduction and can be used in both real-time real-life signal and batch processing contexts by tuning the capacitor value. The paper is organised as follow. In Section 2, the BB LIF SN circuit is depicted in detail. In particular, the implemented SN model is exposed, as well as the circuit schematic and its operation mechanisms. Then 3-dimensional technology computer-aided design (3D TCAD) numerical simulation results are shown in Section 3 to illustrates the BB-LIF SN operation. Next, in Section 4, measurements performed on a partially integrated demonstrator are compared with simulated results. Thereafter, a compact model of the FD-SOI BIMOS is proposed and SPICE simulation results of the BB LIF SN transient behaviour are presented in Section 5. Section 6 is dedicated to a 3D TCAD study of a fully integrated BB LIF SN circuit design. And finally, the electro-static discharge (ESD) robustness of the proposed design is assessed in Section 7.

Section snippets

The LIF spiking neuron model

The proposed circuit implements the leaky, integrate and fire spiking neuron model, in which the relationship between the membrane voltage VMEM and the synaptic current ISYN is governed by a differential equation and a conditional expression, with four parameters [15]:CMEMdVMEMdt=ISYN-RLK-1VMEM-VRSTifVMEM>VTH,thenVMEMVRSTwhere CMEM is the membrane capacitance, RLK the leakage resistance, VTH the threshold voltage and VRST the reset voltage.

Circuit description

The proposed BB-LIF SN circuit is made up of a

3D TCAD simulations

This section investigates the BB-LIF SN transient responses to step synaptic input currents through 3D TCAD mixed-mode simulations, using the Synopsys Sentaurus TCAD simulator [19]. The FD-SOI BIMOS and the FD-SOI NMOS that constitute the BB-LTC are drawn and meshed in three dimensions (Fig. 4) in accordance with the 28 nm FDSOI technology process parameters for extended gate (EG) devices (equivalent oxide thickness (EOT) of 3.4 nm, see Section 4.1). The transistor sizes are taken as small as

Experimental results in 28 nm FD-SOI

To provide a proof a concept of the BB-LIF SN operation, a first silicon demonstrator is fabricated in the 28 nm FD-SOI technology from STMicroelectronics [20].

The BIMOS compact model

To allow SPICE simulation of the BB-LIF SN circuit, a BIMOS compact model is derived from the Leti-UTSOI2.1 one [24], [25] by applying these modifications (Fig. 12):

  • 1-

    A body-contact electrical node is added.

  • 2-

    Body-to-source/drain diode currents are added.

  • 3-

    GIDL/GISL currents are deviated from drain-to-source to drain/source-to-body paths.

  • 4-

    A drain-to-body impact ionization current model taken from [26] is added.

It should be noted that all changes concern static currents. Neither dynamic nor noise

The fully integrated BB-LIF SN

Thanks to TCAD tool, it is possible to estimate the behaviour of a fully integrated BB-LIF SN circuit design containing an embedded capacitance. Fig. 15a shows the 3D topology of a n-type FD-SOI metal oxide semiconductor capacitor (MOSCAP) co-integrated with the LTC. The MOSCAP area is 2 µm2 and its EOT is 3.4 nm. It corresponds to a non-linear capacitance that ranges from 2.7 fF to 22 fF, depending on whether the inversion layer is present or not under its gate.

In a first simulated experiment,

Self ESD protected neuron

ESD is a major aggressor for integrated circuits, especially during the charged device model stress (CDM). The purpose of this section is to evaluate the real impact of CDM events on the BB-LIF SN circuit design in the view of its integration in a full circuit. The CDM event is measured for an average current slope (ACS) with IACS = 1 µA in 1 ns duration. This stress is applied directly to membrane node of the BB-LIF SN circuit which is expected to be robust due to the fact that BIMOS device is

Conclusion

This paper introduces a new design of spiking neuron in 28 nm node FD-SOI technology. The BIMOS transistor on thin silicon film associated with a MOSCAP and a NMOS reproduces a spiking neuron with excitability of class I. Physical mechanisms involved in its operation are identified, described, and modelled. The BIMOS back gate voltage and the NMOS front gate voltage allow to tune the neuron features. Measurements performed on a silicon demonstrator bring the proof of concept of such an

Acknowledgment

Thanks are due to our colleagues from STMicroelectronics for strong support in TCAD and process integration, from CEA-LETI for priceless helps in compact modelling and from IMEP-LAHC for measurements set-up configurations.

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