Spectroscopic and electrical analysis of vacuum co-evaporated CdxZn1-xTe thin films

https://doi.org/10.1016/j.spmi.2020.106521Get rights and content

Highlights

  • Demonstrates successful growth of CdxZn1-xTe films with desired stoichiometry by.

  • Vigard's plot established the relation between optical band gap and composition.

  • p-type to n-type switching observed for films with x = 0.4 and above.

  • Optimized composition of x = 0.8 suits for solar absorber layer application.

Abstract

CdxZn1-xTe (CZT) films with different compositions were grown by thermal co-evaporation method, in which cadmium telluride (CdTe) and zinc telluride (ZnTe) were used as the source materials. The structural, morphological and optical properties of the films were characterized by x-ray diffraction (XRD), UV–Visible spectroscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM), photoluminescence (PL) and Raman spectroscopy. Detailed analysis has shown that films were having cubic phase with orientation along (111) plane and the optical band gap reduced from 2.17 to 1.53 eV when x was varied from 0 to 1. SEM micrographs confirmed the homogeneity of the films. Depending on the composition, Raman peaks of CZT samples were mixture of the fundamental modes of the CdTe and ZnTe and indicate “trigonal” lattice of Tellurium (Te). Analysis of PL spectra suggested tellurium as isoelectronic exciton traps, recombination of carriers in the surface traps and donor-acceptor pair present in the samples. Under electrical properties, p to n-type conversion was witnessed for x = 0.4 and above. Optical bad gap of about 1.60 eV with minimum Urbach energy (28.88 meV) and favourable electrical properties has led to conclude that CZT films with x = 0.8 may be suitable for solar cell absorber.

Introduction

Polycrystalline CdxZn1-xTe (CZT) is a versatile ternary chalcogenide, which is well suited for optoelectronic device applications. Apart from tunability of the optical band gap, CZT preserves some of the promising properties like high absorption coefficient [1], high binding energy [2], high average atomic number [3], good electron-transport properties and higher quantum efficiency compared to CdTe [4]. Due to these properties, CZT ternary chalcogenide thin films are widely used in opto-electronic devices such as solar cells [5], photo-detectors [6], gamma and X-ray detectors [7] etc. In most of the CdTe based solar cells, p-type CdTe is used as absorbing layer with different back contact methods, which suffer from long-term instabilities due to the in-diffusion of contaminants or impurities. To overcome this drawback, as an alternative, p-type window layer with n-type CdTe absorber can be used. Reports on n-type CdTe absorber layer used in graphitic carbon Schottky - type heterojunction [8], reduced grapheme oxide (rGO) solar cells [9] and diamond/CdTe inverted heterojunction solar cells [10] are available in literature. CZT films with n-type conductivity can improve the performance of these type of solar cells due to their favourable optoelectronic properties mentioned in the beginning.

Several physical and chemical methods were reported on the preparation of CZT films such as molecular beam epitaxy [11], pulsed laser deposition [12], sputtering [13], thermal vacuum evaporation [14], chemical bath deposition [15], closed space sublimation method [16] etc. Substrate temperature [17], thickness of the films [18], types of substrates [19] and post deposition heat treatment [11] are the important factors that influence the structural and optical properties of CZT thin films. Current research in renewable energy is focussed on low cost, excellent stability, high efficiency in solar cells. Solar cell with high efficiency can be achieved by using wide band gap window and tandem solar cell in which structure consists of top cell and bottom cell which are connected in series. Applications like radiation detectors and solar cell require high quality, cost effective CZT films as absorber layer with large grains, low defect concentration, high lattice ordering and uniform distribution of the elements.

In the present work, thermal co-evaporation technique is adopted for synthesis of the CZT films with CdTe and ZnTe as the source materials. Because of advantages low cost, like high deposition rate, uniform deposition, less material consumption and most productive over other methods, thermal co-evaporation method is preferred over other techniques. The objective of this work is to study the structural, morphological, optical and electrical properties; analyse defects states present in the compositionally varied CZT films.

Section snippets

Experimental details

A series of CdxZn1-xTe (x = 0, 0.1, 0.2, 0.4, 0.6, 0.8, 1) thin films of thickness 450 ± 5 nm were grown on cleaned borosilicate glass substrates by thermal co-evaporation method under a base pressure of 3 × 10−6 mbar. CZT films were grown by taking stoichiometric ratio of CdTe and ZnTe (Alfa Aesar, 99.999% purity) as source material which were weighed in appropriate proportion and placed in molybdenum boats separately. Substrate cleaning is the prior step in the film deposition as it affects

Morphological analysis

All films with different compositions were found to be homogeneous, uniform and free from cracks. Fig. 1 (a), (b) and (c) are representative SEM topology of the CZT films with x = 0, 0.4, 1. SEM images show that grains in the films are relatively dense and have greater grain size with less grain boundaries as compared with previous reports on CZT films [23,24]. These are essential properties to reduce the trapping effect in the boundaries and improve the collection of carriers which qualifies

Conclusions

This research project has demonstrated that thermal co-evaporation can be a suitable technique to grow CZT films with required stoichiometry. Structural and optical characterizations have confirmed the device quality of 450 nm thick films grown by this technique. Minor deviation in the Zn composition is attributed to lower sticking coefficient of Zn compared to Cd. Optical bad gap engineering has been successfully achieved and films with x = 0.8 found to be more suitable for absorber layer

CRediT author statement

Sahana Nagappa Moger: Experiment – growth, optical, electrical and graphical conversion of the data. Writing the manuscript. Deepika U Shanubhogue; Structural study - XRD, Rashmitha Keshav: Data analysis – Optical and structural. Mahesha M G: Building the concept, data analysis, reviewing and editing.

Declaration of competing interest

Authors have no conflict of interest to declare.

Acknowledgement

The authors are grateful to UGC DAE CSR, Indore, Govt. of India (CSR-IC-MSRSR-11/CRS-219/2017–18/1300) for financial assistance. Also, authors are grateful to Dr. Vasanth Sathe, Raman Lab, CSR Indore, India, for extending the Raman Spectroscopy facility.

References (52)

  • S.A. Khan et al.

    “Effect of cadmium addition on the optical constants of thermally evaporated amorphous Se – S – Cd thin films

    Curr. Appl. Phys.

    (2010)
  • S. Chander et al.

    Thermal annealing induced physical properties of electron beam vacuum evaporated CdZnTe thin fi lms

    Thin Solid Films

    (2017)
  • S. Chander et al.

    Effect of thickness on physical properties of electron beam vacuum evaporated CdZnTe thin films for tandem solar cells

    Phys. E Low-dimensional Syst. Nanostructures

    (2016)
  • S. Chander et al.

    Enhanced structural, electrical and optical properties of evaporated CdZnTe thin films deposited on different substrates

    Mater. Lett.

    (2017)
  • Y. Zhang

    The microstructure , optical and electrical property of CdZnTe thick fi lms grown from a CSS method

    J. Cryst. Growth

    (2015)
  • S.J. Ikhmayies et al.

    Characterization of vacuum evaporated CdTe thin films prepared at ambient temperature

    Mater. Sci. Semicond. Process.

    (2013)
  • F.S. Manciu et al.

    Spectroscopic, microscopic, and internal stress analysis in cadmium telluride grown by close-space sublimation

    Thin Solid Films

    (2015)
  • J. Min et al.

    Investigation of Te inclusions in CdZnTe crystalline material using Raman spectroscopy and IR techniques

    Vaccum

    (2012)
  • H. Xu et al.

    The dependence of Zn content on thermal treatments for Cd 1-xZnxTe thin films deposited by close-spaced sublimation

    Appl. Surf. Sci.

    (2014)
  • R. Ganguly et al.

    “Growth and characterization of Cd 1 − x Zn x Te thin films prepared from elemental multilayer deposition

    Appl. Surf. Sci.

    (2010)
  • M. Ekawa et al.

    Fabrication and photoluminescence properties of ZnTe and CdZnTe films by low pressure metalorganic chemical vapour deposition

    J. Cryst. Growth

    (1988)
  • L. Cai

    Preparation of polycrystalline CdZnTe thick film Schottky diode for ultraviolet detectors

    Vaccum

    (2013)
  • M. Li

    Electrodeless measurement method of conduction type based on the free carrier absorption effect in CdZnTe

    Mater. Sci. Semicond. Process.

    (2017)
  • Y. Xu et al.

    Research into the electrical property variation of undoped CdTe and ZnTe crystals grown under Te-rich conditions

    J. Alloys Compd.

    (2014)
  • T.L. Chu

    Deposition and properties of zinc telluride and cadmium zinc telluride films

    J. Appl. Phys.

    (1986)
  • J. Tao

    Interface chemistry of CdZnTe films studied by a peel-off approach

    Appl. Surf. Sci.

    (2016)
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