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Identifying the viscoelastic properties of soft matter from the indentation response of a hard film-soft substrate system

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Abstract

The indentation technique is widely used in measuring the mechanical properties of soft matter at the microscale or nanoscale, but still faces challenges by these unique properties as well as the consequent strong surface adhesion, including the strong nonlinear effect, unclear judgment of the contact point, difficulties in estimating the contact area, and the risk of the indenter piercing the sample. Here we propose a two-step method to solve these problems: lay a hard film on a soft matter, and obtain the viscoelastic properties of this soft matter through the indentation response of this composite structure. We first establish a theoretical indentation model of the hard film-soft substrate system based on the theory of plates, elastic-viscoelastic correspondence principle and Boltzmann superposition principle. To verify the correctness of this method, we measure the mechanical properties of the methyl vinyl silicone rubber (MVSR) covered by a Cu nanofilm. Finally, we test the effectiveness and error sensitivity of this method with the finite element method (FEM). The results show that our method can accurately measure the mechanical properties of soft matter, while effectively circumventing the problems of the traditional indentation technique.

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Authors and Affiliations

  1. Department of Mechanics and Engineering Science, College of Engineering, Peking University, Beijing, 100871, China

    YanWei Liu, YueGuang Wei & Hao Long

Authors
  1. YanWei Liu
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  2. YueGuang Wei
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  3. Hao Long
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Correspondence to YueGuang Wei.

Additional information

This work was supported by the National Natural Science Foundation of China (Grant Nos. 11432014, 11521202, 11672301, and 11890681).

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Liu, Y., Wei, Y. & Long, H. Identifying the viscoelastic properties of soft matter from the indentation response of a hard film-soft substrate system. Sci. China Phys. Mech. Astron. 63, 244612 (2020). https://doi.org/10.1007/s11433-019-1482-y

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  • DOI: https://doi.org/10.1007/s11433-019-1482-y

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