Issue 23, 2020
From the journal:

RSC Advances

Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

Kailu Xiao,ab   Xianqian Wu, ORCID logo *ad   Chenwu Wu,a   Qiuyun Yinc  and  Chenguang Huangab  

* Corresponding authors

a Institute of Mechanics, Chinese Academy of Sciences, No.15 Beisihuanxi Road, Beijing, China
E-mail: wuxianqian@imech.ac.cn

b School of Engineering Science, University of Chinese Academy of Sciences, Beijing, China

c Department of Applied Mechanics & Engineering, School of Engineering, Sun Yat-sen University, Guangzhou 510275, PR China

d Materials and Process Simulation Center, California Institute of Technology, Pasadena, CA 91125, USA

Abstract

Residual stresses play a crucial role in both light-electricity conversion performances and the lifespan of photovoltaic (PV) cells. In this paper, the residual stress of triple junction cells (i.e. GaInP/GaInAs/Ge) induced by laser-driven massive micro-particle impact is analyzed with a novel method based on backscattering Raman spectroscopy. The impact process, which induces damage to the PV cells and brings the residual stress, is also investigated by optical microscopy (OM) and Scanning Electron Microscopy (SEM). The results show that the PV cells would exhibit various damage patterns. At the same time, strong residual stresses up to hundreds of MPa introduced in the damaged PV cells after impact have been analysis, providing an effective perspective to better understand the damage behavior and residual stress features of PV cells during their service life.

Graphical abstract: Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

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Article information

DOI
https://doi.org/10.1039/C9RA10082B
Article type
Paper
Submitted
02 Dec 2019
Accepted
25 Mar 2020
First published
02 Apr 2020
This article is Open Access
Creative Commons BY-NC license

RSC Adv., 2020,10, 13470-13479

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Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

K. Xiao, X. Wu, C. Wu, Q. Yin and C. Huang, RSC Adv., 2020, 10, 13470 DOI: 10.1039/C9RA10082B

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