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Electro-mechanical Degradation Model of Flexible Metal Films Due to Fatigue Damage Accumulation

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Abstract

An electro-mechanical degradation model is developed to evaluate the electronic and mechanical reliability performance of metal films due to fatigue accumulation. The model establishes the relationship between electrical resistivity and damage, which can be used to predict the change in electrical resistivity and damage evolution of metal films under fatigue loading. Based on the developed model, fatigue damage evolution and change in electrical resistivity simulation of metal films can be implemented to evaluate the electronic and mechanical reliability performance of metal films for the condition where the stress/strain level is heterogeneous. As a case study, fatigue damage evolution and change in electrical resistivity of a copper film on flexible substrate under cyclic loading is numerical analyzed and compared with experiment. It shows that the electro-mechanical degradation model and implemented simulation are effective, and can be used to evaluate the electronic and mechanical reliability performance of metal films due to fatigue accumulation reasonably.

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Acknowledgements

The works described in this paper are financially supported by Jiangsu Province natural sciences fund subsidization Project (BK20170655), the Fundamental Research Funds for the Central Universities (3205009203) and Zhishan Youth Scholar Program of SEU, to which the authors are most grateful. The authors are very grateful to the reviewers for carefully reading the paper and for their comments and suggestions which have improved the paper.

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  1. Department of Engineering Mechanics, Jiangsu Key Laboratory of Engineering Mechanics, Southeast University, Nanjing, 210096, China

    Bin Sun, Xingzhen Huang & Zhaoxia Li

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  1. Bin Sun
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  2. Xingzhen Huang
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  3. Zhaoxia Li
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Correspondence to Bin Sun.

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Sun, B., Huang, X. & Li, Z. Electro-mechanical Degradation Model of Flexible Metal Films Due to Fatigue Damage Accumulation. Met. Mater. Int. 26, 501–509 (2020). https://doi.org/10.1007/s12540-019-00351-x

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