Stable magnesium zinc oxide by reactive Co-Sputtering for CdTe-based solar cells

https://doi.org/10.1016/j.solmat.2020.110521Get rights and content

Highlights

  • Combinatorial synthesis of MZO by reactive sputtering.

  • Identification of optimal composition as a function of architecture and process.

  • MZO stable with respect to time and processing with oxygen.

  • High efficiency devices achieved in multiple laboratories.

Abstract

Magnesium zinc oxide (MZO) is a promising front contact material for CdTe solar cells. Due to its higher band gap than traditional CdS, MZO can reduce parasitic absorption to significantly increase short-circuit current density while also providing a benefit of conduction band offset tuning through Mg:Zn ratio optimization. MZO has been successfully implemented into CdTe devices, however its stability has been of concern. The MZO stability issue has been attributed to the presence of oxygen in the CdTe device processing ambient, leading to double-diode behavior (S-kink) in the current density-voltage curves. Here we report on MZO thin films deposited by reactive co-sputtering. The reactively co-sputtered MZO thin films have encouraging stability, show no significant variation in work function of the surface over a period of 6 months, as measured by Kelvin probe. Energy conversion efficiencies of around 16% have been achieved both with and without presence of oxygen in device processing ambients across multiple research facilities. These efficiencies should be possible to increase further by tuning of the thin film deposition and device processing parameters, especially through optimization of the back contact.

Introduction

Cadmium telluride (CdTe) thin film photovoltaic technology has become a commercial leader with over 25 GW installed capacity worldwide [1]. In recent years, the efficiency has been improved significantly to reach 22.1% [2], primarily through alloying CdTe with Se and substitution of CdS as a window layer with wider band gap materials, both of which allow for improved short circuit current density (Jsc), such that they are close to theoretical limits in champion devices [3,4]. Nevertheless, further increases in efficiency can be achieved through improvements in open circuit voltage (Voc) and fill factor (FF), which is still well below its theoretical maximum. A key to achieving these improvements is higher carrier concentration and lifetime [5,6]. Significant progress has been made in those areas through group V doping and Se alloying, respectively [[7], [8], [9]]. However, to fully realize these benefits improved emitter layers are required [5]. The ideal emitter should be transparent, have appropriate conduction band position and doping levels, and it must be chemically compatible with both the materials and device processing [[10], [11], [12]].

Magnesium zinc oxide (MgxZn1-xO, MZO) has been demonstrated to be a superior emitter to conventional CdS [10]. MZO is transparent (Eg > 3.3 eV) and its conduction band edge can be appropriately aligned with the CdTe absorber by tuning the degree of Mg incorporation, reducing interface recombination. Optimal performance requires flat or slightly positive conduction band offset [[10], [11], [12]]. In addition, in double heterostructures it has been shown that MZO passivates CdTe and results in higher carrier lifetime [13]. Despite these successes, concerns remain about the stability of MZO [14], and its use constraints the conditions used for subsequent device processing. In particular, it imposes a requirement that no oxygen may be used in subsequent processing, as its presence has been attributed to formation of an “S-kink” in the current density-voltage (J-V) curves [15,16]. Another unresolved challenge has been the achievement of stable doping levels in MZO.

To date the MZO films integrated into CdTe solar cells have been produced almost exclusively by sputtering using ceramic targets [3,[15], [16], [17]]. This limits exploration of composition to discrete values, and the optimal Mg/Zn value remains unclear and is likely to be a function of both the specific device architecture and processing steps employed. In addition, ceramic targets are expensive, have relatively low deposition rates, and suffer from target aging and poor utilization, so metal targets are desirable for MZO sputtering [18]. There have been several reports on combinatorial deposition of MZO [19,20], including co-sputtering from Mg metal and ZnO ceramic targets [21], but without integration in CdTe photovoltaic devices.

Here, we demonstrated a combinatorial reactive co-sputtering of MZO films from Mg and Zn targets for application as emitters in CdTe photovoltaic solar cell devices. This deposition approach allows the composition and thickness of MZO film to be varied continuously on one substrate by keeping it stationary during deposition. These combinatorial MZO libraries are then converted into photovoltaic devices by depositing CdTe on top of them, accelerating optimization of solar cells. Optimization of device performance led to device efficiencies of around 16% with oxygen present in the device processing ambient. We hypothesize that native point defects are the origin of MZO instability in other studies, and that the concentration of these defects is stabilized by sputtering in an oxygen ambient in this report. The robust nature of reactively sputtered MZO was validated by its use for successful CdTe device fabrication across multiple laboratories.

Section snippets

Materials and Methods

MZO films were deposited by reactive co-sputtering from elemental Zn (99.99%) and Mg (99.95%) targets in an AJA Orion-5 chamber at a substrate to target distance of 10 cm. DC power supply was used for Zn sputtering, while RF was used for Mg. TEC10 glass (Hartford Glass) superstrates were used for devices and were cleaned prior to being loaded into the sputter chamber using Micro 90 solution followed by a 20-min UV-ozone treatment. Si wafers and glass slides were used for MZO thickness and band

MZO thickness

Fig. 1 shows J-V curves of CdTe devices fabricated with MZO thickness variation of 25–200 nm, and optimal MZO band gap of ~3.5 eV [22] identified in our recent work for the CSM CdTe device process with CdCl2 treatment done at 430 °C for 30 min. Similarly to what was reported in literature [10], the efficiency improves as the MZO film thickness increases from 25 to 100 nm, then stays relatively unchanged in the 100–200 nm thickness range. The improvement in performance is mainly due to FF and Voc

Conclusions

Reactive co-sputtering was shown to produce robust, high quality MZO films, and the formation of combinatorial libraries accelerated identification of optimal MZO composition. High efficiency (~16%) CdTe devices were produced across multiple device platforms, with and without the presence of oxygen in device processing steps. The reactively sputtered MZO films were shown to be stable with respect to time and through high temperature CdTe device fabrication. The resilience and stability of MZO

CRediT authorship contribution statement

Yegor Samoilenko: Conceptualization, Methodology, Investigation, Formal analysis, Writing - original draft, Writing - review & editing. Gavin Yeung: Methodology, Investigation, Writing - review & editing. Amit H. Munshi: Investigation, Writing - review & editing. Ali Abbas: Investigation, Writing - review & editing. Carey L. Reich: Investigation, Writing - review & editing. Michael Walker: Investigation, Writing - review & editing. Matthew O. Reese: Investigation, Writing - review & editing.

Declaration of competing interest

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Acknowledgements

The CSM authors are grateful to the National Science Foundation (NSF) through award number CBET-1706149. We would also like to thank Deborah McGott for providing training on CdTe processing at NREL. The use of the TOF-SIMS system at CSM was supported by the NSF under Grant No.1726898. The Loughborough authors would like to thank support from the EPSRC for funding this research through project EP/N026438/1. Authors at CSU would like to acknowledge support from NSF AIR, NSF I/UCRC and US DOE PVRD

References (42)

  • NREL Best Research-Cell Efficiencies
  • A.H. Munshi et al.

    Polycrystalline CdSeTe/CdTe absorber cells with 28 mA/cm2 short-circuit current

    IEEE J. Photovoltanics

    (2018)
  • A. Kanevce et al.

    The roles of carrier concentration and interface, bulk, and grain-boundary recombination for 25% efficient CdTe solar cells

    J. Appl. Phys.

    (2017)
  • J.M. Burst et al.

    CdTe solar cells with open-circuit voltage breaking the 1 V barrier

    Nat. Energy

    (2016)
  • W.K. Metzger et al.

    Exceeding 20% efficiency with in situ group V doping in polycrystalline CdTe solar cells

    Nat. Energy

    (2019)
  • T.A.M. Fiducia et al.

    Understanding the role of selenium in defect passivation for highly efficient selenium-alloyed cadmium telluride solar cells

    Nat. Energy

    (2019/06/01 2019)
  • X. Zheng et al.

    Recombination and bandgap engineering in CdSeTe/CdTe solar cells

    Apl. Mater.

    (2019)
  • T. Song et al.

    Emitter/absorber interface of CdTe solar cells

    J. Appl. Phys.

    (2016)
  • T. Ablekim et al.

    Interface engineering for 25% CdTe solar cells

    ACS Appl. Energy Mater.

    (2018)
  • J.M. Kephart et al.

    Sputter-deposited oxides for interface passivation of CdTe photovoltaics

    IEEE J. Photovoltanics

    (2018)
  • T. Ablekim et al.

    Tailoring MgZnO/Cd(Se)Te interfaces for photovoltaics

    IEEE J. Photovoltanics

    (2019)
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