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Optically Detected Magnetic Resonance Spectroscopy in Silicon Carbide using Temperature Sweep

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Journal of Applied Spectroscopy Aims and scope

Optically detected magnetic resonance with temperature sweep is developed using the temperature dependence of the spin Hamiltonian parameters of paramagnetic color centers in silicon carbide. The detection is based on natural optical alignment of spin level populations over a wide temperature range including room temperature and on the change of these populations during level anti-crossing or cross-relaxation processes.

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Correspondence to I. D. Breev.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 87, No. 1, pp. 25–28, January–February, 2020.

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Breev, I.D., Anisimov, A.N., Babunts, R.A. et al. Optically Detected Magnetic Resonance Spectroscopy in Silicon Carbide using Temperature Sweep. J Appl Spectrosc 87, 18–21 (2020). https://doi.org/10.1007/s10812-020-00956-w

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  • DOI: https://doi.org/10.1007/s10812-020-00956-w

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