Photoluminescence of trivalent rare-earth ions codoped in ZnO thin films: Competing site occupation by Eu3+ and Er3+ ions

https://doi.org/10.1016/j.jlumin.2020.117133Get rights and content

Highlights

  • Photoluminescence from Eu3+ and Er3+ codoped ZnO thin films was investigated.

  • Eu3+ emission signal was steeply attenuated when Er3+ concentration was increased.

  • Eu3+ emission requires hydrogenated ZnO but Er3+ emission prefers hydrogen-free ZnO.

  • Concentration quenching for codoping was greater than single doping of Eu3+ or Er3+.

  • Eu3+ or Er3+ compete for occupation of emission-active sites.

Abstract

The effect of codoping two kinds of trivalent rare-earth ions in ZnO thin films was investigated in terms of photoluminescence (PL) intensities relative to those of singly doped ones. ZnO films codoped with 1 at.% of Eu3+ and a variable concentration of Er3+ were deposited on Si(100) and SiO2 substrates. With preference to securing emission signals from Eu3+, the deposition was carried out under flow of H2O vapor gas. After the samples were post annealed at various temperatures, their PL spectra upon bandgap excitation at 325 nm were monitored. It was found that the Eu3+ emission signal at 612 nm became steeply attenuated as the Er3+ concentration increased, whereas the Er3+ emission signal was absent from the films deposited on Si(100) substrate. The necessary conditions for Er3+ emission signal at 665 nm to appear were (i) deposition on SiO2 substrate at low H2O pressure, (ii) high Er content close to 3 at.%, and (iii) post annealing above 700 °C. Conditions (i) and (iii) correspond to minimizing the influence of hydrogen-containing (OH and H) species. Thus, the emissions from Eu3+ and Er3+ do not appear together because Eu3+ emission requires a hydrogenated ZnO host crystal, whereas Er3+ emission prefers a hydrogen-free environment. The observation of Er3+ emissions from films on SiO2 but not from films on Si reflected the stiffness of the Si crystal and the flexibility of the SiO2 network. Strain in the ZnO host crystal, which was caused by rare-earth ions substituting at Zn2+ sites, would have been relieved by slightly deforming the amorphous SiO2 network. The concentration quenching for codoping with Eu3+ and Er3+ was greater than that for single doping with Eu3+ or Er3+. We propose an occupation-site-competing model wherein only limited numbers of emission-active Zn2+ sites are available for substitution by Eu3+ and Er3+

Introduction

ZnO is a most extensively studied oxide useful for various opto-electronic devices. Because its wide bandgap energy of 3.37 eV is advantageous for minimizing thermal relaxation from electronically excited states, application as host crystal for doping luminescent ions is promising. Up to now, Eu3+-doped ZnO (ZnO:Eu) [[1], [2], [3], [4], [5], [6], [7], [8], [9], [10], [11], [12], [13], [14], [15], [16], [17], [18]] and Er3+-doped ZnO (ZnO:Er) [[19], [20], [21], [22], [23], [24], [25], [26], [27], [28], [29], [30], [31]] have been investigated by many research groups. These materials are representative combinations of trivalent rare-earth ions with ZnO. We have also reported visible photoluminescence (PL) from sputter-deposited ZnO:Eu [[32], [33], [34], [35]] and ZnO:Er [[36], [37], [38]] thin films through bandgap excitation. While some of the emission characteristics are common to ZnO:Eu and ZnO:Er, others are different. One common feature is that the crystallinity of the host film strongly affects the emission intensities of the rare-earth-ion dopants. While deposition with H2O vapor gas is a necessary condition for Eu3+ emission to be observed, the presence of hydrogen species hinders Er3+ emission.

For rare-earth ions to be emission-active upon bandgap excitation, they must be components of the host crystal; i.e., occupation at Zn2+ sites is required for quick transfer of the excitation energy to them. If the rare-earth ions segregate at grain boundaries, the excitation energy is consumed via band-edge emissions and/or deep-level emissions of the ZnO crystal. In addition, the excited state should not decay non-radiatively before the excitation energy is transferred to the rare-earth ions. However, substituting Zn2+ with Eu3+ or Er3+ is an energetically unfavorable event. In the first place, the charge difference between divalent (Zn2+) and trivalent (Eu3+ and Er3+) ions is the problem. The replacement must satisfy Pauling's second rule; i.e., charge neutrality around the cation site must be locally conserved. One way to satisfy this requirement is introducing vacancies near the rare-earth ion to adjust the charge imbalance. Moreover, the ionic radius of Zn2+ is smaller than those of Eu3+ and Er3+. Substituting Zn2+ sites with Eu3+ or Er3+ ions exerts strain on the ZnO crystal lattice. If the rare-earth-ion dopants are few in number, the strain may be relieved by slightly deforming the lattice. However, once the rare-earth-ion dopant concentration exceeds some threshold value, the strain cannot be relieved unless vacancies are created at nearby sites or the rare-earth-ions are released to the grain boundaries. Once the rare-earth ions separate from the ZnO lattice, they are no longer emission-active. Moreover, creating vacancies opens deep-level emission channels, which are other energy consumption paths that compete with the emission channel of the rare-earth ions.

Substituting manner of trivalent ions at Zn2+ sites varies depending on the ion species. For instance, the doping characteristics of Al3+-doped ZnO (AZO) and Ga3+-doped ZnO (GZO) films are much more robust than those of rare-earth-ion-doped ZnO films. The high stability of AZO and GZO films have made them popular materials for transparent conductive electrodes [39]. It is based on the smaller ionic radii of Al3+ and Ga3+ than that of Zn2+, which ensures that Al3+ and Ga3+ can be substituted at Zn2+ sites while not causing stress in the crystal. When the dopant concentration is less than 3 at.%, all dopants occupy the cation sites and are electrically activated; thus they act as donors [40]. When the concentration exceeds 3 at.%, some of them fail to enter cation sites and become segregated at grain boundaries, which lowers the electrical activation probability per number of dopant ions. Nevertheless, the GZO crystal maintains c-axis orientation even at a high dopant level of 10 at.% [40]. This means that disruption of the ZnO crystal by Ga3+ is not so serious. These characteristics strikingly contrast with the case of rare-earth ions, where even small numbers of rare-earth ions hamper the ZnO crystal lattice. At high dopant levels, Zn vacancies (VZn) are created to maintain charge balance. When the Al3+ and Ga3+ ions occupying the Zn2+ sites are accompanied by VZn at a nearby site, the resulting AlZn–VZn [41,42] and GaZn−VZn [43,44] pairs behave as acceptors. The transformation from a donor-predominant state to an acceptor-predominant state means that there is an optimum concentration of dopants at which the carrier concentration takes a maximum value. This situation resembles that of emission characteristics of rare-earth ions; the maximum emission intensity is reached at a certain concentration. Securing high-density doping while maintaining optical activation is a key factor to achieving a high emission yield.

In the work reported in this paper, we investigated how codoping of Er3+ and Eu3+ ions into ZnO crystalline films changes their emission properties, focusing on the interference between these ion species. Since the main emission peaks of Eu3+ (612 nm) and Er3+ (665 nm) are very close in terms of wavelength, it is worthwhile to clarify how the bandgap excitation energy is transferred to these ions and which emission channel is actually selected. On the basis of our experimental results, we propose a site-competing model for Er3+ and Eu3+ ions occupying emission-active sites.

Section snippets

Experimental procedure

ZnO films doped with Eu3+ and/or Er3+ ions were deposited by dual-target sputtering at room temperature (RT). The configuration of the dual sputtering sources is depicted in Fig. 1. One is an electron cyclotron resonance (ECR) plasma source equipped with a cylindrical ZnO target in which 1 at.% Eu with respect to Zn was dissolved. Another is an RF magnetron sputtering gun (MAK source, MeiVac) equipped with a two-inch planar Er2O3 target. Zn, Eu and O atoms sputtered from the ZnO:Eu target

PL spectra of ZnO films singly-doped with Eu3+ or Er3+

As for the deposition in our apparatus, sputtering with H2O vapor rather than O2 was essential to obtain Eu3+ emissions from ZnO:Eu films. This is because abundant oxygen radicals are generated through decomposition of O2 in the ECR plasma, and oxygen radicals strongly oxidize the Zn and Eu elements in the film. Separation of Eu3+ ions from ZnO crystallites in the form of Eu2O3 is disadvantageous in view of substituting Eu3+ ions at Zn2+ sites. Use of H2O vapor gas prevents excessive

Classification of codoping effects

The effect of codoping can be classified into three types. If the valence state of the codopant is not trivalent, the codopant ions may act as promotors for placing trivalent rare-earth ions at Zn2+ sites through the charge compensation mechanism. The representative systems include Er3+ and Li+-codoped ZnO [[49], [50], [51], [52], [53]], Eu3+ and Li+-codoped ZnO [54,55], and Eu3+ and H+-codoped ZnO [[33], [34], [35]]. In these cases, if two adjacent Zn2+ sites are replaced by pairs of Er3+ and

Conclusion

Only emissions from Eu3+ were observed from Eu3+ and Er3+ codoped ZnO films on Si substrates deposited with H2O vapor gas. The Eu3+ emission intensity was maximized after vacuum annealing at 350 °C, at which OH/H species still remained in the ZnO crystal. Eu3+ emissions disappeared when the hydrogen atoms were removed above 400 °C, but Er3+ emissions did not appear even under these conditions. Er3+ emissions were observed only from films deposited on SiO2 once the Eu3+ emission became extinct

CRediT authorship contribution statement

Housei Akazawa: Formal analysis, Writing - original draft, Investigation.

Declaration of competing interest

There is no conflict of interest.

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