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Determination of the Metal Dispersion of Supported Catalysts Using XPS

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Abstract

In this work, recent applications of XPS for the dispersion measurements of oxidic supports and metal catalysts were discussed. The most frequently used models, those of Kerkhof–Moulijn and Davis, were selected to give an overview of several applications in the study of catalysts, based on noble (Pd, Au, Ag, and Rh) and non-noble metals (Co, Ni). In the case of the dispersion of different promoters on the surface of oxidic supports, the Kerkhof–Moulijn model was often applied. Good correlations were achieved for high surface area Al2O3 supports modified by La, B and W. This model was also applied to analyze the dispersion of Co, Ni, Pd and Rh on oxidic supports, making it possible to propose the limit of monolayer formation for homogeneously distributed metal particles. The Davis model was developed for the estimation of metal particle sizes. This method considered the morphology of the metal particles and assumed a diamond-shaped support. The XPS results combined with the information obtained through other techniques showed the potential application of this model in the determination of metal particle sizes for Rh, Au, Pd and Ni based catalysts.

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Abbreviations

α:

c/λ dimensionless crystallite size parameter

β(d,λ):

Attenuation factor

\(\beta\) :

t/λ dimensionless parameter

δi :

Density

λi :

Attenuation length or inelastic mean free path

σi :

Photoelectron cross section

θ :

Emission angle of the electron from the surface normal

A 0 :

Analyzed area

c :

Dimension of crystallites with cubic shape

d :

Diameter or particle size

dI i :

Photoelectric differential peak intensity

D(Ei):

Detector efficiency

Ei :

Kinetic energy

f :

Fraction of support covered with the promoter

F(Ei):

Instrumental factor

h :

Height

Ii :

Photoelectric peak intensity

Jx :

X-ray flux

l :

Traveling length of the electrons

Li :

Angular asymmetry factor

ni :

Atomic density

P xy :

Fraction of electron travelling through another layer

S i :

Sensitivity factor

S 0 :

Support surface area

t :

Support sheet thickness

T(E i):

Analyzer transmission

x :

Promoter fraction (weight) in the final catalyst

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Acknowledgements

Thanks are given to Universidad Nacional del Litoral, CONICET and ANPCyT for the purchase of the SPECS multitechnique analysis instrument (PME8-2003).

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Authors and Affiliations

  1. Instituto de Investigaciones en Catálisis y Petroquímica, INCAPE, Facultad de Ingeniería Química, Universidad Nacional del Litoral, CONICET, Santiago del Estero 2829, 3000, Santa Fe, Argentina

    Ana M. Tarditi, María Fernanda Mori & Laura M. Cornaglia

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  1. Ana M. Tarditi
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  2. María Fernanda Mori
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  3. Laura M. Cornaglia
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Correspondence to Laura M. Cornaglia.

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Tarditi, A.M., Mori, M.F. & Cornaglia, L.M. Determination of the Metal Dispersion of Supported Catalysts Using XPS. Top Catal 62, 822–837 (2019). https://doi.org/10.1007/s11244-019-01191-0

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