Abstract
The full diagnostic test for contact circuits in the presence of one-type contact faults (breaking or closure) is considered. We constructively establish that any Boolean function can be realized by a contact circuit permitting a non-trivial full diagnostic test, i.e., a test containing not all input vectors.
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References
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Red’kin, N.P. Diagnostic Tests for Contact Circuits. Moscow Univ. Math. Bull. 74, 62–64 (2019). https://doi.org/10.3103/S0027132219020049
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DOI: https://doi.org/10.3103/S0027132219020049