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Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

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Abstract

Atomic force microscopy (AFM) was used to assess the indentation modulus M s and pull-off force F po in four case studies of distinct evidence types, namely hair, questioned documents, fingerprints, and explosive particle-surface interactions. In the hair study, M s decreased and F po increased after adding conditioner and bleach to the hair. For the questioned documents, M s and F po of two inks were markedly different; ballpoint pen ink exhibited smaller variations relative to the mean value than printer ink. The fingerprint case study revealed that both maximum height and F po decreased over a three-day period. Finally, the study on explosive particle-surface interactions illustrated that two fabrics exhibited similar M s, but different F po. Overall, it was found that AFM addresses needs in forensic science as defined by several federal agencies, in particular an improved ability to expand the information extracted from evidence and to quantify its evidentiary value.

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Authors and Affiliations

  1. Applied Chemicals and Materials Division, Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO, 80305, USA

    F. W. DelRio

  2. Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA

    R. F. Cook

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  1. F. W. DelRio
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  2. R. F. Cook
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Correspondence to F. W. DelRio.

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DelRio, F.W., Cook, R.F. Quantitative Scanning Probe Microscopy for Nanomechanical Forensics. Exp Mech 57, 1045–1055 (2017). https://doi.org/10.1007/s11340-016-0238-y

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