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Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees J. Electron. Test. (IF 0.9) Pub Date : 2024-03-07
Abstract Biological assays around “lab-on-a-chip (LoC)” are required in multiple concentration (or dilution) factors, satisfying specific sample concentrations. Unfortunately, most of them suffer from non-locality and are non-protectable, requiring a large footprint and high purchase cost. A digital geometric technique can generate arbitrary gradient profiles for digital microfluidic biochips (DMFBs)
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A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches J. Electron. Test. (IF 0.9) Pub Date : 2024-03-02 Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang
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Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance J. Electron. Test. (IF 0.9) Pub Date : 2024-03-02
Abstract The recent expansion of the Internet of Things (IoT) owes a lot to the significant contribution of the 6LoWPAN protocol, which has been extensively employed in low-power and lossy networks. To facilitate communication in 6LoWPAN networks, the Internet Engineering Task Force (IETF) has suggested the usage of the Routing Protocol for Low-Power and Lossy Networks (RPL). Despite its usefulness
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A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements J. Electron. Test. (IF 0.9) Pub Date : 2024-02-27 Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan
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Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems J. Electron. Test. (IF 0.9) Pub Date : 2024-02-27 M. N. Saranya, Rathnamala Rao
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Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations J. Electron. Test. (IF 0.9) Pub Date : 2024-02-27 Victor Champac, Hector Villacorta, R. Gomez-Fuentes, Fabian Vargas, Jaume Segura
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Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration J. Electron. Test. (IF 0.9) Pub Date : 2024-02-24 Shifeng Yu, Junjie Dai, Junhui Li
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Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration J. Electron. Test. (IF 0.9) Pub Date : 2024-02-21 Huang Linsen
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General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme J. Electron. Test. (IF 0.9) Pub Date : 2024-01-09 Shun-Hua Yang, Shi-Yu Huang
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Effective Software Mutation-Test Using Program Instructions Classification J. Electron. Test. (IF 0.9) Pub Date : 2024-01-09 Zeinab Asghari, Bahman Arasteh, Abbas Koochari
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Performance Efficient and Fault Tolerant Approximate Adder J. Electron. Test. (IF 0.9) Pub Date : 2023-12-11 Asma Iqbal, Syed Affan Daimi, K. Manjunatha Chari
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Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field J. Electron. Test. (IF 0.9) Pub Date : 2023-12-07 Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou
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A Survey of PCB Defect Detection Algorithms J. Electron. Test. (IF 0.9) Pub Date : 2023-12-01 Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar
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Efficient Fault Detection by Test Case Prioritization via Test Case Selection J. Electron. Test. (IF 0.9) Pub Date : 2023-11-22 J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan
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Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection J. Electron. Test. (IF 0.9) Pub Date : 2023-11-02 Zhenyu Zhao, Xin Chen, Yufan Lu
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MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms J. Electron. Test. (IF 0.9) Pub Date : 2023-10-24 Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka
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Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN J. Electron. Test. (IF 0.9) Pub Date : 2023-10-12 Ying-Chun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang
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Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model J. Electron. Test. (IF 0.9) Pub Date : 2023-09-22 Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant
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Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns J. Electron. Test. (IF 0.9) Pub Date : 2023-09-16 Ling Zhang
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A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells J. Electron. Test. (IF 0.9) Pub Date : 2023-09-15 Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad
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Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection J. Electron. Test. (IF 0.9) Pub Date : 2023-09-07 Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy
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Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System J. Electron. Test. (IF 0.9) Pub Date : 2023-08-30 Vinod S Chippalkatti, Rajashekhar C Biradar, Venkatesh Shenoy, P Udayakumar
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Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network J. Electron. Test. (IF 0.9) Pub Date : 2023-08-11 R. Saravana Ram, M. Lordwin Cecil Prabhaker
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New Second-order Threshold Implementation of Sm4 Block Cipher J. Electron. Test. (IF 0.9) Pub Date : 2023-08-04 Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu
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E3C Techniques for Protecting NAND Flash Memories J. Electron. Test. (IF 0.9) Pub Date : 2023-07-01 Shyue-Kung Lu, Zeng-Long Tsai
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A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm J. Electron. Test. (IF 0.9) Pub Date : 2023-06-20 Bahman Arasteh, Farhad Soleimanian Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar
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Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems J. Electron. Test. (IF 0.9) Pub Date : 2023-06-20 Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr, Rafael I. Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei A. Guazzelli, Nilberto H. Medina, Paulo F. Butzen
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Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection J. Electron. Test. (IF 0.9) Pub Date : 2023-06-16 Vijaypal Singh Rathor, Deepak Singh, Simranjit Singh, Mohit Sajwan
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Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing J. Electron. Test. (IF 0.9) Pub Date : 2023-06-03 Benedikt Jooß, Dieter Schramm
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Incomplete Testing of SOC J. Electron. Test. (IF 0.9) Pub Date : 2023-05-29 Kunwer Mrityunjay Singh, Jatindra Deka, Santosh Biswas
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Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations J. Electron. Test. (IF 0.9) Pub Date : 2023-05-25 K. Coulié, H. Aziza, W. Rahajandraibe
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A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits J. Electron. Test. (IF 0.9) Pub Date : 2023-05-24 Pradeep Kumar Biswal
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BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems J. Electron. Test. (IF 0.9) Pub Date : 2023-05-18 Sabyasachi Deyati, Barry Muldrey, Abhijit Chatterjee
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Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets J. Electron. Test. (IF 0.9) Pub Date : 2023-05-09 Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan
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Design of INV/BUFF Logic Locking For Enhancing the Hardware Security J. Electron. Test. (IF 0.9) Pub Date : 2023-05-05 R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Sridevi Sathya Priya, S. V. Ashika
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Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network J. Electron. Test. (IF 0.9) Pub Date : 2023-04-29 Wenjing Tang, Jing Su, Yuchan Gao
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Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift J. Electron. Test. (IF 0.9) Pub Date : 2023-04-25 Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore Manikas
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Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation J. Electron. Test. (IF 0.9) Pub Date : 2023-04-25 Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos
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Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm J. Electron. Test. (IF 0.9) Pub Date : 2023-03-29 Raghavendra Kumar Sakali, Noor Mahammad Shak
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Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications J. Electron. Test. (IF 0.9) Pub Date : 2023-03-28 Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury
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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits J. Electron. Test. (IF 0.9) Pub Date : 2023-03-27 H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre
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A Tunable Concurrent BIST Design Based on Reconfigurable LFSR J. Electron. Test. (IF 0.9) Pub Date : 2023-03-06 Ahmad Menbari, Hadi Jahanirad
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Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation J. Electron. Test. (IF 0.9) Pub Date : 2023-02-27 Sourav Ghosh, Surajit Kumar Roy, Chandan Giri
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Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey J. Electron. Test. (IF 0.9) Pub Date : 2023-02-28 Bahareh Asadi, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian
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A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing J. Electron. Test. (IF 0.9) Pub Date : 2023-02-21 Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
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Multiple Retest Systems for Screening High-Quality Chips J. Electron. Test. (IF 0.9) Pub Date : 2023-02-20 Chung-Huang Yeh, Jwu E. Chen
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Identifying Resistive Open Defects in Embedded Cells under Variations J. Electron. Test. (IF 0.9) Pub Date : 2023-02-09 Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich
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DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram J. Electron. Test. (IF 0.9) Pub Date : 2023-02-03 Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
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An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends J. Electron. Test. (IF 0.9) Pub Date : 2023-01-23 Jake Elliot, Jason Brown
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A Complete Design-for-Test Scheme for Reconfigurable Scan Networks J. Electron. Test. (IF 0.9) Pub Date : 2023-01-19 Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich
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Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit J. Electron. Test. (IF 0.9) Pub Date : 2023-01-10 Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo
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Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications J. Electron. Test. (IF 0.9) Pub Date : 2022-12-17 R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Sridevi Sathya Priya
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A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing J. Electron. Test. (IF 0.9) Pub Date : 2022-12-13 Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
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A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems J. Electron. Test. (IF 0.9) Pub Date : 2022-12-07 Richa Sharma, G. K. Sharma, Manisha Pattanaik
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Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing J. Electron. Test. (IF 0.9) Pub Date : 2022-12-02 S. S. Vinod Chandra, S. Saju Sankar, H. S. Anand
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Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries J. Electron. Test. (IF 0.9) Pub Date : 2022-12-01 Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, Derek Ajesam Asoh, Nicole Adélaïde Kengnou Telem, René Kuate-Fochie, Godpromesse Kenné
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Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit J. Electron. Test. (IF 0.9) Pub Date : 2022-11-18 Neha Pannu, Neelam Rup Prakash, Jasbir Kaur
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AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking J. Electron. Test. (IF 0.9) Pub Date : 2022-11-03 Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin