Today, the relational database is not suitable for data management due to the large variety and volume of data which are mostly untrusted. Therefore, NoSQL has attracted the attention of companies. Despite it being a proper choice for managing a variety of large volume data, there is a big challenge and difficulty in performing online analytical processing (OLAP) on NoSQL since it is schema-less. This

The secure exchange of secret information is one of the most important challenges in the era of modern communication. To address the issue and establish secure communication, various techniques have been developed. Transmitting secret information in a hidden manner is one of the numerous possible solutions. It can be used to transmit secret information, hidden in other media called cover medium. However

One of the most important issues in deep nanoscale regime CMOS circuits is related to the time-dependent performance degradation caused by negative bias temperature instability (NBTI). The integration of online aging sensor is becoming attractive methodologies in monitoring performance degradation of circuit. The sensor can generate a warning signal, early warning of the occurrence of aging faults

This article presents an effective on-chip power analysis attack countermeasure based on a new CMOS self-decoupling battery cell system that uses a self-decoupling circuit. The self-decoupling circuit dynamically controls an on-chip virtual power supply point, V ddv , that can be used to power security-sensitive modules. The circuit automatically decouples an on-chip CMOS battery cell from powering

A four-element frequency reconfigurable and pattern diverse multiple-input-multiple-output (MIMO) antenna array for fifth-generation relay node applications is presented to operate in LTE bands 42 (3400-3600 MHz), 43 (3600-3800 MHz), and 46 (5150-5925 MHz). A planar microstrip line-fed monopole antenna is utilized as the MIMO element. The antenna relies on fluidic reconfiguration mechanism to either

Due to the growing complexity of today's digital circuits, the speed of fault simulation has become increasingly important. Although critical path tracing (CPT) is faster than conventional methods, it is not fast enough for fault simulation of complex circuits with a large number of faults and tests. Exact stem analysis is the most important obstacle in accelerating the CPT method. The simplification