Temporal changes in carrier relaxations, magnetic switching, and biological structures are known to be in the order of ns. These phenomena can be typically measured by means of an optical-pump & electron-probe method using an electron microscope combined with a pulsed electron source. A photoemission-type pulsed electron gun makes it possible to obtain a short-pulsed electron beam required for high

The feasibility of detecting magnetic excitations using monochromated electron energy loss spectroscopy in the transmission electron microscope is examined. Inelastic scattering cross-sections are derived using a semi-classical electrodynamic model, and applied to AC magnetic susceptibility measurements and magnon characterisation. Consideration is given to electron probes with a magnetic moment, such

Integral to the exploration of nonequilibrium phenomena in solid-state systems is the study of lattice motion after photoexcitation by a femtosecond laser pulse. For the past two decades, ultrafast electron diffraction (UED) has played a critical role in this regard. Despite remarkable progress in instrumental development, this technique is still bottlenecked by a demanding sample preparation process

Antibacterial photodynamic therapy is a promising treatment for problematic infections caused by bacteria and fungi. Despite its undoubted effectiveness, the ultrastructural mechanism of microbial death remains not fully described and distinct organisms respond to the treatment with different efficacy. For this reason, it was decided to try imaging the process using the in situ transmission electron

The low throughput of atomic force microscopy (AFM) is the main drawback in its large-scale deployment in industrial metrology. A promising solution would be based on the parallelization of the scanning probe system, allowing acquisition of the image by an array of probes operating simultaneously. A key step for reaching this goal relies on the miniaturization and integration of the sensing mechanism

Signal optimization for transmission Kikuchi diffraction (TKD) measurements in the scanning electron microscope is investigated by a comparison of different sample holder designs. An optimized design is presented, which uses a metal shield to efficiently trap the electron beam after transmission through the sample. For comparison, a second holder configuration allows a significant number of the transmitted

Quantitative scanning transmission electron microscopy (STEM) allows composition determination for nanomaterials at an atomic scale. To improve the accuracy of the results obtained, optimized imaging parameters should be chosen for annular dark field imaging. In a simulation study, we investigate the influence of imaging parameters on the accuracy of the composition determination with the example of

Crystal diffraction is a well-established technique for high-resolution structural analysis of material science and biological samples. However, the recovered structure is a result of averaging over all the unit cells in the crystal, which smears out the imperfections, atomic defects, or asymmetries and chiral properties of the individual molecules. We propose Bragg holography, where a nano-crystal

The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscopy (TEM) was studied in thick specimens in which the sample becomes the limiting factor in the resolution. The sample influences the energy spread of the electron beam, allows only a limited electron dose, and modulates electron scattering events. The experimental set-up consisted of a thin silicon nitride

An atomic potential should be assigned to several slices in the multislice method owing to its three-dimensional (3D) distribution. Based on a formula including several Gaussian functions to fit electron atomic scattering factors, a simple analytical expression is proposed to calculate the potential of atoms projected onto multiple slices. The potential in 3D distribution is properly projected onto

The behavior of the Folwer-Nordheim (FN) plot is investigated for large-area emitters arrays composed of perfectly aligned single-walled carbon nanotubes (CNTs). The field emission currents are calculated based on the standard FN model using the Murphy-Good equation. The aspect ratio of the CNTs is varied such that the height of the CNT has predefined uniform or Gaussian distributions. Continuous degradation

An interpretation of Coulomb delocalization, which limits the spatial resolution of inelastic TEM or STEM images, is given. We conclude that the corresponding point spread function cannot be measured as a broadening of a STEM probe.

Numerical simulations on field emission properties of an open single-walled carbon nanotube with radius r = 1 nm have been carried out. Using finite element method, we have calculated the local electric field Floc and field enhancement factor γ distribution over the surface of the open CNT. From these calculations, we plot theoretical current-voltage characteristics and assess effective field characteristics

Image simulation in electron microscopy is vital for advanced image analysis but can be prohibitively long. This is especially true when including thermal diffuse scattering through the frozen phonon method, requiring repeat simulations for a number of phonon configurations. Here a method of reducing frozen phonon simulation time is demonstrated by emulating random phonon displacements through randomly

Practical aspects of dosimetry are considered, including the measurement of electron-beam current and current density. Complications that arise in the case of a focused probe or a STEM image are discussed and solutions proposed. Advantages of expressing the radiation dose in Grays are listed and a simple formula given for converting electron fluence to Gray units, based on a near constancy of the stopping

In light optics, beams with orbital angular momentum (OAM) can be produced by employing a properly-tuned two-cylinder-lens arrangement, also called π/2 mode converter. It is not possible to convey this concept directly to the beam in an electron microscope due to the non-existence of cylinder lenses in commercial transmission electron microscopes (TEMs). A viable work-around are readily-available electron

Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be used to map strain, polarization, octahedra tilts, and other physical and chemical order parameter fields. The latter can be used as inputs into mesoscopic and atomistic

We present a parameter retrieval method which incorporates prior knowledge about the object into ptychography. The proposed method is applied to two applications: (1) parameter retrieval of small particles from Fourier ptychographic dark field measurements; (2) parameter retrieval of a rectangular structure with real-space ptychography. The influence of Poisson noise is discussed in the second part

Novel imaging strategies in the scanning electron microscope aimed at significantly improved image contrast of second phases in metal alloys are described. These include the use of low accelerating voltages, small working distances, and a novel detection system. Contrast is assessed as a function of voltage and optimized imaging conditions which result in much improved image quality are presented.

A convolutional neural network is used to align an orbital angular momentum sorter in a transmission electron microscope. The method is demonstrated using simulations and experiments. As a result of its accuracy and speed, it offers the possibility of real-time tuning of other electron optical devices and electron beam shaping configurations.

In the coherent diffraction imaging (CDI) techniques, a key point is to reconstruct the complex-valued object from the far-field intensity measurements, i.e., solving the phase retrieval problem. However, due to this ill-posed problem, traditional phase retrieval algorithms often encounter some problems associated with the iteration convergence. In this work, complementary phase modulations (CPM) are

Controlling two dimensional doping distributions is an important benefit in order to check processed substrates or specific devices. To achieve this purpose, a new methodology is proposed in order to obtain qualitative maps of acceptor concentration from one EBIC image. Analytical models are used to help in defining the best experimental condition and to check the validity of the approach, and a TCAD

Research in materials science increasingly depends on the correlation of information from multiple characterisation techniques, acquired in ever larger datasets. Efficient methods of processing and storing these complex datasets are therefore crucial. Reliably keeping track of data processing is also essential to conform with the goals of open science. Here, we introduce Hystorian, a generic materials

4D-scanning transmission electron microscopy (4D-STEM) can be used to measure electric fields such as atomic fields or polarization-induced electric fields in crystal heterostructures. The paper focuses on effects occurring in 4D-STEM at interfaces, where two model systems are used: an AlN/GaN nanowire superlattice as well as a GaN/vacuum interface. Two different methods are applied: First, we employ

Conventionally, theoretical considerations in electron microscopy employ the weak phase approximation (WPA), which is only valid for weak scattering atomic elements (C, B, N) but not for transition metal dichalcogenide (TMD) materials. This leads to many exciting phenomena being overlooked. The present theoretical study goes beyond the weak phase approximation and thus the obtained results can be applied

Differential phase contrast (DPC) microscopy is a STEM imaging technique, which is used to measure magnetic and electric fields of mesoscopic and nanoscopic dimensions, i.e. interatomic distances (Chapman et al. 1978; Chapman et al. 1981; Chapman, 1984; Chapman et al. 1985; Chapman et al. 1997; Lohr et al. 2012; Shibata et al. 2015; Bauer et al. 2014; Carvalho et al. 2016; Lohr et al. 2016; Mueller-Caspary

Transmission electron microscopy has become a major characterization tool with an ever increasing variety of methods being applied in a wide range of scientific fields. However, the probably most famous pitfall in related workflows is the preparation of high-quality electron-transparent lamellae enabling for extraction of valuable information. Particularly in the field of solid state physics and materials

A new method of non-destructive sub-surface interfacial characterisation has been developed recently, which can be useful for quality assurance of a buried interface in nanoelectronic devices, such as magnetic random access memory. Since the cell size of these devices have been reducing their sizes, it is important to evaluate the resolution of the non-destructive imaging. A sub nanometric layer of

In this study atom probe tomography was used to determine the implantation depth of four different plasma FIB ion species – xenon, argon, nitrogen, and oxygen – implanted at different acceleration voltages. It was found that lowering the beam energy reduces the implantation depth, but significant implantation was still observed for N, O and Ar at beam energies as low as 2 kV. Furthermore, nitrides

We present a newly developed methodology using computer-readable fiducial markers to allow images from multiple imaging modalities to be registered automatically. This methodology makes it possible to correlate images from many surface imaging techniques to provide an unprecedented level of surface detail on a nanometre scale that no one technique can provide alone. This methodology provides the capability

A computational method was developed to recover the three-dimensional coordinates of gold nanoparticles specifically attached to a protein complex from tilt-pair images collected by electron microscopy. The program was tested on a simulated dataset and applied to a real dataset comprising tilt-pair images recorded by cryo electron microscopy of RNA polymerase II in a complex with four gold-labeled

Hybrid pixel detectors (HPDs) have been shown to be highly effective for diffraction-based and time-resolved studies in transmission electron microscopy, but their performance is limited by the fact that high-energy electrons scatter over long distances in their thick Si sensors. An advantage of HPDs compared to monolithic active pixel sensors is that their sensors do not need to be fabricated from

There is an increasing requirement for the acquisition of large two (2D) or three (3D) dimensional electron back scattered diffraction (EBSD) maps. It is a well-known, but largely neglected fact, that EBSD maps may contain distortions. These include long-range distortions, which can be caused by the interaction of the electron beam with the sample geometry and it can also arise from sample or beam

The professional and private lives of Wolfgang Baumeister, Sir Colin Humphreys, John C.H. Spence and Knut Urban are retraced on the occasion of their 80th (Humphreys, Urban) and 75th (Baumeister, Spence) birthdays

In this paper we study the effect of lens aberrations (spherical aberration and astigmatism), beam tilt, contamination and shot noise on the accuracy and precision of position determination in imaging scanning transmission electron microscopy (ISTEM) on the example of BaTiO3. ISTEM images are simulated as a function of sample thickness and defocus starting from a nearly perfect microscope setting.

In this paper, a new multi-frequency excitation method based on combination resonance is introduced to enhance the non-contact atomic force microscopy performance. In combination resonance, excitation frequencies are selected so that summation/subtraction of excitation frequencies is close to the natural frequencies of the microcantilever. Due to the nonlinear nature of this method, the probe response

Nano-porous materials can be imaged spatially by focused ion beam scanning electron microscopy (FIB-SEM). This method generates a stack of SEM images that has to be segmented (or reconstructed) to serve as basis for structural characterization. To this end, we apply two state-of-the-art algorithms. We study the influence of the original image’s voxel size on estimates of morphological characteristics

Numerous physical phase plates (PP) for phase-contrast enhancement in transmission electron microscopy (TEM) have been proposed and studied with the hole-free or Volta PP having a high impact and interest in recent years. This study is concerned with comparative TEM image simulations considering realistic descriptions of various PP approaches and samples from three different fields of application covering

We report on the design and implementation of a scattering-type scanning near-field microscope working in the low terahertz-band under ambient conditions for nanoscopic investigations of physical properties and characteristics at sample surfaces and interfaces in the microwave and millimeter wave bands. Employing a nano-tip that oscillates vertically at a frequency Ω as the antenna, and a subharmonic

It is shown that higher order Laue zone (HOLZ) rings in high energy electron diffraction are specific to individual columns of atoms, and show different strengths, structure and radii for different atom columns along the same projection in a structure. An atomic resolution 4-dimensional STEM dataset is recorded from a <110> direction in a perovskite trilayer, where only the central LaFeO3 layer should

Calibration of magnification and nonlinearity of scanning electron microscopy (SEM) is an essential task. In this paper, we proposed a new type of 1D grating sample fabricated by combining laser-focused atomic deposition and x-ray interference lithography as a lateral standard for calibrating SEMs. The calibrations of the grating pattern by a metrological large-range atomic force microscope indicate

A novel combination of machine learning algorithms is proposed for the differentiation of distinct spectra in a large electron energy loss spectroscopy spectrum image (EELS-SI) dataset. For clustering of the EEL spectra including similar fine structures in an efficient space, linear and nonlinear dimensionality reduction methods are used to project the EEL spectra onto a low-dimensional space. Then

Performing EBSD with a horizontal sample and a parallel EBSD detector sensor, enables safer specimen movements for data collection of large specimen areas and improves the longitudinal spatial resolution. The collection of electron backscattering patterns (EBSPs) at normal incidence to the electron beam has been revisited via the use of a direct electron detection (DED) sensor. In this article we present

Scanning Electron Microscopy (SEM) technique is widely used to characterize nanoparticle (NP) size. The landing energy (LE) of the primary electron beam is considered to be a key parameter related to the ability of electrons to penetrate the sample. However, few studies have been carried out so far on the influence of this parameter on the measurement of NP size by SEM. The increasing needs for reference

It has been argued that in atomic-resolution transmission electron microscopy (TEM) of sparse weakly scattering structures, such as small biological molecules, multiple electron scattering usually has only a small effect, while the in-molecule Fresnel diffraction can be significant due to the intrinsically shallow depth of focus. These facts suggest that the three-dimensional reconstruction of such

The simple dependence of the intensity in annular dark field scanning transmission electron microscopy images on the atomic number provides (to some extent) chemical information about the sample, and even allows an elemental identification in the case of light-element single-layer samples. However, the intensity of individual atoms and atomic columns is affected by residual aberrations and the confidence

Nitrogen (N) is a common element added to GaAs for band gap engineering and strain compensation. However, detection of small amounts of N is difficult for electron microscopy as well as for other chemical analysis techniques. In this work, N in GaAs is examined by using different transmission electron microscopy (TEM) techniques. While both dark-field TEM imaging using the composition sensitive (002)

Since radiation damage is proportional to fluence, radiation damage limits the spatial resolution of biological structures determined by either X-ray or electron scattering. If only elastic scattering is used for structural information then electrons are superior as the ratio of elastic to inelastic scattering is higher than for X-rays. For soft X-rays in the water window below the O K edge photoabsorption

The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic electron mirror system under a sample in a conventional scanning electron microscope (SEM), we present a new imaging scheme which allows us to form scanned images

Green fluorescent protein (GFP) emits light when irradiated by not only light but also electrons. This electron-induced light emission called cathodoluminescence (CL) can be used to realize a high-resolution light emission microscopy based on the irradiation of a very narrow electron beam. To implement CL mapping in life sciences the investigation of the damage resistance of GFP to electron irradiation

LiMn2O4 has been considered one of the most promising cathode materials for Li-ion batteries due to its thermal stability, abundance, environmental affinity, and the possibility to exchange Li-ions in three-dimensions. However, it still suffers from major problems, such as capacity fading and voltage decay, which has been associated to phase transformations and dissolution of transition metals. In

Electron tomography is widely employed for the 3D morphological characterization at the nanoscale. In recent years, there has been a growing interest in analytical electron tomography (AET) as it is capable of providing 3D information about the elemental composition, chemical bonding and optical/electronic properties of nanomaterials. AET requires advanced reconstruction algorithms as the datasets

Inspired by the standard computed tomography, a new method of 3D X-ray imaging embedded in FIB-SEM microscope is proposed. The unique combination of TEM-like specimen stage enabling in lens STEM detection (referred to as CompuStage), nanomanipulator (referred to as EasyLift) facilitating in-situ sample transfer from bulk sample to TEM-like stage and pixelated in-situ Timepix X-ray detector in Helios

In this work, we present a theoretical study of the angular dynamics of small nanoparticles induced by fast non-vortex electron beams. General expressions for the torque and the angular momentum transferred from an electron to an arbitrary—but small—nanoparticle are obtained using a full-retarded classical electrodynamics approach, within the small particle limit. We applied this methodology to study

This article describes a miniature electron beam scanning system based on an octupole electrode as the key stage of the implementation of the MEMS electron microscope. The scanning system consists of a silicon electrode with a central hole, containing 8 properly powered elements and a special electronic system controlling voltage. Octupole electrode was made using MEMS technology. First, it was examined

Here we demonstrate the use of nanofabricated grating holograms to diffract and shape electrons in a scanning electron microscope. The diffraction grating is placed in an aperture in the column. The entire diffraction pattern can be passed through the objective lens and projected onto the specimen, or an intermediate aperture can be used to select particular diffracted beams. We discuss several techniques