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Nano1D: An accurate Computer Vision software for analysis and segmentation of low-dimensional nanostructures Ultramicroscopy (IF 2.2) Pub Date : 2024-03-10 Ehsan Moradpur-Tari, Sergei Vlassov, Sven Oras, Mart Ernits, Elyad Damerchi, Boris Polyakov, Andreas Kyritsakis, Veronika Zadin
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Measuring scattering distributions in scanning helium microscopy Ultramicroscopy (IF 2.2) Pub Date : 2024-03-07 C.J. Hatchwell, M. Bergin, B. Carr, M.G. Barr, A. Fahy, P.C. Dastoor
A scanning helium microscope typically utilises a thermal energy helium atom beam, with an energy and wavelength (¡100meV, 0.05 nm) particularly sensitive to surface structure. An angular detector stage for a scanning helium microscope is presented that facilitates the in-situ measurement of scattering distributions from a sample. We begin by demonstrating typical elastic and inelastic scattering from
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An in-situ magnetising holder achieving 1.5 T in-plane field in 200 kV transmission electron microscope Ultramicroscopy (IF 2.2) Pub Date : 2024-03-06 Tian Bai, Xin Sun, Jiazhuan Qin, Fei Li, Qiang Gao, Weixing Xia, Renjie Chen, Aru Yan, Wei Li
A strong in-plane magnetic field is required for Lorentz transmission electron microscopy (LTEM) to observe the evolution of the magnetic domain structure of materials with high coercivity, particularly for research on rare-earth permanent magnets. However, the maximum field of the present in-situ magnetising holder applied in 200-kV or 300-kV TEM does not exceed 0.1 T. In this study, the reason for
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The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching Ultramicroscopy (IF 2.2) Pub Date : 2024-02-24 Patrick Trimby, Mohammed Al-Mosawi, Maisoon Al-Jawad, Stuart Micklethwaite, Zabeada Aslam, Aimo Winkelmann, Sandra Piazolo
The remarkable physical properties of dental enamel can be largely attributed to the structure of the hydroxyapatite (HAp) crystallites on the sub-micrometre scale. Characterising the HAp microstructure is challenging, due to the nanoscale of individual crystallites and practical challenges associated with HAp examination using electron microscopy techniques. Conventional methods for enamel characterisation
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Weld-free mounting of lamellae for electrical biasing operando TEM Ultramicroscopy (IF 2.2) Pub Date : 2024-02-21 Oscar Recalde-Benitez, Yevheniy Pivak, Tianshu Jiang, Robert Winkler, Alexander Zintler, Esmaeil Adabifiroozjaei, Philipp Komissinskiy, Lambert Alff, William A. Hubbard, H. Hugo Perez-Garza, Leopoldo Molina-Luna
Recent advances in microelectromechanical systems (MEMS)-based substrates and sample holders for transmission electron microscopy (TEM) have enable exciting new opportunities for nanoscale investigation. The ability to perform electrical testing while simultaneously capturing the wide spectrum of signals detectable in a TEM, including structural, chemical, and even electronic contrast, represents a
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination Ultramicroscopy (IF 2.2) Pub Date : 2024-02-19 D.G. Şentürk, A. De Backer, S. Van Aert
In this paper, a methodology is presented to count the number of atoms in heterogeneous nanoparticles based on the combination of multiple annular dark field scanning transmission electron microscopy (ADF STEM) images. The different non-overlapping annular detector collection regions are selected based on the principles of optimal statistical experiment design for the atom-counting problem. To count
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Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning Ultramicroscopy (IF 2.2) Pub Date : 2024-02-15 Vadimas Ivinskij, Antanas Zinovicius, Andrius Dzedzickis, Jurga Subaciute-Zemaitiene, Juste Rozene, Vytautas Bucinskas, Eugenijus Macerauskas, Sonata Tolvaisiene, Inga Morkvenaite-Vilkonciene
Scanning electrochemical microscopy (SECM) is a scanning probe microscope with an ultramicroelectrode (UME) as a probe. The technique is advantageous in the characterization of the electrochemical properties of surfaces. However, the limitations, such as slow imaging and many functions depending on the user, only allow us to use some of the possibilities. Therefore, we applied visual recognition and
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Framework of compressive sensing and data compression for 4D-STEM Ultramicroscopy (IF 2.2) Pub Date : 2024-02-10 Hsu-Chih Ni, Renliang Yuan, Jiong Zhang, Jian-Min Zuo
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive materials. However, the field of view of 4D-STEM is relatively small, which in absence of live processing is limited by the data size required for storage. Furthermore
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Quantitative atomic cross section analysis by 4D-STEM and EELS Ultramicroscopy (IF 2.2) Pub Date : 2024-02-07 Shahar Seifer, Lothar Houben, Michael Elbaum
We demonstrate the use of a 4-dimensional scanning transmission electron microscope (4D-STEM) to extract atomic cross section information in amorphous materials. We measure the scattering amplitudes of 200 keV electrons in several representative specimens: amorphous carbon, silica, amorphous ice of pure water, and vitrified phosphate buffer solution. Diffraction patterns are recorded by 4D-STEM with
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Energy-dispersive X-ray spectroscopy in a low energy electron microscope Ultramicroscopy (IF 2.2) Pub Date : 2024-02-06 Rudolf M. Tromp
Energy-Dispersive X-Ray Spectroscopy (EDS) is a technique frequently used in Scanning and Transmission Electron Microscopes to study the elemental composition of a sample. Briefly, high energy electrons of the incident electron beam may ionize an electron from a core shell. The decay of this excited state may result in the emission of a characteristic X-ray photon or Auger-Meitner electron. A solid-state
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Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation Ultramicroscopy (IF 2.2) Pub Date : 2024-02-01 Masayuki Kamaya
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High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities Ultramicroscopy (IF 2.2) Pub Date : 2024-01-24 Leonardo M. Corrêa, Eduardo Ortega, Arturo Ponce, Mônica A. Cotta, Daniel Ugarte
The association of scanning transmission electron microscopy (STEM) and detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of materials with nanometric resolution and low irradiation levels. This is widely used for texture analysis of materials using automated crystal orientation mapping (ACOM)
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X-ray production cross sections for Ir and Bi M-subshells induced by electron impact Ultramicroscopy (IF 2.2) Pub Date : 2024-01-24 M.D. Décima, G.E. Castellano, J.C. Trincavelli, A.C. Carreras
M-subshell X-ray production cross sections were indirectly measured for Ir and Bi targets irradiated with monoenergetic electron beams. The projectile energy range run from 2.2 to 28 keV, impinging on Ir and Bi pure bulk targets in a scanning electron microscope. The resulting X-ray emission spectra were acquired with an energy dispersive spectrometer, and processed afterwards by means of a robust
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Automatic center identification of electron diffraction with multi-scale transformer networks Ultramicroscopy (IF 2.2) Pub Date : 2024-01-24 Mengshu Ge, Yue Pan, Xiaozhi Liu, Zhicheng Zhao, Dong Su
Selected area electron diffraction (SAED) is a widely used technique for characterizing the structure and measuring lattice parameters of materials. An autonomous analytic method has become an urgent demand for the large-scale SAED data produced from in-situ experiments. In this work, we realize the automatic processing for center identification with a proposed deep segmentation model named the multi-scale
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Accurate and fast localization of EBSD pattern centers for screen moving technology Ultramicroscopy (IF 2.2) Pub Date : 2024-01-20 Wei Li, Xingui Zhou, Jingchao Xu, Ruyue Zhang, Lizhao Lai, Yi Zeng, Hong Miao
The authors of this study develop an accurate and fast method for the localization of the pattern centers (PCs) in the electron backscatter diffraction (EBSD) technique by using the model of deformation of screen moving technology. The proposed algorithm is divided into two steps: (a) Approximation: We use collinear feature points to obtain the initial value of the coordinates of the PC and the zoom
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Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping Ultramicroscopy (IF 2.2) Pub Date : 2024-01-16 Raissa Lima de Oblitas, Flávio Bueno de Camargo Junior, Wagner Vidal Magalhães, Fernanda de Sá Teixeira, Maria Cecília Salvadori
We show the benefit of the use of atomic force microscopy (AFM) in spectroscopy force mode (FV: force volume) for evaluation of the cosmetic active effectiveness in improving the mechanical properties of human hair fibers cortex region. For this, we characterized human hair fibers without and with chemical damage caused by bleaching process. Fiber and resin (embedding material) data were obtained simultaneously
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Phase offset method of ptychographic contrast reversal correction Ultramicroscopy (IF 2.2) Pub Date : 2024-01-08 Christoph Hofer, Chuang Gao, Tamazouzt Chennit, Biao Yuan, Timothy J. Pennycook
The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast reversals, most often where the projected potentials are strong. In thicker samples central focusing often provides the best ptychographic contrast as this leads to defocus variations within the sample canceling out. However focusing
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Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration Ultramicroscopy (IF 2.2) Pub Date : 2023-12-29 Atoosa Dejkameh, Ricarda Nebling, Uldis Locans, Hyun-Su Kim, Iacopo Mochi, Yasin Ekinci
Coherent diffraction imaging (CDI) and its scanning version, ptychography, are lensless imaging approaches used to iteratively retrieve a sample’s complex scattering amplitude from its measured diffraction patterns. These imaging methods are most useful in extreme ultraviolet (EUV) and X-ray regions of the electromagnetic spectrum, where efficient imaging optics are difficult to manufacture. CDI relies
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Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection Ultramicroscopy (IF 2.2) Pub Date : 2023-12-21 Josephine DeRonja, Matthew Nowell, Stuart Wright, Josh Kacher
Introduced over ten years ago, cross-correlation-based electron backscatter diffraction has enabled high precision measurements of crystallographic rotations and elastic strain gradients at high spatial resolution. Since that time, there have been remarkable improvements in electron detector technology, including the advent of ultra-high speed detectors and the commercialization of direct detectors
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Point field emission electron source with a magnetically focused electron beam Ultramicroscopy (IF 2.2) Pub Date : 2023-12-21 Paweł Urbański, Piotr Szyszka, Marcin Białas, Tomasz Grzebyk
This paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and – which is novelty in such structures – with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 µA) and a beam with a small and homogeneous
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The target region focused imaging method for scanning ion conductance microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-12-09 Shengbo Gu, Jian Zhuang, Tianying Wang, Shiting Hu, Weilun Song, Xiaobo Liao
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Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering? Ultramicroscopy (IF 2.2) Pub Date : 2023-12-14 Peter Rez
Especially for light elements inelastic scattering is more probable than the elastic scattering that conveys the structural information. The question arises as to whether an image using inelastically scattered electrons is different depending on whether the elastic or inelastic scattering happens first, is there a top-bottom effect. We show that since inelastic scattering is concentrated in a narrow
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Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites Ultramicroscopy (IF 2.2) Pub Date : 2023-12-14 David Rutherford, Kateřina Kolářová, Jaroslav Čech, Petr Haušild, Jaroslav Kuliček, Egor Ukraintsev, Štěpán Stehlík, Radek Dao, Jan Neuman, Bohuslav Rezek
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Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors Ultramicroscopy (IF 2.2) Pub Date : 2023-12-07 Tianbi Zhang, T.Ben Britton
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Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope Ultramicroscopy (IF 2.2) Pub Date : 2023-12-10 Eli Flaxer, Lanna Bram, Alona Flaxer, Yael Roichman, Yuval Ebenstein
This paper introduces a compact, portable, and highly accurate triggering control system for a 3D confocal spinning-disk image scanning microscope (CSD-ISM). Building upon on our previously published research, we expanded the hardware of the controller and synchronized it with a sub-micron translator which scans the object in the z-direction. As well as expanding the hardware, the software also was
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Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment Ultramicroscopy (IF 2.2) Pub Date : 2023-12-12 Jeong-Woong Lee, In-Yong Park, Takashi Ogawa
Low-voltage scanning electron microscopy (LV-SEM) with landing energies below 5 keV has been widely used due to its advantages in mitigating the damage and charging effects to a specimen and enhancing surface information due to small interaction volume of electrons inside a specimen. Additionally, for elemental analysis of the surfaces of bulk specimens with Auger electron spectroscopy (AES) or electron
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“Depo-all-around”: A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples Ultramicroscopy (IF 2.2) Pub Date : 2023-12-05 Thomas Demuth, Till Fuchs, Andreas Beyer, Jürgen Janek, Kerstin Volz
Interfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during
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Time calibration studies for the Timepix3 hybrid pixel detector in electron microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-12-02 Yves Auad, Jassem Baaboura, Jean-Denis Blazit, Marcel Tencé, Odile Stéphan, Mathieu Kociak, Luiz H.G. Tizei
Direct electron detection is currently revolutionizing many fields of electron microscopy due to its lower noise, its reduced point-spread function, and its increased quantum efficiency. More specifically to this work, Timepix3 is a hybrid-pixel direct electron detector capable of outputting temporal information of individual hits in its pixel array. Its architecture results in a data-driven detector
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Focused ion beam milling and MicroED structure determination of metal-organic framework crystals Ultramicroscopy (IF 2.2) Pub Date : 2023-12-05 Andrey A. Bardin, Alison Haymaker, Fateme Banihashemi, Jerry Y.S. Lin, Michael W. Martynowycz, Brent L. Nannenga
We report new advancements in the determination and high-resolution structural analysis of beam-sensitive metal organic frameworks (MOFs) using microcrystal electron diffraction (MicroED) coupled with focused ion beam milling at cryogenic temperatures (cryo-FIB). A microcrystal of the beam-sensitive MOF, ZIF-8, was ion-beam milled in a thin lamella approximately 150 nm thick. MicroED data were collected
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Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-12-05 A. Gholinia, J. Donoghue, A. Garner, M. Curd, M.J. Lawson, B. Winiarski, R. Geurts, P.J. Withers, T.L. Burnett
Tri-beam microscopes comprising a fs-laser beam, a Xe+ plasma focused ion beam (PFIB) and an electron beam all in one chamber open up exciting opportunities for site-specific correlative microscopy. They offer the possibility of rapid ablation and material removal by fs-laser, subsequent polishing by Xe-PFIB milling and electron imaging of the same area. While tri-beam systems are capable of probing
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Weighted Burgers Vector analysis of orientation fields from high-angular resolution electron backscatter diffraction Ultramicroscopy (IF 2.2) Pub Date : 2023-11-24 Joe Gardner, David Wallis, Lars N. Hansen, John Wheeler
The Weighted Burgers Vector (WBV) method can extract information about dislocation types and densities present in distorted crystalline materials from electron backscatter diffraction (EBSD) maps, using no assumptions about which slip systems might be present. Furthermore, high-angular resolution EBSD (HR-EBSD) uses a cross-correlation procedure to increase the angular precision of EBSD measurements
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Segmentability evaluation of back-scattered SEM images of multiphase materials Ultramicroscopy (IF 2.2) Pub Date : 2023-11-24 Manolis Chatzigeorgiou, Vassilios Constantoudis, Marios Katsiotis, Margarita Beazi-Katsioti, Nikos Boukos
Segmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects
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Noise-dependent bias in quantitative STEM-EMCD experiments revealed by bootstrapping Ultramicroscopy (IF 2.2) Pub Date : 2023-11-24 Hasan Ali, Jan Rusz, Daniel E. Bürgler, Roman Adam, Claus M. Schneider, Cheuk-Wai Tai, Thomas Thersleff
Electron magnetic circular dichroism (EMCD) is a powerful technique for estimating element-specific magnetic moments of materials on nanoscale with the potential to reach atomic resolution in transmission electron microscopes. However, the fundamentally weak EMCD signal strength complicates quantification of magnetic moments, as this requires very high precision, especially in the denominator of the
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Correlating electrochemical stimulus to structural change in liquid electron microscopy videos using the structural dissimilarity metric Ultramicroscopy (IF 2.2) Pub Date : 2023-11-24 Justin T. Mulvey, Katen P. Iyer, Tomàs Ortega, Jovany G. Merham, Yevheniy Pivak, Hongyu Sun, Allon I. Hochbaum, Joseph P. Patterson
In-situ liquid cell transmission electron microscopy (LCTEM) with electrical biasing capabilities has emerged as an invaluable tool for directly imaging electrode processes with high temporal and spatial resolution. However, accurately quantifying structural changes that occur on the electrode and subsequently correlating them to the applied stimulus remains challenging. Here, we present structural
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Preface to The Twelfth International Workshop on Low Energy Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 12) Ultramicroscopy (IF 2.2) Pub Date : 2023-11-18 Michael Foerster
Abstract not available
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Improving the temporal resolution of event-based electron detectors using neural network cluster analysis Ultramicroscopy (IF 2.2) Pub Date : 2023-11-11 Alexander Schröder, Christopher Rathje, Leon van Velzen, Maurits Kelder, Sascha Schäfer
Novel event-based electron detector platforms provide an avenue to extend the temporal resolution of electron microscopy into the ultrafast domain. Here, we characterize the timing accuracy of a detector based on a TimePix3 architecture using femtosecond electron pulse trains as a reference. With a large dataset of event clusters triggered by individual incident electrons, a neural network is trained
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Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials Ultramicroscopy (IF 2.2) Pub Date : 2023-11-11 Ali Jaberi, Nicolas Brodusch, Jun Song, Raynald Gauvin
To fulfill power and energy demands, lithium-ion battery (LIB) is being considered as a promising energy storage device. For the development of LIBs, high-resolution electron microscopy characterization of battery materials is crucial. During this characterization, the interaction of beam-electrons with Li-containing materials causes damage through several processes, especially knock-on damage. In
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Accurate magnification determination for cryoEM using gold Ultramicroscopy (IF 2.2) Pub Date : 2023-11-15 Joshua L. Dickerson, Erin Leahy, Mathew J. Peet, Katerina Naydenova, Christopher J. Russo
Determining the correct magnified pixel size of single-particle cryoEM micrographs is necessary to maximize resolution and enable accurate model building. Here we describe a simple and rapid procedure for determining the absolute magnification in an electron cryomicroscope to a precision of <0.5%. We show how to use the atomic lattice spacings of crystals of thin and readily available test specimens
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Interfacial excess of solutes across phase boundaries using atom probe microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-11-11 F. Theska, S. Primig
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Momentum transfer resolved electron correlation microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-11-11 Shuoyuan Huang, Paul M Voyles
Electron correlation microscopy (ECM) characterizes local structural relaxation dynamics in fluctuating systems like supercooled liquids with nanometer spatial resolution. We have developed a new type of ECM technique that provides moderate resolution in momentum transfer or k space using five-dimensional scanning transmission electron microscopy. k-resolved ECM on a Pt57.5Cu14.7Ni5.3P22.5 metallic
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On central focusing for contrast optimization in direct electron ptychography of thick samples Ultramicroscopy (IF 2.2) Pub Date : 2023-11-03 C. Gao, C. Hofer, T.J. Pennycook
Ptychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the projected potential becomes strong for both direct and iterative inversion ptychography methods. It has recently been shown that these reversals can often be counteracted
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Optical STEM detection for scanning electron microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-10-30 Arent J. Kievits, B.H. Peter Duinkerken, Job Fermie, Ryan Lane, Ben N.G. Giepmans, Jacob P. Hoogenboom
Recent advances in electron microscopy techniques have led to a significant scale up in volumetric imaging of biological tissue. The throughput of electron microscopes, however, remains a limiting factor for the volume that can be imaged in high resolution within reasonable time. Faster detection methods will improve throughput. Here, we have characterized and benchmarked a novel detection technique
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Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples Ultramicroscopy (IF 2.2) Pub Date : 2023-11-04 James M. Parkhurst, Anna Cavalleri, Maud Dumoux, Mark Basham, Daniel Clare, C. Alistair Siebert, Gwyndaf Evans, James H. Naismith, Angus Kirkland, Jonathan W. Essex
Simulations of cryo-electron microscopy (cryo-EM) images of biological samples can be used to produce test datasets to support the development of instrumentation, methods, and software, as well as to assess data acquisition and analysis strategies. To be useful, these simulations need to be based on physically realistic models which include large volumes of amorphous ice. The gold standard model for
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Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials Ultramicroscopy (IF 2.2) Pub Date : 2023-10-25 Trushal Sardhara, Alexander Shkurmanov, Yong Li, Shan Shi, Christian J. Cyron, Roland C. Aydin, Martin Ritter
In focused ion beam (FIB) tomography, a combination of FIB with a scanning electron microscope (SEM) is used for collecting a series of planar images of the microstructure of nanoporous materials. These planar images serve as the basis for reconstructing the three-dimensional microstructure through segmentation algorithms. However, the assumption of a constant distance between consecutively imaged
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Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme Ultramicroscopy (IF 2.2) Pub Date : 2023-10-17 Florian F. Krause, Andreas Rosenauer
If quantitative scanning transmission electron microscopy is used for very precise thickness measurements with atomic resolution, it is commonly referred to as »atom counting«. Due to scattering and the finite probe extent the signal recorded in one atomic column is dependent not only on its own height but also on the height of its neighbours. Especially for thicker specimens this crosstalk effect
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Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV Ultramicroscopy (IF 2.2) Pub Date : 2023-10-22 Keita Kobayashi, Ryosuke Kizu
We evaluated the usable specimen thickness of Si for lattice imaging on a transmission electron microscopy (TEM) instrument operating at 300 kV and equipped with a complementary metal-oxide-semiconductor camera by using an original reference material (RM) and comparing the lattice images obtained from Si patterns of the RM with various thicknesses. Lattice images of the {111} planes of crystalline
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Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography Ultramicroscopy (IF 2.2) Pub Date : 2023-10-22 J. Lindner, U. Ross, T. Meyer, V. Boureau, M. Seibt, Ch. Jooss
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Optimizing experimental parameters for orbital mapping Ultramicroscopy (IF 2.2) Pub Date : 2023-10-18 Manuel Ederer, Stefan Löffler
A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital maps, can be produced. Thus, unprecedented insight into the electronic orbitals responsible for most of the electrical, magnetic and optical properties of bulk materials
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Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys Ultramicroscopy (IF 2.2) Pub Date : 2023-10-06 E. Thronsen, T. Bergh, T.I. Thorsen, E.F. Christiansen, J. Frafjord, P. Crout, A.T.J. van Helvoort, P.A. Midgley, R. Holmestad
Mapping the spatial distribution of crystal phases with nm-scale spatial resolution is an important characterisation task in studies of multi-phase materials. One popular approach is to use scanning precession electron diffraction which enables semi-automatic phase mapping at the nanoscale by collecting a single precession electron diffraction pattern at every probe position over regions spanning up
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Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology Ultramicroscopy (IF 2.2) Pub Date : 2023-10-06 Soheil Khajavi, Zahra Shaterzadeh-Yazdi, Ali Eghrari, Mohammad Neshat
Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic force microscope (AFM) tip to an optical electromagnetic (EM) field, while the tip is so close to a dielectric sample that the incident beam lies within the near-field
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Self-supervised noise modeling and sparsity guided electron tomography volumetric image denoising Ultramicroscopy (IF 2.2) Pub Date : 2023-10-05 Zhidong Yang, Dawei Zang, Hongjia Li, Zhao Zhang, Fa Zhang, Renmin Han
Cryo-Electron Tomography (cryo-ET) is a revolutionary technique for visualizing macromolecular structures in near-native states. However, the physical limitations of imaging instruments lead to cryo-ET volumetric images with very low Signal-to-Noise Ratio (SNR) with complex noise, which has a side effect on the downstream analysis of the characteristics of observed macromolecules. Additionally, existing
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Real-time electron clustering in an event-driven hybrid pixel detector Ultramicroscopy (IF 2.2) Pub Date : 2023-10-05 J. Kuttruff, J. Holder, Y. Meng, P. Baum
Event-driven hybrid pixel detectors with nanosecond time resolution have opened up novel pathways in modern ultrafast electron microscopy, for example in hyperspectral electron-energy loss spectroscopy or free-electron quantum optics. However, the impinging electrons typically excite more than one pixel of the device, and an efficient algorithm is therefore needed to convert the measured pixel hits
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The effect of nanochannel length on in situ loading times of diffusion-propelled nanoparticles in liquid cell electron microscopy Ultramicroscopy (IF 2.2) Pub Date : 2023-10-05 Peter Kunnas, Niels de Jonge, Joseph P. Patterson
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Mean inner potential of elemental crystals from density-functional theory calculations: Efficient computation and trends Ultramicroscopy (IF 2.2) Pub Date : 2023-10-04 Avi Auslender, Nivedita Pandey, Amit Kohn, Oswaldo Diéguez
The mean inner potential (V0) of crystals plays an important role in electron microscopy. In a few cases, it has been measured experimentally, using mostly electron holography; however, it is not uncommon to find reports that disagree by a few volts regarding the mean inner potential of the same material. Different levels of theory have also been used to estimate its value, often by building the crystal
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Atom counting from a combination of two ADF STEM images Ultramicroscopy (IF 2.2) Pub Date : 2023-09-23 D.G. Şentürk, C.P. Yu, A. De Backer, S. Van Aert
To understand the structure–property relationship of nanostructures, reliably quantifying parameters, such as the number of atoms along the projection direction, is important. Advanced statistical methodologies have made it possible to count the number of atoms for monotype crystalline nanoparticles from a single ADF STEM image. Recent developments enable one to simultaneously acquire multiple ADF
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Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control Ultramicroscopy (IF 2.2) Pub Date : 2023-09-22 M. Freeman, R. Applestone, W. Behn, V. Brar
We demonstrate a cryogenic scanning probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can ‘feel’ the surface of a sample under investigation. This system allows for direct tactile sensation of the atoms in and on top of a crystal, and allows the operator to perceive, by using different SPM modalities, sensations that are representative of the
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Process optimization of broad ion beam milling for preparation of coating cross-sections Ultramicroscopy (IF 2.2) Pub Date : 2023-09-22 Nils Timmermans, Mike van Meer, Remco Okhuijsen, Qi Chen
The application of Argon ion based broad ion beam milling in the preparation of coating cross-sections is systematically evaluated in this work. In order to reduce and eliminate defects and artefacts from the prepared sectional surface, the substrate side of the sample is found to be best facing the ion beams, and the milling time needs to be optimized to be not too long to introduce scratching of
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Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer Ultramicroscopy (IF 2.2) Pub Date : 2023-09-17 Mauricio J. Prieto, Lucas de Souza Caldas, Liviu C. Tănase, Thomas Schmidt, Oscar Rodríguez de la Fuente
The search of new properties in novel oxide heterostructures requires the exploration of new fabrication methods and the study, at the microscopic level, of the processes involved during the synthesis. We present a synchrotron-based spectromicroscopic investigation of a magnetite/hematite bilayer on Pt(111) grown in a two-step process by thermal evaporation and Low Energy Ion Bombardment (LEIB). The