A piezoelectric force sensor is suggested for magnetic force microscopy (MFM) purposes. Added between the piezoelectric resonator and the magnetic probe is a mechanical force amplifier in the form of a thin, long resonant arm with an integral micro-rod whereby the amplitude of the force acting on the probe is amplified by a factor of 20 to 40 at a low noise level. When the sensor was operated in air

We introduce a fast and facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible freestanding Ag nanowire attached to the tip of a typical tungsten micromanipulator inside the FIB. The main advantages of this approach are the significantly reduced stress-induced

The nanometer-scale spatial distributions of local thickness or composition of noncrystalline materials are generally measured by spectroscopy with scanning transmission electron microscopy (STEM). Since spectroscopy requires a high electron dose and causes irradiation damage, alternative non-spectroscopic methods are required to measure the local thickness or composition of electron-sensitive noncrystalline

Strain and geometric necessary dislocations (GNDs) have been mapped with nm-resolution around grain boundaries affected by stress corrosion cracking (SCC) or intergranular oxidation with the aim of clarifying which local conditions that trigger SCC initiation of Alloy 600 in primary water reactor (PWR) water environment. Regions studied included the cracked and uncracked portion of the same SCC-affected

We outline a simple routine to correct for non-uniformities in the energy dispersion of a post-column electron energy-loss spectrometer for use in scanning transmission electron microscopy. We directly measure the dispersion and its variations by sweeping a spectral feature across the full camera to produce a calibration that can be used to linearize datasets post-acquisition, without the need for

Trajectory displacement due to statistical Coulomb interactions can play a major role in determining the performance of a charged particle beam system. Accurate estimation of the trajectory displacement is thus an important part of the design procedure of such an optical system. Traditionally, there are three approaches to determine the trajectory displacement: Monte Carlo simulation, the slice method

Imaging nanoscale features using transmission electron microscopy is key to predicting and assessing the mechanical behavior of structural materials in nuclear reactors. Analyzing these micrographs is often a tedious and labour intensive manual process. It is a prime candidate for automation. Here, a region-based convolutional neural network is adapted to detect helium bubbles in micrographs of neutron-irradiated

We describe a new approach for preparing organic-inorganic perovskite solar cells for electron beam-induced current (EBIC) measurements in plan-view geometry. This method substantially reduces sample preparation artefacts, provides good electrical contact and keeps the preparation steps as close as possible to those for real devices. Our EBIC images were acquired simultaneously with annular dark-field

Electron beams can acquire designed phase modulations by passing through nanostructured material phase plates. These phase modulations enable electron wavefront shaping and benefit electron microscopy, spectroscopy, lithography, and interferometry. However, in the fabrication of electron phase plates, the typically used focused-ion-beam-milling method limits the fabrication throughput and hence the

Three-dimensional (3D) micro- and nanostructural characterization using scanning electron microscope (SEM) and electron–solid interaction simulations (ESIS) has attracted broad interest in various research fields. However, 3D SEM-ESIS still faces key challenges in characterizing and modelling complex microstructures. In this paper, a new grid-based simulation scheme is developed to enable ESIS of complex

We characterize a hybrid pixel direct detector and demonstrate its suitability for electron energy loss spectroscopy (EELS). The detector has a large dynamic range, narrow point spread function, detective quantum efficiency ≥ 0.8 even without single electron arrival discrimination, and it is resilient to radiation damage. It is capable of detecting ∼5 × 106 electrons/pixel/second, allowing it to accommodate

Large area electron microscopy (EM) imaging has long been difficult due to fundamental limits in throughput for conventional electron microscopes. New developments in transmission electron microscopy and multi-beam scanning electron microscopy (MBSEM) imaging have however made it possible to generate large EM datasets [1, 2, 3]. This article describes a transmission imaging technique that is suitable

We present options for visualizing contrast maps in 3D ion transmission experiments. Simultaneous measurement of angular distributions and flight time of ions transmitted through self-supporting, single-crystalline silicon foils allows for mapping of intensity and different energy loss moments. The transmitted projectiles were detected mainly for random beam-sample orientation using pulsed beams of

Reducing ion beam damage from the focused ion beam (FIB) during fabrication of cross sections is a well-known challenge for materials characterization, especially cross sectional characterization of nanostructures. To address this, a new method has been developed for cross section fabrication enabling high resolution transmission electron microscopy (TEM) analysis of 3-D nanostructures free of surrounding

Local electromagnetic fields in a specimen is measured at high spatial resolutions using differential phase contrast (DPC) imaging in scanning transmission electron microscopy (STEM). According to previous studies, DPC signals can be quantified by measuring the center of mass of the diffraction pattern intensity and/or performing a deconvolution method based on a phase contrast transfer function (PCTF)

Analysis of metal-organic framework (MOF) structure by electron microscopy and electron diffraction offers an alternative to growing large single crystals for high-resolution X-ray diffraction. However, many MOFs are electron beam-sensitive, which can make structural analysis using high-resolution electron microscopy difficult. In this work we use the microcrystal electron diffraction (MicroED) method

In electron microscopy, the maximum a posteriori (MAP) probability rule has been introduced as a tool to determine the most probable atomic structure from high-resolution annular dark-field (ADF) scanning transmission electron microscopy (STEM) images exhibiting low contrast-to-noise ratio (CNR). Besides ADF imaging, STEM can also be applied in the annular bright-field (ABF) regime. The ABF STEM mode

Scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS) has become a standard technique to map localized surface plasmon resonances with a nanometer spatial and a sufficient energy resolution over the last 15 years. However, no experimental work discussing the influence of experimental conditions during the measurement has been published up to now. We

Coherent modulation imaging (CMI) has been shown to be an effective lensless diffraction approach to imaging general extended samples with fast algorithmic convergence and high robustness to data imperfection. In the reported phasing algorithms of CMI, an exact knowledge of modulator is used as a priori. Extra characterization of the modulator is thus required before the CMI experiments are conducted

The thickness of an object will, at some point, exceed the depth of field of a transmission electron microscope; the value at which this occurs, depends on the resolution and the wavelength considered. An image is then no longer a true projection of the 3D structure. This effect will be expressed in the power spectrum. Here, we first demonstrate this phenomenon experimentally, using carbon foils of

Abbe theory of image formation can be expanded from two-dimensional to three-dimensional space. It has to consider an optical system that forms an image of a grating in an object space. It is possible to introduce various inclinations of this grating relatively the optical axis round the axis in the object plane that is parallel to its slits. In this case, the minimum resolvable period and the corresponded

Friedel's law guarantees an inversion-symmetric diffraction pattern for thin, light materials where a kinematic approximation or a single-scattering model holds. Typically, breaking Friedel symmetry is ascribed to multiple scattering events within thick, non-centrosymmetric crystals. However, two-dimensional (2D) materials such as a single monolayer of MoS2 can also violate Friedel's law, with unexpected

This report covers the main aspects of designing a vector potential photoelectron microscope (VPPEM). While the VPPEM is straightforward in concept, there are several areas where the optimum configuration of the optics is not immediately obvious, and compromises must be made to make a practical instrument. This report summarizes our instrumental setups, and some basic design issues.

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary

Convergent beam electron diffraction (CBED) patterns of twisted bilayer samples exhibit interference patterns in their CBED spots. Such interference patterns can be treated as off-axis holograms and the phase of the scattered waves, and hence the interlayer distance can be reconstructed. A detail protocol of the reconstruction procedure is provided. In addition, we derived an exact formula for reconstructing

Scanning ion conductance microscopy (SICM), as an emerging non-contact in situ topography measurement tool with nano resolution, has been increasingly used in recent years in biomedicine, electrochemistry and materials science. In the conventional measurement method of SICM, the sample topography is constructed according to the position of the probe at the feedback threshold of the ion current. Nevertheless

Spin Polarized Low Energy Electron Microscopy (SPLEEM) is a powerful tool to reveal the magnetic structure of ferromagnetic surfaces on the atomic depth scale level[1-3]. With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration

STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a programmable scan engine that allows to arbitrarily set the sequence of probe positions that are consecutively visited on the sample. We compare the typical raster scan with a so-called ‘snake’ pattern where the scan direction

Atom probe tomography (APT) can theoretically deliver accurate chemical and isotopic analyses at a high level of sensitivity, precision, and spatial resolution. However, empirical APT data often contain significant biases that lead to erroneous chemical concentration and isotopic abundance measurements. The present study explores the accuracy of quantitative isotopic analyses performed via atom probe

Nonmetallic heteroatoms found in carbon nanomaterials act as active sites and exhibit excellent catalytic performance. Owing to structural complexity and the limitations of characterization technology, the identification of active sites in nanocarbon is challenging and controversial. Electron energy-loss spectroscopy is an electron microscope technique with high spatial resolution and a powerful tool

Identification of mass-spectrum peaks is an indispensable step of an atom-probe tomography reconstruction process and can be a time-consuming procedure, vulnerable to errors, if performed manually. We propose a Bayesian approach to the peak identification problem, based on ranking of candidate ions according to their calculated posterior probabilities. The sample model is reconstructed by iteratively

X-ray tomographic reconstruction typically uses voxel basis functions to represent volumetric images. Due to the structure in voxel basis representations, efficient ray-tracing methods exist allowing fast, GPU accelerated implementations. Tetrahedral mesh basis functions are a valuable alternative to voxel based image representations as they provide flexible, inhomogeneous partitions which can be used

Recent developments in pixelated detectors, when combined with aberration correction of probe forming optics have greatly enhanced the field of scanning electron diffraction. Differential phase contrast is now routine and deep learning has been proposed as a method to extract maximum information from diffraction patterns. This work examines the effects of temporal and spatial incoherence on convergent

In this study, a novel artificial intelligence-based approach is presented to directly estimate the surface topography. To this aim, performance of different artificial intelligence-based techniques, including the multi-layer perceptron neural, radial basis function neural, and adaptive neural fuzzy inference system networks, in estimation of the sample topography is investigated. The results demonstrate

The technique of atom probe tomography is often used to image solute clusters and solute atom segregation to dislocation lines in structural alloys. Quantitative analysis, however, remains a common challenge. To address this gap, we combined a cluster finding algorithm, a skeleton finder algorithm, and morphological classification of dense objects to distinguish solute clusters from solute-decorated

During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques are

We present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small magnetic fields. The sample is placed on a platelet

Recent advancements in the energy resolution and probing capabilities of monochromated electron-beam spectroscopy instruments have made this experimental technique increasingly useful for investigating and understanding the plasmonic, photonic, and electronic properties of graphene-enhanced systems. We develop herein an empirical model for the in-plane conductivity of doped monolayer graphene, comparing

Coherent modulation imaging (CMI) has been shown to be an effective lensless diffraction approach to imaging general extended samples with fast algorithmic convergence and high robustness to data imperfection. Being a single-shot technique, CMI holds a high potential for imaging dynamics with ultrafast pulses like the ones from free-electron lasers. In the reported work, strong modulators have been

Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cˇerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation

This paper presents a new analytical method to determine interface normals from a series of bright/dark field images taken from arbitrary orientations. This approach, based on a general geometrical model of interface projection, provides a generalized formulation of existing methods. It can treat an excessive number of inputs, i.e. orientation conditions. Given 6 or more sets of inputs, even with considerable

The spatial resolution of microscopic images acquired via X-ray Fourier-transform holography is limited by the source size of the reference wave and by the numerical aperture of the detector. We analyze the interplay between both influences and show how they are matched in practice. We further identify, how high spatial frequencies translate to imaging artifacts in holographic reconstructions where

In an atomic force microscope (AFM) system, the measurement accuracy in the scan images is determined by the displacement accuracy of piezo scanner. The hysteresis model of piezo scanner displacement is complex and difficult to correct, which is the main reason why the output displacement of the piezo scanner does not have high precision. In this study, an image pixel hysteresis model of the piezo

Here we describe the first automated fully integrated in-microscope broad ion beam (BIB) system. Ar+-BIB has several advantages over Ga+ focused ion beam (FIB) and Xe+ plasma-FIB (PFIB) methods inducing less beam damage, especially for ion beam sensitive materials. It can mill areas several orders of magnitude larger (up to millimetre scale), and is not confined to the edge of the sample with associated

Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating samples in laser-pulsed atom probe microscopy. The technique leverages the self-similarity of atom probe mass spectra collected at different times

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature for many imaging modalities, but only a few attempts handled 3D data such as spectral images acquired by STEM electron energy loss spectroscopy (EELS). Besides

Understanding defects and their roles in plastic deformation and device reliability is important for the development of a wide range of novel materials for the next generation of electronic and optoelectronic devices. We introduce the use of gaseous secondary electron detectors in a variable pressure scanning electron microscope for non-destructive imaging of extended defects using electron channelling

An atomic force microscopy generally adopts a raster scanning method to obtain the image of the sample morphology. However, the raster method takes too much time on the base part without focusing enough on the object, thereby restricting the scanning speed of an AFM. To solve this problem, this paper proposes a novel path planning based scanning method to achieve high-speed scanning with super resolution

In many materials systems, such as catalytic nanoparticles, the ability to characterize dynamic atomic structural changes is important for developing a more fundamental understanding of functionality. Recent developments in direct electron detection now allow image series to be acquired at frame rates on the order of 1000 frames per second in bright-field transmission electron microscopy (BF TEM),

Calculations of quantum trajectories associated to a propagated wave function provide new insight into quantum processes such as particle scattering and diffraction. Here, hydrodynamic calculations of electron beam imaging under conditions comparable to those of a transmission electron microscope display the mechanisms behind different commonly investigated diffraction conditions. The Bloch wave method

Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED can be applied for imaging two-dimensional (2D) crystals where a direct reconstruction is possible and three-dimensional crystal deformations at a nanometre resolution

Probing the dynamic magnetic domain of permanent magnet materials under an external AC magnetic field using magnetic force microscopy is challenging as well as important to reveal their pinning sites and local magnetization processes. In this work, we develop alternating magnetic force microscopy (A-MFM) with a Co-GdOx superparamagnetic tip for observing the dynamic magnetic domain wall (DW) motion

We report on the construction and performance of the first hybrid resistive-superconducting magnet (HM) based scanning tunnelling microscope (STM) above 30 T. This custom-design HM-STM features a novel design of the STM head unit, whose tip-sample approach is implemented using a slender piezoelectric tube (PZT). The scanner shares part of PZT by fixing a sapphire frame onto the front quarter of PZT