In many materials systems, such as catalytic nanoparticles, the ability to characterize dynamic atomic structural changes is important for developing a more fundamental understanding of functionality. Recent developments in direct electron detection now allow image series to be acquired at frame rates on the order of 1000 frames per second in bright-field transmission electron microscopy (BF TEM),

Calculations of quantum trajectories associated to a propagated wave function provide new insight into quantum processes such as particle scattering and diffraction. Here, hydrodynamic calculations of electron beam imaging under conditions comparable to those of a transmission electron microscope display the mechanisms behind different commonly investigated diffraction conditions. The Bloch wave method

Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED can be applied for imaging two-dimensional (2D) crystals where a direct reconstruction is possible and three-dimensional crystal deformations at a nanometre resolution

Probing the dynamic magnetic domain of permanent magnet materials under an external AC magnetic field using magnetic force microscopy is challenging as well as important to reveal their pinning sites and local magnetization processes. In this work, we develop alternating magnetic force microscopy (A-MFM) with a Co-GdOx superparamagnetic tip for observing the dynamic magnetic domain wall (DW) motion

We report on the construction and performance of the first hybrid resistive-superconducting magnet (HM) based scanning tunnelling microscope (STM) above 30 T. This custom-design HM-STM features a novel design of the STM head unit, whose tip-sample approach is implemented using a slender piezoelectric tube (PZT). The scanner shares part of PZT by fixing a sapphire frame onto the front quarter of PZT

In recent years, aberration correction has slowly become standard in high-end conventional transmission electron microscopy (50-200kV). However, the integration of correctors to low voltage transmission systems (5-25kV) has proved to be difficult. The hexapole corrector based on permanent magnet technology seems to be a promising solution for the correction of the primary spherical aberration. Especially

Magnetic skyrmions are promising candidates for future storage devices with a large data density. A great variety of materials have been found that host skyrmions up to the room-temperature regime. Lorentz microscopy, usually performed in a transmission electron microscope (TEM), is one of the most important tools for characterizing skyrmion samples in real space. Using numerical calculations, this

This contribution demonstrates experimentally how a series of annular dark-field transmission images collected in a scanning electron microscope (SEM) with a basic solid-state detector can be used to quantify electron scattering distributions (i.e., diffraction patterns). The technique is demonstrated at different primary electron energies with a polycrystalline aluminum sample and two amorphous samples

Inelastic mean free path (IMFP) was determined by electron energy loss spectroscopy (EELS) to estimate the accurate thickness of TEM thin foil using needle-shaped specimen. From EELS measurements performed for 99.99% Al, Si wafer and 99.99% Fe, linear relationships were confirmed between the thickness of the TEM thin foil and the ratio of the total intensity of EELS spectrum to the total intensity

Bimodal atomic force microscopy (AFM) is an important branch of multi-frequency AFM, which can simultaneously obtain the surface morphology and properties of samples. However, the atomic-scale phenomena in the vibration process of bimodal AFM have not been observed due to the absence of atomic-scale model. In this paper, the molecular dynamics (MD) simulations are used to model bimodal AFM. A double

We describe the use of a cross-shaped platinum marker deposited using electron-beam-induced deposition (EBID) in a focused ion beam - scanning electron microscope (FIB-SEM) system to facilitate site-specific preparation of a TEM foil containing a trench defect in an InGaN/GaN multiple quantum well structure. The defect feature is less than 100 nm wide at the surface. The marker is deposited prior to

Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while

Helium ion beam induced deposition (HIBID) is an attractive technique capable of precise fabrication of nanostructures. However, the damage caused by helium ion irradiation is the major drawback of conventional HIBID. In this study, area-selective atomic layer deposition (ALD) accompanied with the HIBID technique is explored to solve this problem. A platinum (Pt) seed layer was prepared by HIBID with

When using an electron microscope for imaging of particles embedded in vitreous ice, the recorded image, or micrograph, is a significantly degraded version of the tomographic projection of the sample. Apart from noise, the image is affected by the optical configuration of the microscope. This transformation is typically modeled as a convolution with a point spread function. The Fourier transform of

We present a morphological analysis of atom probe data of nanoscale microstructural features, using methods developed by the astrophysics community to describe the shape of superclusters of galaxies. We describe second-phase regions using Minkowski functionals, representing the regions' volume, surface area, mean curvature and Euler characteristic. The alloy data in this work show microstructures that

We present a complex analysis and optimisation of dynamic conditions in the environmental scanning electron microscope (ESEM) to allow in-situ observation of extremely delicate wet bio-polymeric spherical particles in their native state. According to the results of gas flow and heat transfer simulations, we were able to develop an improved procedure leading to thermodynamic equilibrium between the

Electron crystallography has focused in the last few years on the analyses of microcrystals, mainly organic compounds, triggered by recent publications on acquisition methods based on direct detection cameras and continuous stage tilting. However, the main capability of a transmission electron microscope is the access to features at the nanometre scale. In this context, a new acquisition method, called

Focused ion beam microscopy suffers from source shot noise – random variation in the number of incident ions in any fixed dwell time – along with random variation in the number of detected secondary electrons per incident ion. This multiplicity of sources of randomness increases the variance of the measurements and thus worsens the trade-off between incident ion dose and image accuracy. Repeated measurement

Multiple Sclerosis (MS) is a chronic inflammatory disorder in the central nervous system for which biomarkers for diagnosis still remain unknown. One potential biomarker is the myelin basic protein. Here, a nanoimmunosensor based on atomic force spectroscopy (AFS) successfully detected autoantibodies against the MBP85-99 peptide from myelin basic protein. The nanoimmunosensor consisted of an atomic

Annealed metastable β titanium (Ti) alloys comprise body-centred-cubic β and hexagonal-close-packed α phases and possibly, orthorhombic α″ martensite that forms on quenching or deformation. Electron backscattering diffraction is amongst the most popular methods for characterising such multi-phase microstructures. However, the crystallographic similarity between α and α″ martensite renders unambiguous

The ability to repeatedly find exact the same nano region-of-interest (nROI) is essential for atomic force microscopy (AFM) studies of heterogeneous environmental samples. The large variety of methods makes it difficult to find the most suitable one for a specific research question. We thus conducted a literature research for nROI relocation methods and organized the found references in order to give

Direct electron detectors (DeDs) have been widely used for imaging studies because of their higher beam sensitivity, lower noise, improved pixel resolution, etc. However, there have been limited studies related to the performance in spectroscopic applications for the direct electron detection. Hereby, taking the advantage of the DeD installed on a high-performance electron energy-loss spectrometer

Tilting crystals to proper zone axes is a necessary but tedious work in taking selected area electron diffraction patterns (SAED) and high-resolution images using transmission electron microscope (TEM). This process not only costs a lot of time but also limits the application of TEM in electron-beam sensitive materials. Therefore, it is desirable to develop a simple method for tilting crystals from

Electrostatic beam blankers are an alternative to photo-emission sources for generating pulsed electron beams for Time-resolved Cathodoluminescence and Ultrafast Electron Microscopy. While the properties of beam blankers have been extensively investigated in the past for applications in lithography, characteristics such as the influence of blanking on imaging resolution have not been fully addressed

Nowadays electron channeling contrast imaging (ECCI) is widely used to characterize crystalline defects on blanket semiconductors. Its further application in the semiconductor industry is however challenged by the emerging rise of nanoscale 3D heterostructures. In this study, an angular multi-segment detector is utilized in backscatter geometry to investigate the application of ECCI to the defect analysis

In this paper, a novel scheme based on the differential algebraic (DA) method is proposed to analyze the electron optics properties of the Wien filters. A new software package is then developed, to compute the geometrical and chromatic aberrations up to the fifth order of the Wien filters. For examples, the aberrations of single filter and the double filters are calculated. The calculated geometrical

Off-axis electron holography and first moment STEM are sensitive to electromagnetic potentials or fields, respectively. In this work, we investigate in what sense the results obtained from both techniques are equivalent and work out the major differences. The analysis is focused on electrostatic (Coulomb) potentials at atomic spatial resolution. It is shown that the probe-forming/objective aperture

High resolution electron backscatter diffraction (HREBSD), an SEM-based diffraction technique, may be used to measure the lattice distortion of a crystalline material and to infer the geometrically necessary dislocation content. Uncertainty in the image correlation process used to compare diffraction patterns leads to an uneven distribution of measurement noise in terms of the lattice distortion, which

This work presents the study of morphology and thermal properties of thin ZnO films fabricated by atomic layer deposition. The layers were deposited on n-Si(100) wafers at 200 °C. X-ray diffraction measurements showed the polycrystalline structure of the thin films with preferred (100) orientation. The thinner ZnO layers were fine grained, while the thicker films were formed with larger, elongated

In this study, an annular multi-segment backscattered electron (BSE) detector is used in back scatter geometry to investigate the influence of the angular distribution of BSE on the crystalline defect contrast in electron channeling contrast imaging (ECCI). The study is carried out on GaAs and Ge layers epitaxially grown on top of silicon (Si) substrates, respectively. The influence of the BSE detection

Two types of convolutional neural network (CNN) models, a discrete classification network and a continuous regression network, were trained to determine local sample thickness from convergent beam diffraction (CBED) patterns of SrTiO3 collected in a scanning transmission electron microscope (STEM) at atomic column resolution. Acquisition of atomic resolution CBED patterns for this purpose requires

With the objective of applying laser-assisted atom probe tomography to compositional analysis within nanoscale InGaAs devices, experimental conditions that may provide an accurate composition estimate were sought by extensively studying an InGaAs blanket film. Overall, the determined arsenic atomic fraction was found to exhibit an electric field dependent deficiency, which was more pronounced at low

Detector developments are currently enabling new capabilities in the field of transmission electron microscopy (TEM). We have investigated the limits of a hybrid pixel detector, Medipix3, to record dynamic, time varying, electron signals. Operating with an energy of 60 keV, we have utilised electrostatic deflection to oscillate electron beam position on the detector. Adopting a pump-probe imaging strategy

An approach for producing ultrahigh spatial resolution selected area electron channeling patterns (UHR-SACPs) using the FEI/Thermo Elstar electron column is presented. The approach uses free lens control to directly assign lens and deflector values to rock the beam about precise points on the sample surface and generate the UHR-SACPs. Modification of the lens parameters is done using a service application

Atomic force microscopy has a tremendous number of applications in a wide variety of fields, particularly in the semiconductor area for the 3D-stacked device. Imaging three-dimensional (3D) structures with blind features has progressively become a critical technique. Recently, a 3D-atomic force microscopy (AFM) technique has been proposed to image 3D features, especially those having sharp apices,

For many complex materials systems, low-energy electron microscopy (LEEM) offers detailed insights into morphology and crystallography by naturally combining real-space and reciprocal-space information. Its unique strength, however, is that all measurements can easily be performed energy-dependently. Consequently, one should treat LEEM measurements as multi-dimensional, spectroscopic datasets rather

Lithium-rich cathodes can store excess charge beyond the transition metal redox capacity by participation of oxygen in reversible anionic redox reactions. Although these processes are crucial for achieving high energy densities, their structural origins are not yet fully understood. Here, we explore the use of annular bright-field (ABF) imaging in scanning transmission electron microscopy (STEM) to

The evolution of the scanning modules for scanning transmission electron microscopes (STEM) allows now to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron dose effects. In this work, we present the implementation of a random scan operating mode in STEM achieved at the hardware level via a custom scan control module. A pre-defined pattern

A new band-pass energy filter (BPF) technique of secondary electron (SE) detection using scanning electron microscope (SEM) was developed to enhance voltage contrast (VC) in SEM images. The energy filtering condition was optimized to enhance VC of dopant distribution using Si p-n structure. The relation between VC and SE energy was investigated by BPF as well as a conventional high-pass filter (HPF)

Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the diffracted

Force-clamp spectroscopy can mimic the physiological conditions for the proteins under investigation. In addition, it is a direct way of observing the relationship between bond lifetime and molecular forces. However, traditional force-clamp methods rely on active feedback controllers that can introduce artefacts. In this work, we introduce a new method to enable force-clamp spectroscopy without a need

A new design scheme for ultrafast transmission electron microscopy (UTEM) has been developed based on a Schottky-type field emission gun (FEG) at the Institute of Physics, Chinese Academy of Sciences (IOP CAS). In this UTEM setup, electron pulse emission is achieved by integrating a laser port between the electron gun and the column and the resulting microscope can operate in either continuous or pulsed

We present progress toward the quantitative interpretation of phase contrast images obtained using a hole-free phase plate (HFPP) in a transmission electron microscope (TEM). We consider a sinusoidal phase grating test object composed of ~5 nm deep groves in a ~13 nm thick amorphous silicon membrane. The periodic grating splits the beam current into direct beam and diffracted side beams in the focal

Over recent years, the advent of microelectromechanical system (MEMS)-type microheaters has pushed the limits of temperature controlled in situ transmission electron microscopy (TEM). In particular, by enabling the observation of the structure of materials in their application environments, temperature controlled TEM provides unprecedented insights into the link between the properties of materials

Long-period patterns (LPPs) are widely observed by transmission electron microscopy (TEM) in the study of nanoscale materials. Identifying the origin of LPPs is of significant importance when interpreting TEM images, and for an in-depth understanding of material characteristics. However, the two most common LPP categories, modulated structure and moiré patterns, are not easily differentiated by conventional

Relating a crystal's microscopic structure-such as orientation and size-to a material's macroscopic properties is of great importance in materials science. Although most crystal orientation microscopy is performed in the scanning electron microscope (SEM), transmission electron microscopy (TEM)-based methods have a number of benefits, including higher spatial resolution. Current TEM orientation methods

A retarding field energy analyzer (RFEA) for measuring the energy distribution of charged particles offers the advantages of a simple structure and suitability for simultaneous observations of beam patterns in two dimensions. In this study, lens-based RFEAs without a grid electrode were theoretically investigated with regard to the geometry and lens condition to achieve high performance. The simulation

Cryo-electron microscopy (cryo-EM) has become the method of choice in the field of structural biology, owing to its unique ability to deduce structures of vitreous ice-embedded, hydrated biomolecules over a wide range of structural resolutions. As cryo-transmission electron microscopes (cryo-TEM) become increasingly specialised for high, near-atomic resolution studies, operational complexity and associated

A multi-modal and multi-scale non-local means (M3S-NLM) method is proposed to extract atomically resolved spectroscopic maps from low signal-to-noise (SNR) datasets recorded with a transmission electron microscope. This method improves upon previously tested denoising techniques as it takes into account the correlation between the dark-field signal recorded simultaneously with the spectroscopic dataset

Automated image recognition and analysis techniques were combined with liquid cell transmission electron microscopy to explore the oxidation kinetics of nanocrystalline Fe thin films in a water vapor environment. From in situ microscopy experiments, localized oxidation was observed to initiate in the film then propagate in an unsteady fashion, alternatingly arresting and progressing. The oxidation