Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals†,Chemical Communications

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Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals†
Chemical Communications ( IF 4.9 ) Pub Date : 2018-12-14 00:00:00 , DOI: 10.1039/c8cc07912a
Teng Li _{1,

2,

3,

4} , Frank Krumeich _{1,

2,

3,

4} , Johannes Ihli _{4,

5,

6} , Zhiqiang Ma _{1,

2,

3,

4} , Takashi Ishikawa _{4,

5,

6} , Ana B. Pinar _{4,

5,

6} , Jeroen A. van Bokhoven _{1,

2,

3,

4,

5}

Affiliation

Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.

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