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(Multi)functional Atomic Force Microscopy Imaging
Annual Review of Analytical Chemistry ( IF 8 ) Pub Date : 2018-06-12 00:00:00 , DOI: 10.1146/annurev-anchem-061417-125716
Anisha N. Patel 1 , Christine Kranz 1
Affiliation  

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

中文翻译:


(多功能)原子力显微镜成像

将功能集成到原子力显微镜(AFM)中以获得物理和化学信息一直是AFM研究的重点。用特定分子修饰AFM探针可以通过特定的反应和相互作用获得化学信息。对具有较高空间分辨率的固/液界面处的分子过程的基本了解对于许多新兴研究领域至关重要。纳米级电化学成像已成为先进AFM技术的补充技术,可提供有关电化学界面过程的信息。尽管本综述简要介绍了高级AFM成像模式,例如多参数AFM和形貌识别成像,但本文的主要重点是通过混合AFM扫描电化学显微镜进行的电化学成像。

更新日期:2018-06-12
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