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A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2019-12-01 , DOI: 10.1063/1.5116717
P Szypryt 1 , G C O'Neil 1 , E Takacs 2 , J N Tan 2 , S W Buechele 2 , A S Naing 2 , D A Bennett 1 , W B Doriese 1 , M Durkin 1 , J W Fowler 1 , J D Gard 3 , G C Hilton 1 , K M Morgan 1 , C D Reintsema 1 , D R Schmidt 1 , D S Swetz 1 , J N Ullom 1 , Yu Ralchenko 2
Affiliation  

We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high x-ray collection efficiency and resolving power. NETS utilizes 192 individual TES x-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ∼30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the x-ray energies from roughly 500 eV to 8000 eV and achieve an energy resolution of 3.7 eV-5.0 eV over this range, a more modest (<2×) improvement over the previous microcalorimeters. Beyond this energy range, NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into x-ray spectra, a process that will be the basis for analyzing future data.

中文翻译:

美国国家标准与技术研究院电子束离子阱中用于研究高电荷离子的基于过渡边缘传感器的 X 射线光谱仪

我们报告了美国国家标准与技术研究院 (NIST) 电子束离子阱 (EBIT) 的过渡边缘传感器 (TES) X 射线光谱仪的设计、调试和初始测量。在过去的几十年里,NIST EBIT 在原子物理学、等离子体光谱学和实验室天体物理学等不同领域对高电荷离子进行了大量研究。新委托的 NIST EBIT TES 光谱仪 (NETS) 通过结合高 X 射线收集效率和分辨能力提高了 EBIT 的测量能力。NETS 使用 192 个单独的 TES X 射线微量热计(166/192 产率)将收集区域提高了约 30 倍,比之前在 NIST EBIT 使用的 4 像素中子嬗变掺杂锗基微量热计光谱仪。NETS 微量热仪针对大约 500 eV 到 8000 eV 的 X 射线能量进行了优化,并在此范围内实现了 3.7 eV-5.0 eV 的能量分辨率,与以前的微量热仪相比有更适度的 (<2 倍) 改进。在这个能量范围之外,NETS 可以进行各种权衡,其中最重要的是在较低能量下的效率降低,并且仅限于较高能量下的像素子集。作为 NETS 功能的初步演示,我们测量了类 He 和类 H O、Ne 和 Ar 以及类 Ni W 的跃迁。我们详细介绍了用于将探测器计数转换为的能量校准和数据分析技术X 射线光谱,这一过程将成为分析未​​来数据的基础。
更新日期:2019-12-01
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