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High order aberrations calculations of Wien filters using differential algebra methods
Ultramicroscopy ( IF 2.2 ) Pub Date : 2020-03-01 , DOI: 10.1016/j.ultramic.2019.112924
Yongfeng Kang 1 , Hangfeng Hu 1 , Jingyi Zhao 1
Affiliation  

In this paper, a novel scheme based on the differential algebraic (DA) method is proposed to analyze the electron optics properties of the Wien filters. A new software package is then developed, to compute the geometrical and chromatic aberrations up to the fifth order of the Wien filters. For examples, the aberrations of single filter and the double filters are calculated. The calculated geometrical aberration coefficients are comparable with the counterpart calculated by Tang's theory. However, both theories can only match with each other in the calculation of the chromatic aberration coefficient when the dispersion ray is taken into consideration in Tang's theory.

中文翻译:

用微分代数方法计算维恩滤波器的高阶像差

在本文中,提出了一种基于微分代数 (DA) 方法的新方案来分析维恩滤波器的电子光学特性。然后开发了一个新的软件包,用于计算高达维恩滤波器五阶的几何和色差。例如计算单滤镜和双滤镜的像差。计算出的几何像差系数与唐氏理论计算出的几何像差系数相当。然而,两种理论只有在唐的理论中考虑了色散光线时,才能在色差系数的计算上相互匹配。
更新日期:2020-03-01
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