Dislocations are crystal defects responsible for plastic deformation, and understanding their behavior is key to the design of materials with better properties. Electron microscopy has been widely used to characterize dislocations, but the resulting images are only two-dimensional projections of the real defects. The current work introduces a framework to determine the sample and crystal orientations from micrographs with planar deformation features (twins, stacking faults, and slip bands) in three or four non-coplanar slip systems of an fcc material. This is then extended into a methodology for the three-dimensional reconstruction of dislocations lying on planes with a known orientation that can be easily coupled with a standard Burgers vector analysis, as proved here in a nickel-based superalloy. This technique can only be used in materials that show specific deformation conditions, but it is faster than other alternatives as it relies on the manual tracing of dislocations in a single micrograph.

中文翻译：

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单电子显微照片对平面变形特征的三维重建

位错是导致塑性变形的晶体缺陷，而了解其行为是设计性能更好的材料的关键。电子显微镜已被广泛用于表征位错，但所得图像仅是真实缺陷的二维投影。当前的工作介绍了一个框架，该框架可从fcc材料的三个或四个非共面滑移系统中具有平面变形特征（孪生，堆垛层错和滑移带）的显微照片中确定样品和晶体的方向。然后将其扩展为一种用于三维重建位错平面上的方法的方法，该平面具有已知方向，可以轻松地与标准Burgers矢量分析相结合，如本文在镍基高温合金中所证明的。