The high conductivity of initially solvent-doped poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) thin films is reduced unexpectedly upon immersion in sulfuric acid, forming a new morphology type introduced as a “patchy” grain morphology. Correlating the intra-grain structural parameters and grain morphology via spectroscopy and atomic force microscopy quantification and using a comprehensive 3D crystalline structural model, it is revealed that the slow PEDOT interchain charge transport, dictated by the π–π stacking distance and abundance within each grain, is the primary factor controlling the overall conductivity, while the grain morphology has a weaker influence.

中文翻译：

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PEDOT：PSS薄膜在溶剂掺杂和硫酸后处理中因异常导电行为而暴露的导电性的关键机理

最初被溶剂掺杂的聚（3,4-乙撑二氧噻吩）：聚（苯乙烯磺酸盐）（PEDOT：PSS）薄膜的高电导率在浸入硫酸后意外降低，形成了一种新的形态类型，称为“斑片状”晶粒形态学。通过光谱学和原子力显微镜定量，并使用全面的3D晶体结构模型，将晶粒内的结构参数和晶粒形态相关联，揭示了缓慢的PEDOT链间电荷传输，由每个晶粒内的π-π堆积距离和丰度决定是控制总电导率的主要因素，而晶粒形态的影响较小。