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Design and performance enhancement of doping-less field effect transistor with the help of negative capacitance technique
Applied Physics A ( IF 2.7 ) Pub Date : 2019-12-17 , DOI: 10.1007/s00339-019-3229-x
Lubna Gajal , Naveen Kumar , S. Intekhab Amin , Sunny Anand

The performance exploration of doping-less negative capacitance FET (NC-FET) has been proposed for the novelty of an exceedingly low power consumption device. A ferroelectric material, PZT (lead zirconate titanate), has been used as a gate insulator to perceive the effects of negative capacitance, and thus doping-less FET is modified into doping-less NC-FET for low power consumption. Ferroelectric materials are similar to dielectric material except for the property of polarization, and PZT gives adequate polarization rate with high dielectric capacitance and better reliability. In this pursuit, hysteresis behavior depends on the thickness of PZT (tFE) therefore suitable tuning of ferroelectric thickness is an important design parameter to optimize the device performance to achieve lower subthreshold swing (SS < 60 mV) at lower threshold voltage for the proposed doping-less NC-FET device. In addition, the thickness of PZT is varied for further improvement where it shows higher tFE values improve the hysteretic behavior and augmented value of PZT thickness preserve the device in a non-hysteretic mode which is responsible for the absolute improvement in this proposed device. After tFE = 6.23 × 10−5 cm, the operation of the proposed device drives the hysteretic mode. In this context, the electrical properties of the device have been inspected to demonstrate the hysteretic and non-hysteretic action.

中文翻译:

负电容技术的低掺杂场效应晶体管设计与性能提升

无掺杂负电容 FET (NC-FET) 的性能探索已被提议用于极低功耗器件的新颖性。铁电材料 PZT(锆钛酸铅)已被用作栅极绝缘体以感知负电容的影响,因此将无掺杂 FET 修改为无掺杂 NC-FET 以降低功耗。除了极化特性外,铁电材料与介电材料相似,PZT 提供足够的极化率,具有高介电电容和更好的可靠性。在这种追求中,滞后行为取决于 PZT (tFE) 的厚度,因此适当调整铁电体厚度是优化器件性能以实现较低亚阈值摆幅 (SS < 60 mV) 在较低阈值电压下用于建议的无掺杂 NC-FET 器件。此外,为了进一步改进,PZT 的厚度会发生变化,其中显示更高的 tFE 值改善了滞后行为,而 PZT 厚度的增加值将器件保持在非滞后模式,这是该器件绝对改进的原因。在 tFE = 6.23 × 10−5 cm 之后,所提出的器件的操作会驱动迟滞模式。在这种情况下,已检查设备的电气特性以证明滞后和非滞后作用。PZT 的厚度为进一步改进而变化,其中显示更高的 tFE 值改善了滞后行为,而 PZT 厚度的增加值将器件保持在非滞后模式,这是该器件绝对改进的原因。在 tFE = 6.23 × 10−5 cm 之后,所提出的器件的操作会驱动迟滞模式。在这种情况下,已检查设备的电气特性以证明滞后和非滞后作用。PZT 的厚度为进一步改进而变化,其中显示更高的 tFE 值改善了滞后行为,而 PZT 厚度的增加值将器件保持在非滞后模式,这是该器件绝对改进的原因。在 tFE = 6.23 × 10−5 cm 之后,所提出的器件的操作会驱动迟滞模式。在这种情况下,已检查设备的电气特性以证明滞后和非滞后作用。
更新日期:2019-12-17
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