当前位置: X-MOL 学术Annu. Rev. Condens. Matter Phys. › 论文详情
Focused Ion Beam Microstructuring of Quantum Matter
Annual Review of Condensed Matter Physics ( IF 15.588 ) Pub Date : 2018-03-12 , DOI: 10.1146/annurev-conmatphys-033117-054021
Philip J.W. Moll

Focused ion beam (FIB) machining promises exciting new possibilities for the study of quantum materials through precise control over the shape and geometry of single crystals on the submicrometer scale. It offers viable routes to fabricate high-quality mesoscale structures from materials that cannot yet be grown in thin-film form and to enhance the experimentally accessible signatures of new physical phenomena. Prototype devices can also be produced in a silicon-chip environment to investigate directly the materials application potential for future electronics. This review introduces the concepts of ion beam shaping of matter, discusses the role and extent of surface damage and material disorder inherent to these techniques, and gives an overview of recent experiments on FIB-structured crystals. Given the early stage of the field of FIB-fabricated quantum materials, much is yet to come, and emergent trends and future directions are also discussed.
更新日期:2019-02-26

 

全部期刊列表>>
化学/材料学中国作者研究精选
ACS材料视界
南京大学
自然科研论文编辑服务
剑桥大学-
中国科学院大学化学科学学院
南开大学化学院周其林
课题组网站
X-MOL
北京大学分子工程苏南研究院
华东师范大学分子机器及功能材料
中山大学化学工程与技术学院
试剂库存
天合科研
down
wechat
bug