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A new method for the SI-traceable quantification of element contents in solid samples using LA-ICP-MS†
Journal of Analytical Atomic Spectrometry ( IF 3.4 ) Pub Date : 2019-11-28 , DOI: 10.1039/c9ja00296k
Lena Michaliszyn 1, 2, 3 , Tongxiang Ren 4, 5, 6 , Anita Röthke 1, 2, 3 , Olaf Rienitz 1, 2, 3
Affiliation  

The present work introduces a novel approach for the quantitative and SI-traceable analysis of element contents in solid materials with laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). The laser ablation and the nebulizer system were connected to the torch using a y-piece. Several standard solutions having well-known element contents were introduced one after the other into the plasma simultaneously with the ablated material. In contrast to all other quantification methods the solid sample itself serves as the reference and the content of an analyte element was calculated based on the well-known content of the matrix element (like Si in a glass sample). Equations to describe the novel method were derived inspired by the standard addition method. To investigate the feasibility of the novel method, the contents of Pb and Rb were analysed in two commercially available standard reference materials (NIST SRM 610 and 612 glass samples). These solid samples were analysed together with solutions of different mass fractions of silicon as the reference element (R) and lead or rubidium as the analyte elements (A). The mass fractions of Pb and Rb measured in the two certified reference materials (CRMs) were equal to the certified values within the limits of their expanded uncertainties (U(wx(A)) with k = 2). Compared to other quantification methods, this new method enables SI-traceability for the measurement results without the need to employ preferably matrix-matched solid reference materials, which will be a great benefit for the application of laser ablation in general, especially considering the extreme lack of matrix-matched CRMs. The new method is best-suited to determine impurities in highly pure samples with a mass fraction of the matrix element close to 1 g g−1.

中文翻译:

使用LA-ICP-MS 进行固体样品中元素含量的SI追踪定量的新方法

本工作介绍了一种通过激光烧蚀电感耦合等离子体质谱法(LA-ICP-MS)对固体材料中的元素含量进行定量和SI溯源分析的新方法。激光烧蚀和雾化器系统使用Y型件连接到割炬。将具有众所周知的元素含量的几种标准溶液与烧蚀的材料同时一个接一个地引入等离子体中。与所有其他定量方法相比,固体样品本身作为参考,分析物元素的含量是根据基质元素的众所周知含量(如玻璃样品中的Si)计算得出的。在标准加法的启发下,得出了描述这种新方法的方程式。为了研究这种新方法的可行性,在两种市售标准参考材料(NIST SRM 610和612玻璃样品)中分析了Pb和Rb的含量。将这些固体样品与不同质量分数的硅溶液作为参考元素(R)以及铅或rub作为分析物元素(A)一起进行分析。在两种认证参考物质(CRM)中测得的Pb和Rb的质量分数在扩展不确定性范围内等于认证值(Uw x(A)),其中k = 2)。与其他定量方法相比,这种新方法无需测量优选与基质匹配的固体参比材料即可实现测量结果的SI溯源性,这对于一般的激光烧蚀应用将是一个巨大的好处,尤其是考虑到极端缺乏矩阵匹配的CRM。该新方法最适合于测定基质元素的质量分数接近1 gg -1的高纯样品中的杂质。
更新日期:2020-01-02
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