The atom-based metrology technique has been widely accepted because of the SI traceability and dependence only on the physical constants rather than on any artefact. The presented work explains the dependence of the probe absorption on the polarization of the driving fields in the new atom-based spectroscopic technique for microwave electrometry. This work explains the nature of decays between different pathways when the fields are not only $\pi$ or $\sigma$ polarized but also at an arbitrary angle between the two orientations. It has been shown that when any of the lasers is linearly polarized at an arbitrary angle $0\lt {\theta_{p,c}}\lt\pm\pi /2$ to the quantization axis, the observation of the absorption from a correct direction becomes extremely important. The findings in this work can be utilized in the correct determination of the polarization of the incident microwave field along with the E-field amplitude measurement. Further, a challenge has been discussed when the radio frequency (RF) field is weak and cannot give the distinguished separation in the absorption peak. It has been shown that the sensitivity of the sensor can be increased in this case by detuning the RF from the on-resonance frequency.

中文翻译：

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microwave原子蒸气内部干扰的极化相关性决定微波矢量电场的计量

基于原子的计量技术已被广泛接受，因为SI的可追溯性和仅依赖于物理常数，而不依赖于任何人工制品。提出的工作解释了新的基于原子的微波电化学光谱技术中探针吸收对驱动场极化的依赖性。这项工作解释了当电场不仅是$ \ pi $或$ \ sigma $极化而且是两个方向之间的任意角度极化时，不同路径之间衰减的性质。已经显示出，当任何一个激光器以任意角度线性偏振时，$ 0 \ lt {\ theta_ {p，c}} \ lt \ pm \ pi / 2 $对于量化轴，从正确方向观察吸收变得非常重要。这项工作中的发现可用于正确确定入射微波场的极化以及电场幅度测量。此外，已经讨论了当射频（RF）场弱并且无法在吸收峰中给出明显的分离时的挑战。已经表明，在这种情况下，可以通过使RF从接通谐振频率失谐来提高传感器的灵敏度。