We demonstrate gas cluster ion beam scanning electron microscopy (SEM), in which wide-area ion milling is performed on a series of thick tissue sections. This three-dimensional electron microscopy technique acquires datasets with <10 nm isotropic resolution of each section, and these can then be stitched together to span the sectioned volume. Incorporating gas cluster ion beam SEM into existing single-beam and multibeam SEM workflows should be straightforward, increasing reliability while improving z resolution by a factor of three or more.

中文翻译：

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气体团簇离子束 SEM，用于以 10 nm 各向同性分辨率对大型组织样本进行成像。

我们展示了气体簇离子束扫描电子显微镜 (SEM)，其中在一系列厚组织切片上进行了广域离子铣削。这种三维电子显微镜技术获取的数据集每个切片的各向同性分辨率小于 10 nm，然后可以将这些数据拼接在一起以跨越切片体积。将气体团簇离子束 SEM 结合到现有的单束和多束 SEM 工作流程中应该很简单，提高可靠性，同时将 z 分辨率提高三倍或更多。