Abstract The polymer Diallyl Phthalate (DAP), commonly used as solid-state nuclear track detector (SSNTD), has been characterized via optical microscopy and Raman and FT-IR spectroscopies in three distinct processes: i) without irradiation; ii) irradiated by neutrons and induced fission fragments and iii) as a function of the chemical etching time. The detectors were exposed to fission fragments from the induced fission of 235U and to the neutrons themselves. The optical microscopy provides information about the morphological changes, while the spectroscopic techniques provide physical and chemical information over the detector molecular structure. The irradiation and chemical etching induces molecular degradation and cross-linking of the detector chemical structure as observed in the Raman and FT-IR analyses. According to the spectral profile analyses, the strength of the functional groups O CO O , CH, CH CH, C CH, C O C, C CH3, C (CH3)2, C CH3, C O, CH2 decrease and additional CO2 gases and OH groups are produced. Therefore, the characterization process performed in this work is essential to better comprehend the behavior of the DAP molecular structure under irradiation and chemical etching and also to better understand the track formation process which is related to the etching kinetics.

中文翻译：

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中子和裂变碎片辐照 DAP 聚合物的拉曼和 FT-IR 研究

摘要 聚合物邻苯二甲酸二烯丙酯 (DAP)，通常用作固态核径迹检测器 (SSNTD)，已通过光学显微镜、拉曼光谱和 FT-IR 光谱在三个不同的过程中进行表征：i) 无辐射；ii) 被中子和诱导裂变碎片辐照和 iii) 作为化学蚀刻时间的函数。探测器暴露于 235U 诱发裂变产生的裂变碎片和中子本身。光学显微镜提供有关形态变化的信息，而光谱技术提供有关探测器分子结构的物理和化学信息。正如在拉曼和 FT-IR 分析中所观察到的那样，辐射和化学蚀刻会引起检测器化学结构的分子降解和交联。根据光谱分布分析，O CO O , CH, CH CH, C CH, COC, C CH3, C (CH3)2, C CH3, CO, CH2 官能团的强度降低，并增加了 CO2 气体和 OH 基团被生产。因此，在这项工作中进行的表征过程对于更好地理解辐射和化学蚀刻下 DAP 分子结构的行为以及更好地理解与蚀刻动力学相关的轨道形成过程至关重要。