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Time-Resolved X-Ray Microscopy for Materials Science
Annual Review of Materials Research ( IF 9.7 ) Pub Date : 2019-07-01 , DOI: 10.1146/annurev-matsci-070616-124014
Haidan Wen 1 , Mathew J. Cherukara 2 , Martin V. Holt 2
Affiliation  

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is to extend microscopic studies to the time domain for visualizing the dynamics of nanoscale phenomena. Large-scale x-ray facilities have been the powerhouse of time-resolved x-ray microscopy. Their upgrades including a significant reduction of the x-ray emittance at storage rings and fully coherent ultrashort x-ray pulses at free electron lasers, will lead to new developments in instrumentation and open new scientific opportunities for x-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. This review presents recent progress in and the outlook for time-resolved x-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

中文翻译:

用于材料科学的时间分辨 X 射线显微镜

X 射线显微镜已成为材料研究中对纳米级特性进行成像的不可或缺的工具。其最新进展之一是将微观研究扩展到时域,以可视化纳米级现象的动力学。大型 X 射线设备一直是时间分辨 X 射线显微镜的动力源。他们的升级包括显着降低存储环的 X 射线发射率和自由电子激光器的完全相干超短 X 射线脉冲,将导致仪器的新发展,并为纳米级动力学的 X 射线成像开辟新的科学机会。同时实现前所未有的高空间和时间分辨率。
更新日期:2019-07-01
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