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Developments in X-ray tomography characterization for electrochemical devices
Materials Today ( IF 24.2 ) Pub Date : 2019-12-01 , DOI: 10.1016/j.mattod.2019.05.019
Thomas M.M. Heenan , Chun Tan , Jennifer Hack , Dan J.L. Brett , Paul R. Shearing

Abstract Over the last century, X-ray imaging instruments and their accompanying tomographic reconstruction algorithms have developed considerably. With improved tomogram quality and resolution, voxel sizes down to tens of nanometers can now be achieved. Moreover, recent advancements in readily accessible lab-based X-ray computed tomography (X-ray CT) instruments have produced spatial resolutions comparable to specialist synchrotron facilities. Electrochemical energy conversion devices, such as fuel cells and batteries, have inherently complex electrode microstructures to achieve competitive power delivery for consideration as replacements for conventional sources. With resolution capabilities spanning tens of microns to tens of nanometers, X-ray CT has become widely employed in the three-dimensional (3D) characterization of electrochemical materials. The ability to perform multiscale imaging has enabled characterization from system-down to particle-level, with the ability to resolve critical features within device microstructures. X-ray characterization presents a favorable alternative to other 3D methods, such as focused ion beam scanning electron microscopy, due to its non-destructive nature, which allows four-dimensional (4D) studies, three spatial dimensions plus time, linking structural dynamics to device performance and lifetime. X-ray CT has accelerated research from fundamental understanding of the links between cell structure and performance, to the improvement in manufacturing and scale-up of full electrochemical cells. Furthermore, this has aided in the mitigation of degradation and cell-level failures, such as thermal runaway. This review presents recent developments in the use of X-ray CT as a characterization method and its role in the advancement of electrochemical materials engineering.

中文翻译:

电化学装置的 X 射线断层扫描表征的进展

摘要 在上个世纪,X 射线成像仪器及其伴随的断层扫描重建算法得到了长足的发展。随着断层图像质量和分辨率的提高,现在可以实现低至数十纳米的体素尺寸。此外,基于实验室的易于访问的 X 射线计算机断层扫描 (X 射线 CT) 仪器的最新进展已经产生了与专业同步加速器设施相当的空间分辨率。电化学能量转换装置,如燃料电池和电池,具有固有的复杂电极微结构,以实现具有竞争力的电力传输,以替代传统能源。分辨率从几十微米到几十纳米,X 射线 CT 已广泛用于电化学材料的三维 (3D) 表征。执行多尺度成像的能力已实现从系统到粒子级别的表征,并能够解析设备微结构中的关键特征。X 射线表征是其他 3D 方法(例如聚焦离子束扫描电子显微镜)的一种有利替代方法,因为它具有非破坏性,允许进行四维 (4D) 研究、三个空间维度加上时间,将结构动力学与设备性能和寿命。X 射线 CT 加速了研究,从对电池结构和性能之间联系的基本了解,到全电化学电池制造和放大的改进。此外,这有助于减轻退化和电池级故障,例如热失控。本综述介绍了使用 X 射线 CT 作为表征方法的最新进展及其在电化学材料工程发展中的作用。
更新日期:2019-12-01
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