Characterization methods utilizing Scanning / Transmission Electron Microscopes have become routine techniques to investigate interface structures in nanomaterials. High resolution imaging methods reveals atomic structure; while spectroscopy gives additional access to elemental distribution and chemical bonding. Focus behind these developments is the research on nanomaterial-based technologies.

Current trends in S/TEM research focus on extending atomic scale characterization capabilities from static to dynamic studies to understand in more detail the link between structure and its evolution vs. unique properties directly on its characteristic length scale.

Progress in recent research is briefly reviewed to highlight the potential when using latest S/TEM methodology optimized for atomic scale investigations and how this can be extended to in situ studies of interfacial effects, followed by comments on how to achieve and maintain highest possible resolution & sensitivity when keeping the effect of electron beam under control during these atomic-scale in situ experiments.

利用扫描/透射电子显微镜的表征方法已经成为研究纳米材料界面结构的常规技术。高分辨率成像方法揭示了原子结构；而光谱学则提供了元素分布和化学键合的其他途径。这些发展背后的重点是基于纳米材料的技术的研究。

S / TEM研究的当前趋势集中于将原子尺度的表征能力从静态研究扩展到动态研究，以更详细地了解结构与它的演化之间的联系以及直接在其特征长度尺度上的独特特性。

简要回顾了最近的研究进展，以突出使用针对原子尺度研究优化的最新S / TEM方法的潜力，以及如何将其扩展到界面效应的原位研究，然后就如何实现和保持尽可能高的分辨率提出了意见和建议。当在这些原子级原位实验中保持电子束的效果可控时，其灵敏度较高。