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Correction to “Structurally Flexible Au–Cu Alloy Nanoclusters Enabling Efficient Triplet Sensitization and Photon Upconversion”
Journal of the American Chemical Society ( IF 15.0 ) Pub Date : 2023-05-26 , DOI: 10.1021/jacs.3c04698
Daichi Arima , Masaaki Mitsui

The notation of the Eedge value in the upper panel of Figure 1b was incorrect and has been corrected to the same value (681 nm) as in Table 1 and in the text. Figure 1. (a) Electrospray ionization time-of-flight mass spectrum of [Au4Cu4(S-Adm)5(DPPM)2]+ (Au4Cu4). (b) Absorption and emission spectra (excitation wavelength λex = 532 nm) of Au4Cu4 (upper panel) and Au2Cu6 (lower panel) in tetrahydrofuran (THF). The energy at the absorption edge (Eedge) is indicated by a downward arrow. (c) Emission decay curves (3.2 ns bin time) of Au4Cu4 measured under Ar-degassed and air-saturated conditions (λex = 478 nm). The inset shows the decay profiles measured at a bin time of 50 ps (monitor: λem < 650 nm or λem > 800 nm). Equation 11 for the upconversion internal quantum yield (ΦUCg) was misprinted. The correct expression is These corrections do not affect the results of the analysis and conclusions of the published article. This article has not yet been cited by other publications. Figure 1. (a) Electrospray ionization time-of-flight mass spectrum of [Au4Cu4(S-Adm)5(DPPM)2]+ (Au4Cu4). (b) Absorption and emission spectra (excitation wavelength λex = 532 nm) of Au4Cu4 (upper panel) and Au2Cu6 (lower panel) in tetrahydrofuran (THF). The energy at the absorption edge (Eedge) is indicated by a downward arrow. (c) Emission decay curves (3.2 ns bin time) of Au4Cu4 measured under Ar-degassed and air-saturated conditions (λex = 478 nm). The inset shows the decay profiles measured at a bin time of 50 ps (monitor: λem < 650 nm or λem > 800 nm).

中文翻译:

对“结构灵活的金铜合金纳米团簇实现高效三重态敏化和光子上转换”的更正

图 1b 上面板中E边缘值的表示法不正确,已更正为与表 1 和文本中相同的值 (681 nm)。图 1. (a) [Au 4 Cu 4 (S-Adm) 5 (DPPM) 2 ] + ( Au 4 Cu 4 )的电喷雾电离飞行时间质谱。(b) Au 4 Cu 4(上图)和Au 2 Cu 6(下图)在四氢呋喃 (THF) 中的吸收和发射光谱(激发波长 λ ex = 532 nm) 。吸收边的能量(E edge ) 由向下的箭头指示。(c)在 Ar 脱气和空气饱和条件下测量的Au 4 Cu 4的发射衰减曲线(3.2 ns bin 时间) (λ ex = 478 nm)。插图显示了在 50 ps 的 bin 时间测量的衰减曲线(监视器:λ em < 650 nm 或 λ em > 800 nm 。用于上转换内部量子产率 (Φ UCg ) 的等式 11 打印错误。正确的表述是这些更正不影响发表文章的分析结果和结论。这篇文章尚未被其他出版物引用。图 1. (a) [Au 的电喷雾电离飞行时间质谱4 Cu 4 (S-Adm) 5 (DPPM) 2 ] + ( Au 4 Cu 4 )。(b) Au 4 Cu 4(上图)和Au 2 Cu 6(下图)在四氢呋喃 (THF) 中的吸收和发射光谱(激发波长 λ ex = 532 nm) 。吸收边( E)处的能量由向下的箭头表示。(c)在 Ar 脱气和空气饱和条件下测量的Au 4 Cu 4的发射衰减曲线(3.2 ns bin 时间) (λ ex= 478 纳米)。插图显示了在 50 ps 的 bin 时间测量的衰减曲线(监视器:λ em < 650 nm 或 λ em > 800 nm
更新日期:2023-05-26
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