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Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature
High Voltage ( IF 4.4 ) Pub Date : 2023-02-02 , DOI: 10.1049/hve2.12308
Yongxin Zhang 1 , Qikun Feng 1 , Shaolong Zhong 1 , Jiayao Pei 1 , Fangyi Chen 2 , Lei Huang 1 , Zhe Yang 3 , Zhimin Dang 1
Affiliation  

In the process of coping with energy and environmental protection issues, technologies such as energy materials, energy devices, and energy systems have made great progress. With excellent performance, film capacitors play an increasingly important role in energy-related fields. With the increase of application scenarios and the continuous development of film material technology, it is urgent to establish a better theoretical connection from films to capacitors. First, the main components of the capacitor including the film and the positional relationships among them are given. Then, from the two perspectives of indirect calculation according to the volume and the direct calculation according to the winding process, the equation between the dielectric constant of films and the corresponding capacitance of capacitors is established. Further, the measurement data and error analysis results of the built test platform prove the accuracy and great potential of the proposed calculation methods. In addition, error sources, including film thickness uniformity, are listed. Finally, the challenges faced by the proposed calculation methods and the paths that can be referenced for future research are summarised and discussed.

中文翻译:

高温下薄膜介电常数与电容器电容量的理论联系

在应对能源和环保问题的过程中,能源材料、能源器件、能源系统等技术取得了长足进步。薄膜电容器凭借优异的性能,在能源相关领域发挥着越来越重要的作用。随着应用场景的增多和薄膜材料技术的不断发展,迫切需要建立薄膜与电容器更好的理论联系。首先,给出包括薄膜在内的电容器的主要部件以及它们之间的位置关系。然后,从按体积间接计算和按卷绕工艺直接计算两个角度,建立了薄膜介电常数与相应电容器电容量之间的方程。更远,搭建的测试平台的测量数据和误差分析结果证明了所提出的计算方法的准确性和巨大的潜力。此外,还列出了误差源,包括薄膜厚度均匀性。最后,对所提出的计算方法面临的挑战以及可供未来研究参考的路径进行了总结和讨论。
更新日期:2023-02-02
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