The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm² mg⁻¹, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and it is around 1.7 MeV cm² mg⁻¹ for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm² mg⁻¹. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS.

大容量内置电流传感器 (BBICS) 是一种经济高效的解决方案，用于检测集成电路中的高能粒子撞击。通过在芯片上分布适当数量的 BBICS，可以识别软错误位置，并且可以在本地激活动态容错机制以纠正受影响逻辑中的软错误。在这项工作中，我们介绍了通过连接标准 BBICS 和定制设计的脉冲展宽单元构建的脉冲展宽 BBICS (PS-BBICS)。PS-BBICS 的目的是实现单粒子瞬态 (SET) 脉冲宽度的片上测量，从而能够检测入射粒子的线性能量转移 (LET)，从而更准确地评估辐射条件。基于 Spectre 模拟，我们已经证明，对于 1 到 100 MeV cm 的 LET²  mg ^-1时，PS-BBICS 检测到的 SET 脉冲宽度变化 620–800 ps。PS-BBICS 的阈值 LET 随着监控逆变器的数量线性增加，十个监控逆变器的阈值 LET 约为 1.7 MeV cm ²  mg ^-1。另一方面，对于 LET > 4 MeV cm ²  mg ^-1 ，SET 脉冲宽度与监测的逆变器数量无关。结果表明，电源电压、温度和工艺变化对 PS-BBICS 的响应有很大影响。